Invention Grant
- Patent Title: Method and system for analyzing an object by diffractometry using a scattering spectrum and a transmission spectrum
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Application No.: US15322611Application Date: 2015-06-25
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Publication No.: US10352882B2Publication Date: 2019-07-16
- Inventor: Caroline Paulus , Joachim Tabary
- Applicant: Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Applicant Address: FR Paris
- Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
- Current Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
- Current Assignee Address: FR Paris
- Agency: Brinks Gilson & Lione
- Priority: FR1456186 20140630
- International Application: PCT/FR2015/051714 WO 20150625
- International Announcement: WO2016/001536 WO 20160107
- Main IPC: G01N23/20
- IPC: G01N23/20 ; G01N23/201 ; G01N23/087 ; G01N23/207

Abstract:
A method for analyzing an object includes irradiating the object with incident photon radiation and acquiring an energy spectrum scattered by the material using a spectrometric detector in scatter mode. An energy spectrum transmitted by the material is acquired using a spectrometric detector in transmission mode. A signature (f) is reconstructed representing the object, both from the scatter spectrum measured and from the transmission spectrum measured, and the reconstructed signature thereof is compared with signatures of standard materials.
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