摘要:
Diffuse reflectance spectroscopy apparatus for use in analysing a sample comprising a sample receiving location 2 for receiving a sample 3 for analysis; an illumination arrangement 4 for directing light towards a received sample; a detector 6 for detecting light reflected by a received sample; and collection optics 5 for directing light reflected by a received sample towards the detector. The illumination arrangement further comprises an interferometer 42 and a half beam block 45a, 45b which is disposed substantially at a focus in the optical path for blocking light which exits the interferometer, passes said focus, and is reflected from re-entering the interferometer. A half beam block 45a may be disposed in the optical path between the interferometer and the light source 41 for blocking light that exits the interferometer back towards the light source and is reflected by the light source from re-entering the interferometer and/or a half beam block 45b may be disposed in the optical path on the opposite side of the interferometer than the light source.
摘要:
A spectrometer apparatus for measuring spectra of a liquid sample, such as a beverage like wine. The apparatus has an integrating cavity with a reflective inner wall to receive a cuvette containing the liquid sample within the integrating cavity. A combination of light inlet ports and light outlet ports are provided to receive light from at least one light source and deliver light to a spectrometer. A light path adjuster is configured to selectively adjust a light path through the integrating cavity so at least two distinct light paths are provided wherein when the light path adjuster is in a first configuration, the apparatus is in transmission mode in which light from the light source follows a first light path; when the light path adjuster is in a second configuration, the apparatus is in a diffusely reflecting mode in which light from the light source follows a second light path.
摘要:
An integrated polarization interferometer includes a polarization beam splitter for separating incident complex waves, a first mirror attached to a first surface of the polarization beam splitter, for reflecting a first polarization transmitted through the polarization beam splitter to the polarization beam splitter, and a second mirror attached to a second surface of the polarization beam splitter, for reflecting a second polarization transmitted through the polarization beam splitter to the polarization beam splitter. Accordingly, it is possible to measure dynamic spectroscopic polarization phenomenon with extremely high robustness disturbances due to an external vibration and the like by using the integrated polarization interferometer, thereby improving measurement repeatability and accuracy of measurement.
摘要:
The present inventive concepts relate to an inspection apparatus that snapshots an interference image pattern having a high spatial carrier frequency produced from a one-piece off-axis polarimetric interferometer and that precisely and promptly measures a Stokes vector including spatial polarimetric information. The inspection apparatus dynamically measure in real-time a two-dimensional polarization information without employing a two-dimensional scanner.
摘要:
A measuring light source includes a hollow body having a diffusely reflective inner surface. Formed in the hollow body are a concave, concave mirror-shaped illumination space, a tubular light shaping space, and a concave, concave mirror-shaped light exit space, which have a shared axis. A light source for generating light is at least partially situated in the illumination space. The light exit space has a light exit. The illumination space and the light exit space with their concave mirror shapes are situated opposite one another and are connected by the tubular light shaping space. A diffusely reflecting reflective disk for reflecting the light, reflected from the inner surface of the hollow body situated in the light exit space, through the light exit to outside the hollow body is situated in the hollow body.
摘要:
To provide a microspectroscope that can perform a wide range mapping measurement with high sensitivity, at high speed, and with high wavelength resolution.The Raman spectroscope comprises: a unit for linearly irradiating excitation light; a movable stage for a sample; an objective lens for focusing Raman light from the linear irradiation region; an incident slit provided at the imaging position of Raman light; a spectrometer for diffusing the passing light; a CCD detector for detecting Raman spectral image; and a control device for controlling the mapping measurement by synchronizing the movable stage and the CCD detector. The control device controls the movable stage to move in the direction orthogonal to the longitudinal direction of the linear irradiation light and obtain one average spectrum. At the same time, the control device is configured to perform the cycle of the CCD detector While the stage is moving to obtain one average spectrum of the moving region of the linear irradiation region in one light detection cycle.
摘要:
A multi-mode imaging spectrometer that incorporates two orthogonally positioned entrance slits and is configurable between a first mode in which the system produces images of relatively wide spatial coverage with moderate spectral resolution, using a first one of the two slits, and a second mode in which the system produces images of a smaller spatial area with fine spectral resolution, using the other one of the two slits.
摘要:
The present subject matter relates to methods of high-speed analysis of product samples. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward an optical detector. Signals for the detector are compared with reference signals based on a portion of the illuminating light passing through a reference element to determine characteristics of the product under analysis. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.
摘要:
Mirror elements are selectively interposable in the beam paths in a dual aperture microspectrometer system to selectively bypass the aperture element in transmission or reflection modes to increase optical throughput and field of view. The system may be operated in a dual aperture transmission mode or reflection mode and in modes in which the aperture is bypassed before or after the infrared beam reaches the sample. The system may be operated to bypass the aperture both before and after the sample, which may be utilized with an array detector having multiple detector elements in which an image of the sample is formed on the array detector.
摘要:
An optical path switch divides sample path radiation into a time series of alternating first polarized components and second polarized components. The first polarized components are transmitted along a first optical path and the second polarized components along a second optical path. A first gasless optical filter train filters the first polarized components to isolate at least a first wavelength band thereby generating first filtered radiation. A second gasless optical filter train filters the second polarized components to isolate at least a second wavelength band thereby generating second filtered radiation. A beam combiner combines the first and second filtered radiation to form a combined beam of radiation. A detector is disposed to monitor magnitude of at least a portion of the combined beam alternately at the first wavelength band and the second wavelength band as an indication of the concentration of the substance in the sample path.