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    Optical module, in particular opto-electronic module, and method of manufacturing the same
    131.
    发明授权
    Optical module, in particular opto-electronic module, and method of manufacturing the same 有权

    公开(公告)号：US10180235B2

    公开(公告)日：2019-01-15

    申请号：US14413887

    申请日：2013-07-09

    Applicant: Heptagon Micro Optics Pte. Ltd.

    Inventor： Hartmut Rudmann ,  Markus Rossi

    IPC: F21V1/00 ,  F21V7/00 ,  G02B7/00 ,  G02B7/02 ,  G02B17/02 ,  G02B27/42 ,  H01L31/0232 ,  H01L27/146 ,  F21V13/02 ,  G01J1/02 ,  G01J1/04 ,  G02B7/182 ,  G01J3/02 ,  G01J3/18 ,  G02B5/10

    Abstract: The optical module (1) comprises—a first member (O) having a first face (F1) which is substantially planar;—a second member (P) having a second face (F2) facing the first face (F1), which is substantially planar and is aligned substantially parallel to the first face;—a third member (S) comprised in the first member (O) or comprised in the second member (P) or distinct from and located between these, which comprises an opening (4);—a mirror element (31′; 31′″) present on the second face (F2); and—an active optical component (26) present on the second face (F2) and electrically connected to the second member (P); wherein at least one of the first and second members comprises one or more transparent portions (t) through which light can pass. The method for manufacturing the optical module (1) comprises the steps of a) providing a first wafer; b) providing a second wafer on which the mirror elements (31′. . . ) are present; c) providing a third wafer, wherein the third wafer is comprised in the first wafer or is comprised in the second wafer or is distinct from these, and wherein the third wafer comprises openings (4); e) forming a wafer stack comprising these wafers; wherein at least one of the first wafer and the second wafer comprises transparent portions (t) through which light can pass.

    SINE-COSINE OPTICAL FREQUENCY ENCODER DEVICES BASED ON OPTICAL POLARIZATION PROPERTIES
    132.
    发明申请
    SINE-COSINE OPTICAL FREQUENCY ENCODER DEVICES BASED ON OPTICAL POLARIZATION PROPERTIES 审中-公开

    公开(公告)号：US20180372517A1

    公开(公告)日：2018-12-27

    申请号：US15975757

    申请日：2018-05-09

    Applicant: General Photonics Corporation

    Inventor： Xiaotian Steve Yao ,  Xiaojun James Chen

    IPC: G01D5/347 ,  G01J3/447 ,  G01J3/18 ,  G01J3/02 ,  G01J9/02

    Abstract: Optical polarization-based devices and techniques are provided to enable low cost construction and easy signal processing to measure the light frequency via measurements of signals associated with a delay between the two orthogonal polarizations after passing through a DGD element and the retardation value of the DGD element without directly measuring the optical frequency. The optical detection may be designed in various configurations. In particular, for example, the optical detection may split the optical output of the DGD into two optical beams with two different optical detectors so that the final frequency information can be deducted into a pair of sine and cosine functions, such as a pair of sine and cosine functions of measured optical signal levels and the retardation value of the DGD element.

    Simultaneous overlapping order spectral imager and method
    133.
    发明授权
    Simultaneous overlapping order spectral imager and method 有权

    公开(公告)号：US10151632B2

    公开(公告)日：2018-12-11

    申请号：US15270942

    申请日：2016-09-20

    Applicant: RAYTHEON COMPANY

    Inventor： John F. Silny ,  Bradley A. Flanders

    IPC: G01J3/28 ,  G01J3/18 ,  G01J3/12

    Abstract: An imaging spectrometer and method are provided. In one example, the imaging spectrometer includes foreoptics positioned to receive electromagnetic radiation from a scene, a diffraction grating positioned to receive the electromagnetic radiation from the foreoptics and configured to disperse the electromagnetic radiation into a plurality of spectral bands, each spectral band corresponding to a diffraction grating order of the diffraction grating, and a single-band focal plane array configured to simultaneously receive from the diffraction grating overlapping spectra corresponding to at least two diffraction grating orders.

    Wearable devices using near-infrared light sources
    135.
    发明授权
    Wearable devices using near-infrared light sources 有权

    公开(公告)号：US10098546B2

    公开(公告)日：2018-10-16

    申请号：US15860065

    申请日：2018-01-02

    Applicant: OMNI MEDSCI, INC.

    Inventor： Mohammed N. Islam

    IPC: G01J3/00 ,  A61B5/00 ,  G01N33/49 ,  G01N33/44 ,  G01N33/15 ,  G01N33/02 ,  G01N21/88 ,  G01N21/3563 ,  G01N21/359 ,  G01J3/453 ,  A61B5/145 ,  A61B5/1455 ,  G01N21/39 ,  G01M3/38 ,  G01J3/28 ,  G01J3/10 ,  G01J3/18 ,  G01J3/14 ,  H01S3/30

    Abstract: A wearable device includes a measurement device having light emitting diodes (LEDs) measuring a physiological parameter. The measurement device modulates the LEDs to generate an optical beam having a near-infrared wavelength between 700-2500 nanometers. Lenses receive and deliver the optical beam to tissue, which reflects the optical beam to a receiver having spatially separated detectors coupled to analog-to-digital converters configured to generate receiver outputs. The receiver captures light while the LEDs are off, and reflected light from the tissue while the LEDs are on, to generate first and second signals, respectively. Signal-to-noise ratio is improved by differencing the first and second signals and by differencing the receiver outputs. The measurement device further improves signal-to-noise ratio of the reflected optical beam by increasing light intensity of the LEDs relative to an initial light intensity. The measurement device generates an output signal representing a non-invasive measurement on blood contained within the tissue.

    Surface refractive index scanning system and method
    136.
    发明授权
    Surface refractive index scanning system and method 有权

    公开(公告)号：US10088428B2

    公开(公告)日：2018-10-02

    申请号：US15309732

    申请日：2015-05-08

    Applicant: Danmarks Tekniske Universitet

    Inventor： Anders Kristensen ,  Christoph Vannahme ,  Martin Dufva

    IPC: G01N21/77 ,  H01S3/08 ,  G01J3/08 ,  G01J3/18 ,  G01J3/28 ,  G01N21/41 ,  G01J3/02 ,  G01J3/06

    Abstract: A surface refractive index acquisition system for characterization of a sample is provided. The system comprises a grating device configured to receive the sample, and first and second grating regions. First and second grating periods are selected to provide optical resonances for light respectively in first and second wavelength bands. A light source is configured to illuminate part of the first and second grating regions simultaneously. An imaging system is configured to image light from the grating device and comprises an optical element focusing light in a transverse direction and being invariant in an orthogonal transverse direction, the optical element being oriented such that the longitudinal direction of the grating device is oriented to coincide with the invariant direction of the optical element, and an imaging spectrometer comprising an entrance slit having a longitudinal direction oriented to coincide with the invariant direction of the optical element.

    ICP EMISSION SPECTROPHOTOMETER
    137.
    发明申请
    ICP EMISSION SPECTROPHOTOMETER 审中-公开

    公开(公告)号：US20180275069A1

    公开(公告)日：2018-09-27

    申请号：US15926097

    申请日：2018-03-20

    Applicant: Hitachi High-Tech Science Corporation

    Inventor： Yutaka Ikku

    IPC: G01N21/73 ,  G01J3/18 ,  G01J3/28 ,  G01J3/443

    CPC classification number: G01N21/73 ,  G01J3/0235 ,  G01J3/04 ,  G01J3/18 ,  G01J3/2823 ,  G01J3/443 ,  G01J2003/045 ,  G01N21/68

    Abstract: An ICP emission spectrophotometer includes an inductively coupled plasma device, a spectroscope, and a computer. The spectroscope includes an incidence window, an incidence side slit, a diffraction grating, an emission window, an emission side slit, and a detector. Measurement conditions including diffraction condition and a measurement result are displayed on a display device. In a case where there are a plurality of diffraction conditions each including a combination of a diffraction grating and a diffraction order for measuring desired diffracted light, comparison information including at least an intensity and a resolution of emitted light in the diffraction condition is displayed on the display device. A measurer selects diffraction conditions in which resolution is higher from among the diffraction conditions, and selects a diffraction condition in which an intensity is obtained from among the selected diffraction conditions.

    Patch clamp technique with complementary raman spectroscopy
    140.
    发明授权
    Patch clamp technique with complementary raman spectroscopy 有权

    公开(公告)号：US10067061B2

    公开(公告)日：2018-09-04

    申请号：US15858472

    申请日：2017-12-29

    Applicant: International Business Machines Corporation

    Inventor： Emily R. Kinser ,  Roy R. Yu

    IPC: G01J3/44 ,  G01N21/65 ,  G01J3/18 ,  G01J3/02

    Abstract: Surface enhanced Raman spectroscopy is employed to obtain chemical data with respect to cells while electrophysiological data relating to cell membranes is obtained using the patch clamp technique. A SERS-facilitating assembly is coupled to a micropipette and is used in conjunction with a monochromatic light source for generating scattered light. Surface enhanced Raman spectroscopy is employed to obtain the chemical data. Electrophysiological data is obtained using the same micropipette to perform the patch clamp technique.

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