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公开(公告)号:US11942386B2
公开(公告)日:2024-03-26
申请号:US17001429
申请日:2020-08-24
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Christopher Daniel Manack , Patrick Francis Thompson , Qiao Chen
IPC: H01L23/31 , H01L21/48 , H01L21/56 , H01L23/00 , H01L23/495
CPC classification number: H01L23/315 , H01L21/4825 , H01L21/565 , H01L23/49513 , H01L23/4952 , H01L23/49575 , H01L24/02 , H01L24/13 , H01L24/16 , H01L24/48 , H01L24/73 , H01L2224/0239 , H01L2224/024 , H01L2224/13082 , H01L2224/13111 , H01L2224/13139 , H01L2224/13147 , H01L2224/16145 , H01L2224/48137 , H01L2224/48245 , H01L2224/48465 , H01L2224/73207 , H01L2924/01028 , H01L2924/01029 , H01L2924/01074 , H01L2924/07025 , H01L2924/19104
Abstract: In examples, a semiconductor device comprises a semiconductor package including a mold compound covering a semiconductor die. The semiconductor package has a surface and a cavity formed in the surface. The semiconductor device comprises an electronic device positioned within the cavity, the electronic device coupled to the semiconductor die via a conductive terminal extending through the mold compound.
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公开(公告)号:US11837518B2
公开(公告)日:2023-12-05
申请号:US17003382
申请日:2020-08-26
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Michael Todd Wyant , Matthew John Sherbin , Christopher Daniel Manack , Patrick Francis Thompson , You Chye How
IPC: H01L23/31 , H01L23/552 , H01L21/56 , H01L21/78 , H01L21/683
CPC classification number: H01L23/3185 , H01L21/561 , H01L21/568 , H01L21/78 , H01L23/3171 , H01L23/552 , H01L21/6836 , H01L2221/68336
Abstract: In examples, a chip scale package (CSP) comprises a semiconductor die; a conductive terminal coupled to the semiconductor die; and a non-conductive coat covering a backside of the semiconductor die and a sidewall of the semiconductor die. The non-conductive coat has a thickness of less than 45 microns.
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公开(公告)号:US11562949B2
公开(公告)日:2023-01-24
申请号:US16904193
申请日:2020-06-17
Applicant: TEXAS INSTRUMENTS INCORPORATED
IPC: H01L23/495 , H01L23/34 , H01L23/48 , H01L21/00 , H05K7/04 , H05K7/18 , H01L23/498 , H01L23/00 , H01L21/56 , H01L23/31 , H01L23/28
Abstract: A semiconductor package includes a semiconductor die with an active surface and an inactive surface, the active surface including metal pillars providing electrical connections to functional circuitry of the semiconductor die, and a backside metal layer on the inactive surface. The backside metal layer is attached to the inactive surface. The semiconductor package further includes a plurality of leads with each of the leads including an internal leadfinger portion and an exposed portion that includes a bonding portion. Distal ends of the metal pillars are in contact with and electrically coupled to the internal leadfinger portions. The backside metal layer is exposed on an outer surface of the semiconductor package. The bonding portions and the backside metal layer approximately planar to each other.
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公开(公告)号:US20210210462A1
公开(公告)日:2021-07-08
申请号:US16734836
申请日:2020-01-06
Applicant: Texas Instruments Incorporated
Inventor: Vivek Swaminathan Sridharan , Enis Tuncer , Christopher Daniel Manack , Patrick Francis Thompson
IPC: H01L23/00
Abstract: A semiconductor device includes a semiconductor surface having circuitry with metal interconnect layers over the semiconductor surface including a selected metal interconnect layer providing an interconnect trace having a first and second end. A top dielectric layer is on the top metal interconnect layer. A redistribution layer (RDL) is on the top dielectric layer. A corrosion interruption structure (CIS) including the interconnect trace bridges an interrupting gap in a trace of the RDL.
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公开(公告)号:US20240395731A1
公开(公告)日:2024-11-28
申请号:US18321192
申请日:2023-05-22
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Masamitsu Matsuura , Anindya Poddar , Daiki Komatsu , Hau Thanh Nguyen , Patrick Francis Thompson
IPC: H01L23/00 , H01L21/027 , H01L21/56 , H01L23/495
Abstract: An electronic device includes a leadframe having a die pad and leads. A die that includes an active layer is attached to the die pad. A reinforcement layer is disposed on the active layer and wire bonds are attached from the active layer of the die to the leads. A mold compound encapsulates the die, the reinforcement layer, and the wire bonds.
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公开(公告)号:US11616038B2
公开(公告)日:2023-03-28
申请号:US17094723
申请日:2020-11-10
Applicant: TEXAS INSTRUMENTS INCORPORATED
IPC: H01L23/495 , H01L23/00
Abstract: A semiconductor die includes a substrate and an integrated circuit provided on the substrate and having contacts. An electrically conductive layer is provided on the integrated circuit and defines electrically conductive elements electrically connected to the contacts. Electrically conductive interconnects coupled with respective electrically conductive elements. The electrically conductive interconnects have at least one of different sizes or shapes from one another.
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公开(公告)号:US20220384375A1
公开(公告)日:2022-12-01
申请号:US17884284
申请日:2022-08-09
Applicant: Texas Instruments Incorporated
Inventor: Vivek Swaminathan Sridharan , Christopher Daniel Manack , Nazila Dadvand , Salvatore Frank Pavone , Patrick Francis Thompson
IPC: H01L23/00
Abstract: In some examples, a package comprises a die and a redistribution layer coupled to the die. The redistribution layer comprises a metal layer, a brass layer abutting the metal layer, and a polymer layer abutting the brass layer.
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公开(公告)号:US20210398882A1
公开(公告)日:2021-12-23
申请号:US16904193
申请日:2020-06-17
Applicant: TEXAS INSTRUMENTS INCORPORATED
IPC: H01L23/495
Abstract: A semiconductor package includes a semiconductor die with an active surface and an inactive surface, the active surface including metal pillars providing electrical connections to functional circuitry of the semiconductor die, and a backside metal layer on the inactive surface. The backside metal layer is attached to the inactive surface. The semiconductor package further includes a plurality of leads with each of the leads including an internal leadfinger portion and an exposed portion that includes a bonding portion. Distal ends of the metal pillars are in contact with and electrically coupled to the internal leadfinger portions. The backside metal layer is exposed on an outer surface of the semiconductor package. The bonding portions and the backside metal layer approximately planar to each other.
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公开(公告)号:US10833036B2
公开(公告)日:2020-11-10
申请号:US16233841
申请日:2018-12-27
Applicant: TEXAS INSTRUMENTS INCORPORATED
IPC: H01L23/495 , H01L23/00
Abstract: A semiconductor die includes a substrate and an integrated circuit provided on the substrate and having contacts. An electrically conductive layer is provided on the integrated circuit and defines electrically conductive elements electrically connected to the contacts. Electrically conductive interconnects coupled with respective electrically conductive elements. The electrically conductive interconnects have at least one of different sizes or shapes from one another.
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公开(公告)号:US20160379953A1
公开(公告)日:2016-12-29
申请号:US14749219
申请日:2015-06-24
Applicant: Texas Instruments Incorporated
Inventor: Patrick Francis Thompson , Jeffrey Alan West , Thomas D. Bonifield , Fu-Kang Hsu , Ching-Lun Hsia
IPC: H01L23/00
CPC classification number: H01L24/48 , H01L23/642 , H01L24/03 , H01L24/05 , H01L24/85 , H01L2224/03462 , H01L2224/04042 , H01L2224/05553 , H01L2224/05573 , H01L2224/05624 , H01L2224/05644 , H01L2224/05647 , H01L2224/05655 , H01L2224/48095 , H01L2224/48137 , H01L2224/48464 , H01L2224/48465 , H01L2224/48471 , H01L2224/48479 , H01L2924/00014 , H01L2224/45099 , H01L2224/4554 , H01L2924/00015 , H01L2224/29099
Abstract: Circuitry is disclosed that includes a first conductive portion of a first die and a first conductive pillar electrically and physically connected to the first conductive portion. The first conductive pillar includes a first conductive pillar surface. A first bond connects the first conductive pillar surface to a first end of a bond wire.
Abstract translation: 公开了包括第一管芯的第一导电部分和与第一导电部分物理电连接的第一导电柱的电路。 第一导电柱包括第一导电柱表面。 第一接合将第一导电柱表面连接到接合线的第一端。
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