公开(公告)号：US09599580B2

公开(公告)日：2017-03-21

申请号：US14428721

申请日：2013-09-19

Applicant: Commissariat a l'Energie Atomique et Aux Energies Alternatives

Inventor： Bahaa Ghammraoui ,  Caroline Paulus ,  Joachim Tabary

IPC: G01T1/36 ,  G01N23/20

CPC classification number: G01N23/20091 ,  G01N2223/639

Abstract: A method and device that analyzes a sample with a diffractometer that includes a collimated source, a spectrometric detector, and a detection collimator. The sample is irradiated with an incident beam and the detector has a detection plane with multiple physical or virtual pixels. An measured energy spectrum is established for each pixel and each measured energy spectrum is readjusted. The spectrum is expressed as a function of a variable that accounts for the energy of the scattered radiation and an angle of diffraction. The fulfillment of at least one multiple material criterion is verified. Groups of pixels are formed using the results of the verification step, each group corresponding to a layer of material and different groups corresponding to different layers of material, and the spectra are combined by group, during which, for each group, the readjusted spectra for the pixels of the group are combined.

公开(公告)号：US10079078B2

公开(公告)日：2018-09-18

申请号：US15288146

申请日：2016-10-07

Applicant: Commissariat a l'energie atomique et aux energies alternatives

Inventor： Artur Sossin ,  Veronique Rebuffel ,  Joachim Tabary

IPC: G01N23/20 ,  G21K1/10 ,  G01N23/083 ,  A61B6/00

CPC classification number: G21K1/10 ,  A61B6/4035 ,  G01N23/083 ,  G01T1/295

Abstract: The invention relates to a method for processing energy spectra of a radiation transmitted by an object irradiated by a source of ionizing radiations, in particular an X radiation, for applications in medical imaging or non-destructive inspection. The method implements a detector comprising a plurality of pixels, each pixel being able to establish a spectrum of the radiation transmitted by the object. The method makes it possible, from a plurality of spectra detected, to establish so-called corrected spectra. Each corrected spectrum is an estimation of the spectrum of a radiation, called primary radiation, transmitted by the object. The invention makes it possible to reduce the influence of the scattering, by the object, of the spectrum emitted by the source.

公开(公告)号：US09535017B2

公开(公告)日：2017-01-03

申请号：US14352774

申请日：2012-10-19

Applicant: Commissariat A L'Energie Atomique Et Aux Energies Alternatives

Inventor： Caroline Paulus ,  Joachim Tabary

IPC: G01N23/203 ,  G01N23/20

CPC classification number: G01N23/20091 ,  G01N23/20066 ,  G01N23/203 ,  G01N2223/063 ,  G01N2223/601

Abstract: The invention relates to a device for identifying a material of an object having: a source of X photons and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after diffusion in a volume of the material and an energy of the X photons of the backscattered beam, the incident and backscattered beams forming an angle of diffusion (θ); a configuration for adjusting the position between the source, the detector and the object in order for the volume to be at different depths with a constant angle, a means for processing the two magnitudes in two positions and the energy in on position and for calculating an attenuation factor (μmateriau (E0, E1, ε)), a configuration for estimating the density (p) of the material.

Abstract translation: 本发明涉及一种用于识别物体的材料的装置，该装置具有：X光子源和光谱检测器，源用入射光束照射物体，检测器测量扩散后的入射光束的后向散射光束的大小 在材料的体积和背散射光束的X光子的能量中，入射和后向散射光束形成扩散角（θ）; 用于调节源，检测器和物体之间的位置以使体积以恒定角度处于不同深度的构造，用于处理两个位置中的两个量值并且在位置上的能量并用于计算一个 衰减因子（μmateriau（E0，E1，ε）），用于估计材料的密度（p）的构造。

公开(公告)号：US10371651B2

公开(公告)日：2019-08-06

申请号：US15389819

申请日：2016-12-23

Applicant: Commissariat a L'Energie Atomique et aux Energies Alternatives

Inventor： Damien Barbes ,  Caroline Paulus ,  Joachim Tabary

IPC: G01N23/207 ,  G01N23/20025 ,  G01N23/20091

Abstract: The invention is a method for analysing an object by x-ray diffraction spectroscopy, in which a spectroscopic detector comprising a plurality of adjacent pixels is placed facing an object irradiated by an x-ray beam. Each pixel is able to acquire an energy spectrum of radiation elastically scattered by the object, the radiation propagating in a direction making an acute angle to the propagation direction of the collimated beam. The method allows, on the basis of each measured spectrum, a nature of the materials composing various portions of the object to be determined.

公开(公告)号：US20140348298A1

公开(公告)日：2014-11-27

申请号：US14368748

申请日：2012-12-26

Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES

Inventor： Bahaa Ghammraoui ,  Joachim Tabary ,  Caroline Paulus

IPC: G01N23/207 ,  G21K1/02 ,  G01T1/36

CPC classification number: G01N23/2076 ,  G01N23/20091 ,  G01N2223/501 ,  G01T1/366 ,  G21K1/02

Abstract: A method for analyzing a sample by diffractometry and a diffractometer, where the diffractometer includes a collimated source, a detection collimator, and a spectrometric detector, the detection axis of the detector and the collimator form a diffraction angle with the central axis of an incident beam and an energy spectrum is established for each pixel of the detector. and The measured spectra are readjusted by a change in variable that takes into account the energy of the scattered radiation and the angle of observation. measured The spectra are combined and a check is made on the implementation of at least one multi-material criterion representative of the presence of a plurality of layers of materials and groups of pixels are formed according to the results of this check, where each group corresponds to a single layer of material and the measured spectra obtained for the pixels of the group are combined.

Abstract translation: 通过衍射法和衍射仪分析样品的方法，其中衍射仪包括准直源，检测准直仪和光谱检测器，检测器和准直器的检测轴与入射光束的中心轴形成衍射角 并且为检测器的每个像素建立能谱。 并且通过考虑到散射辐射的能量和观察角度的变量的变化来重新调整测量的光谱。 测量的光谱被组合，并且对至少一个多材料标准的实施进行检查，该标准代表多个材料层的存在，并且根据该检查的结果形成各组的像素，其中每个组对应 到单层材料，并且对于组的像素获得的测量光谱进行组合。

公开(公告)号：US11872071B2

公开(公告)日：2024-01-16

申请号：US17283446

申请日：2019-10-07

Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES ,  CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE ,  INSTITUT NATIONAL DES SCIENCES APPLIQUEES DE LYON

Inventor： Odran Pivot ,  Joachim Tabary ,  Clarisse Fournier ,  Jean Michel Letang ,  Simon Rit

IPC: A61B6/00 ,  G01N23/041 ,  G01N23/10 ,  G01N23/18 ,  G01N23/20066 ,  G01N23/201 ,  G01T1/16 ,  G01T1/36 ,  G01N23/20091 ,  G01T1/29 ,  A61B6/06 ,  G01N23/04 ,  G01N23/046

CPC classification number: A61B6/5282 ,  A61B6/06 ,  A61B6/4035 ,  A61B6/4208 ,  A61B6/482 ,  A61B6/483 ,  A61B6/5258 ,  A61B6/585 ,  G01N23/04 ,  G01N23/046 ,  G01N23/201 ,  G01N23/20066 ,  G01N23/20091 ,  G01T1/295 ,  G01T1/2914 ,  G01T1/36 ,  G01N2223/401

Abstract: The invention concerns a method for processing energy spectra of radiation transmitted by an object irradiated by an ionising radiation source, in particular X-ray radiation, for medical imaging or non-destructive testing applications. The method uses a detector comprising a plurality of pixels, each pixel being capable of acquiring a spectrum of the radiation transmitted by the object. The method makes it possible, based on a plurality of detected spectra, to estimate a spectrum, referred to as the scattering spectrum, representative of radiation scattered by the object. The estimation involves taking into account a spatial model of the scattering spectrum. Each acquired spectrum is corrected taking into account the estimated scattering spectrum. The invention makes it possible to reduce the influence of the scattering, by the object, of the spectrum emitted by the source.

公开(公告)号：US10605749B2

公开(公告)日：2020-03-31

申请号：US15322542

申请日：2015-06-25

Applicant: Commissariat A L'Energie Atomique et Aux Energies Alternatives

Inventor： Caroline Paulus ,  Joachim Tabary

IPC: G01N23/20 ,  G01N23/201 ,  G01N23/087

Abstract: A method for analyzing an object, includes irradiating the object with incident photon radiation, acquiring a spectrum transmitted by the object using a spectrometric transmission detector, determining at least one first property of the object from the transmission spectrum, verifying that at least one doubt criterion relating to the first property of the object is met, and translating the fact that the object contains a material that is potentially dubious for the application under consideration. A second part, carried out only when the doubt criterion is met, includes acquiring an energy spectrum scattered by the object using a spectrometric scattering detector at an angle of 1° to 15°, and determining a second property of the object from at least the scatter spectrum and comparing at least the second property of the object with properties of standard materials stored in a database to identify the objects composition material.

公开(公告)号：US10386508B2

公开(公告)日：2019-08-20

申请号：US15389783

申请日：2016-12-23

Applicant: Commissariat a L'Energie Atomique et aux Energies Alternatives

Inventor： Joachim Tabary ,  Damien Barbes ,  Caroline Paulus

IPC: G01N23/20091 ,  G01T7/00 ,  G01T1/29 ,  G01T1/36

Abstract: The invention is a method of calibrating an X ray diffraction measuring system. The method includes moving a so-called calibration object along a propagation axis along which an irradiation beam propagates, the calibration object being adapted to occupy a plurality of successive positions along that axis. At each position of the object a spectrometry detector including at least one pixel acquires a spectrum of scattering radiation emitted by the object at an acute angle relative to the propagation axis. The method includes, in various spectra corresponding to various respective positions of the object, the identification of a so-called calibration peak and obtaining a parameter of said peak, which parameter can be the intensity or the energy of said peak. The parameters obtained on the various peaks then make it possible to establish an associated pixel dispersion function.

公开(公告)号：US10352882B2

公开(公告)日：2019-07-16

申请号：US15322611

申请日：2015-06-25

Applicant: Commissariat A L'Energie Atomique et Aux Energies Alternatives

Inventor： Caroline Paulus ,  Joachim Tabary

IPC: G01N23/20 ,  G01N23/201 ,  G01N23/087 ,  G01N23/207

Abstract: A method for analyzing an object includes irradiating the object with incident photon radiation and acquiring an energy spectrum scattered by the material using a spectrometric detector in scatter mode. An energy spectrum transmitted by the material is acquired using a spectrometric detector in transmission mode. A signature (f) is reconstructed representing the object, both from the scatter spectrum measured and from the transmission spectrum measured, and the reconstructed signature thereof is compared with signatures of standard materials.

公开(公告)号：US09285329B2

公开(公告)日：2016-03-15

申请号：US14368748

申请日：2012-12-26

Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES

Inventor： Bahaa Ghammraoui ,  Joachim Tabary ,  Caroline Paulus

IPC: G01N23/207 ,  G01N23/20 ,  G01T1/36 ,  G21K1/02

CPC classification number: G01N23/2076 ,  G01N23/20091 ,  G01N2223/501 ,  G01T1/366 ,  G21K1/02

Abstract: A method for analyzing a sample by diffractometry and a diffractometer, where the diffractometer includes a collimated source, a detection collimator, and a spectrometric detector, the detection axis of the detector and the collimator form a diffraction angle with the central axis of an incident beam and an energy spectrum is established for each pixel of the detector. The measured spectra are readjusted by a change in variable that takes into account the energy of the scattered radiation and the angle of observation. The measured are combined and a check is made on the implementation of at least one multi-material criterion representative of the presence of a plurality of layers of materials and groups of pixels are formed according to the results of this check, where each group corresponds to a single layer of material and the measured spectra obtained for the pixels of the group are combined.

Abstract translation: 通过衍射法和衍射仪分析样品的方法，其中衍射仪包括准直源，检测准直仪和光谱检测器，检测器和准直器的检测轴与入射光束的中心轴形成衍射角 并且为检测器的每个像素建立能谱。 测量的光谱通过考虑散射辐射的能量和观察角度的变量的变化来重新调整。 将所测量的组合起来，并且对至少一个多材料标准的实现进行检查，该标准代表多个材料层的存在，并且根据该检查的结果形成各组的像素，其中每个组对应于 组合单层材料和获得的针对组的像素的测量光谱。