Radiation monitoring device
    1.
    发明授权

    公开(公告)号:US12085682B2

    公开(公告)日:2024-09-10

    申请号:US17614410

    申请日:2020-05-18

    Applicant: HITACHI, LTD.

    CPC classification number: G01T1/247 G01T1/023 G01T1/366 G01T3/085

    Abstract: A radiation monitoring device realizes a high measurement function. Therefore, a radiation monitoring device includes: a radiation detection unit including a phosphor that emits light by incident radiation; a photodetector that converts a single photon or a photon group having a plurality of the single photons generated by the radiation detection unit into an electric pulse signal; and an analysis unit that analyzes the electric pulse signal. The phosphor emits light based on a plurality of light emission phenomena having different decay time constants. The analysis unit includes: a signal discrimination circuit that discriminates the electric pulse signal output from the photodetector; a dose rate calculation circuit that calculates a dose rate of the radiation based on a count rate of the discriminated electric pulse signal; and an application energy calculation circuit that calculates application energy of the radiation based on a peak value of the discriminated electric pulse signal.

    PHOTOELECTRIC CONVERSION ELEMENT, MEASURING METHOD OF THE SAME, SOLID-STATE IMAGING DEVICE, ELECTRONIC DEVICE, AND SOLAR CELL

    公开(公告)号:US20230329016A1

    公开(公告)日:2023-10-12

    申请号:US18333748

    申请日:2023-06-13

    CPC classification number: H10K30/80 G01T1/366 H10K39/32 H10K39/10

    Abstract: The present technology relates to a photoelectric conversion element, a measuring method of the same, a solid-state imaging device, an electronic device, and a solar cell capable of further improving a quantum efficiency in a photoelectric conversion element using a photoelectric conversion layer including an organic semiconductor material. The photoelectric conversion element includes two electrodes forming a positive electrode (11) and a negative electrode (14), at least one charge blocking layer (13, 15) arranged between the two electrodes, and a photoelectric conversion layer (12) arranged between the two electrodes. The at least one charge blocking layer is an electron blocking layer (13) or a hole blocking layer (15), and a potential of the charge blocking layer is bent. The present technology is applied to, for example, a solid-state imaging device, a solar cell, and the like having a photoelectric conversion element.

    XRF ANALYZER WITH IMPROVED RESOLUTION BY USING MICRO-RESET

    公开(公告)号:US20170276803A1

    公开(公告)日:2017-09-28

    申请号:US15082647

    申请日:2016-03-28

    Applicant: Marc Battyani

    Inventor: Marc Battyani

    CPC classification number: G01T1/175 G01N23/223 G01T1/17 G01T1/366

    Abstract: Disclosed is an electronic system for resetting the voltage of a charge-sensitive pre-amplifier having input from an X-ray detector and output to an ADC. The pre-amplifier gain is increased so that the RMS ADC noise is less than 1% of a representative digitized X-ray signal. The reset logic is configured to avoid loss of X-ray counts and to prevent the pre-amplifier output being outside the allowable input range of the ADC. Reset is initiated when the pre-amplifier output rises above an upper level, which is below the maximum allowable ADC input. Reset is also initiated when a pile-up event is detected, provided that such reset will not cause the pre-amplifier output to fall below the minimum allowable ADC input. At each reset a known amount of charge is removed from the pre-amplifier, and the reset time is continuously adjusted to ensure that the charge amount does not drift.

    Method of identifying materials from multi-energy X-rays
    6.
    发明授权
    Method of identifying materials from multi-energy X-rays 有权
    从多能X射线识别材料的方法

    公开(公告)号:US09311277B2

    公开(公告)日:2016-04-12

    申请号:US13807828

    申请日:2011-06-28

    CPC classification number: G06F17/18 G01N23/087 G01T1/366 G01T7/005

    Abstract: A calibration method for a device for identifying materials using X-rays, including: a) determining at least one calibration material and, for each calibration material, at least one calibration thickness of this material, b) measuring, for each of the calibration materials and for each of the selected calibration thicknesses, attenuation or transmission coefficients for X radiation, c) calculating statistical parameters from the coefficients, d) determining or calculating, for each calibration material and for each calibration thickness, a presence probability distribution law, as a function of the statistical parameters.

    Abstract translation: 一种用于使用X射线识别材料的装置的校准方法,包括:a)确定至少一种校准材料,并且对于每种校准材料,确定该材料的至少一个校准厚度,b)对于每种校准材料 并且对于所选择的校准厚度中的每一个,用于X辐射的衰减或透射系数,c)根据系数计算统计参数,d)对于每个校准材料和每个校准厚度,确定或计算存在概率分布规律,作为 功能统计参数。

    Method of analysing a sample of material by diffractometry and associated diffractometer
    7.
    发明授权
    Method of analysing a sample of material by diffractometry and associated diffractometer 有权
    通过衍射和相关衍射仪分析材料样品的方法

    公开(公告)号:US09285329B2

    公开(公告)日:2016-03-15

    申请号:US14368748

    申请日:2012-12-26

    Abstract: A method for analyzing a sample by diffractometry and a diffractometer, where the diffractometer includes a collimated source, a detection collimator, and a spectrometric detector, the detection axis of the detector and the collimator form a diffraction angle with the central axis of an incident beam and an energy spectrum is established for each pixel of the detector. The measured spectra are readjusted by a change in variable that takes into account the energy of the scattered radiation and the angle of observation. The measured are combined and a check is made on the implementation of at least one multi-material criterion representative of the presence of a plurality of layers of materials and groups of pixels are formed according to the results of this check, where each group corresponds to a single layer of material and the measured spectra obtained for the pixels of the group are combined.

    Abstract translation: 通过衍射法和衍射仪分析样品的方法,其中衍射仪包括准直源,检测准直仪和光谱检测器,检测器和准直器的检测轴与入射光束的中心轴形成衍射角 并且为检测器的每个像素建立能谱。 测量的光谱通过考虑散射辐射的能量和观察角度的变量的变化来重新调整。 将所测量的组合起来,并且对至少一个多材料标准的实现进行检查,该标准代表多个材料层的存在,并且根据该检查的结果形成各组的像素,其中每个组对应于 组合单层材料和获得的针对组的像素的测量光谱。

    Gamma-Ray Spectrometry
    8.
    发明申请
    Gamma-Ray Spectrometry 有权
    伽玛射线光谱

    公开(公告)号:US20150316665A1

    公开(公告)日:2015-11-05

    申请号:US14417552

    申请日:2013-06-20

    Inventor: David Ramsden

    CPC classification number: G01T7/005 G01T1/203 G01T1/247 G01T1/366 G01T1/40

    Abstract: A calibration source for a gamma-ray spectrometer is provided. The calibration source comprises a scintillator body having a cavity in which a radioactive material is received. The scintillator body may be generally cuboid and the cavity may be formed by a hole drilled into the scintillator body. The radioactive material comprises a radioactive isotope having a decay transition associated with emission of a radiation particle and a gamma-ray having a known energy e.g. Na-22. A photodetector, for example a silicon photomultiplier, is optically coupled to the scintillator body and arranged to detect scintillation photons generated when radiation particles emitted from the radioactive material interact with the surrounding scintillator bod. A gating circuit is arranged to receive detection signals from the photodetector and to generate corresponding gating signals for a data acquisition circuit of an associated gamma-ray spectrometer to indicate that gamma-ray detections in the gamma-ray spectrometer occurring within a time window defined by the gating signal are associated with a decay transition in the radioactive isotope. Thus a calibration source is provided based around a simple scintillator body design. Furthermore, the radioactive material may be introduced into the scintillator body in a separate step after manufacture of the scintillator body, thereby reducing the risk of radioactive contamination during manufacture.

    Abstract translation: 提供了一个伽马射线光谱仪的校准源。 校准源包括具有容纳放射性物质的空腔的闪烁体。 闪烁体主体通常可以是长方体,并且可以通过钻入闪烁体的孔形成空腔。 放射性物质包括具有与辐射颗粒的发射有关的衰变过渡的放射性同位素和具有已知能量的γ射线。 Na-22。 光电检测器,例如硅光电倍增管,被光学耦合到闪烁体,并被布置成检测当从放射性物质发射的辐射颗粒与周围的闪烁体体相互作用时产生的闪烁光子。 选通电路被布置成接收来自光电检测器的检测信号并且产生用于相关联的伽马射线光谱仪的数据采集电路的对应门控信号,以指示伽马射线光谱仪中的γ射线检测在由 门控信号与放射性同位素的衰变过渡相关。 因此,基于简单的闪烁器体设计来提供校准源。 此外,在制造闪烁体之后,放射性物质可以在单独的步骤中被引入闪烁体,从而降低制造期间的放射性污染的风险。

    PHOTON COUNTING DETECTOR TO GENERATE HIGH-RESOLUTION IMAGES AND HIGH-CONTRAST IMAGES, AND PHOTON COUNTING AND DETECTING METHOD USING THE SAME
    9.
    发明申请
    PHOTON COUNTING DETECTOR TO GENERATE HIGH-RESOLUTION IMAGES AND HIGH-CONTRAST IMAGES, AND PHOTON COUNTING AND DETECTING METHOD USING THE SAME 审中-公开
    光子计数检测器生成高分辨率图像和高对比度图像,以及光子计数和使用其的检测方法

    公开(公告)号:US20140284492A1

    公开(公告)日:2014-09-25

    申请号:US14297040

    申请日:2014-06-05

    CPC classification number: G01T1/18 G01T1/247 G01T1/29 G01T1/366

    Abstract: A photon counting detector and a photon counting and detecting method using the same is provided. The photon counting detector includes readout circuits configured to count photons in multi-energy radiation incident to a sensor, the photons being counted with respect to each of a plurality of energy bands of the multi-energy radiation, the readout circuits respectively corresponding to pixels of a region onto which the multi-energy radiation is irradiated, each of the readout circuits being configured to count photons in a predetermined one of the energy bands, at least one of the readout circuits being configured to count photons in at least one of energy bands other than the predetermined one of the energy bands.

    Abstract translation: 提供了一种光子计数检测器和使用该光子计数检测器的光子计数和检测方法。 光子计数检测器包括读出电路,其被配置为对入射到传感器的多能量辐射中的光子进行计数,光子相对于多能辐射的多个能带中的每一个被计数,读出电路分别对应于 每个读出电路被配置为对预定的一个能带中的光子进行计数,至少一个读出电路被配置为对至少一个能带中的光子进行计数, 除了预定的一个能带之外。

    System And Method For Gain Regulation
    10.
    发明申请
    System And Method For Gain Regulation 有权
    增益调节系统和方法

    公开(公告)号:US20140145072A1

    公开(公告)日:2014-05-29

    申请号:US14116315

    申请日:2012-05-17

    Inventor: Robert A. Adolph

    CPC classification number: G01T1/40 G01T1/362 G01T1/366 G01V5/101 G01V5/12

    Abstract: Disclosed herein is a system for fast gain regulation in a gamma-ray spectroscopy instrument. The system includes a detector configured to generate a signal indicative of energy arriving at the detector, and a processor configured to determine one or more system performance indicators. The system also includes a controller configured to compute a first gain correction term based on one of more system performance indicators and change the device gain based on the computed first gain correction tem.

    Abstract translation: 本文公开了一种用于γ射线光谱仪器中快速增益调节的系统。 该系统包括被配置为产生指示到达检测器的能量的信号的检测器,以及被配置为确定一个或多个系统性能指标的处理器。 该系统还包括控制器,该控制器被配置为基于更多系统性能指标之一计算第一增益校正项,并且基于所计算的第一增益校正度改变器件增益。

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