Abstract:
The invention is a method for characterizing an object (20), comprising the following steps: a) placing the object between a radiation source (10) and a radiation detector (30); b) irradiating the object with the radiation source and detecting radiation transmitted by the object (14) using the radiation detector, the radiation detector defining a plurality of pixels; c) for each pixel (30i), forming an energy spectrum (Si) of the detected radiation, each spectrum comprising at least two distinct energy bands; d) from each spectrum formed in c), estimating, in each pixel, at least two equivalent thicknesses ({circumflex over (L)}i,1 . . . {circumflex over (L)}i,M,{circumflex over (L)}′i,1 . . . {circumflex over (L)}′i,M) respectively associated with at least two basic materials (mat1 . . . matM,mat′1 . . . mat′M); wherein the method comprises, following d), the following steps: e) from the equivalent thicknesses resulting from d), calculating a structural parameter (Pi) of the object in various pixels (30i); f) spatially smoothing the structural parameter calculated in a plurality of pixels; g) from the structural parameter smoothed in each pixel, and from each spectrum formed in c), estimating, in each pixel, regularized equivalent thicknesses ({circumflex over (L)}i,m=1|Pi* . . . {circumflex over (L)}i,m=M|Pi*,{circumflex over (L)}′i,m=1|Pi* . . . {circumflex over (L)}i,m=M|Pi*).
Abstract:
The invention is a method for analysing an object by x-ray diffraction spectroscopy, in which a spectroscopic detector comprising a plurality of adjacent pixels is placed facing an object irradiated by an x-ray beam. Each pixel is able to acquire an energy spectrum of radiation elastically scattered by the object, the radiation propagating in a direction making an acute angle to the propagation direction of the collimated beam. The method allows, on the basis of each measured spectrum, a nature of the materials composing various portions of the object to be determined.
Abstract:
The invention relates to the field of the analysis of objects by x-ray diffraction spectroscopy. One subject of the invention is a device for analyzing an object by x-ray diffraction spectroscopy, comprising a collimator the shape of which allows various portions of an object to be analyzed simultaneously. To do this, the collimator includes channels inclined with respect to an axis, called the central axis of the collimator, in such a way that various channels address various elementary volumes distributed through the object. Another subject of the invention is a method allowing an object to be analyzed using such a device. The object may for example be a biological tissue that it is desired to characterize non-invasively and non-destructively.
Abstract:
A method for analyzing a sample by diffractometry and a diffractometer, where the diffractometer includes a collimated source, a detection collimator, and a spectrometric detector, the detection axis of the detector and the collimator form a diffraction angle with the central axis of an incident beam and an energy spectrum is established for each pixel of the detector. and The measured spectra are readjusted by a change in variable that takes into account the energy of the scattered radiation and the angle of observation. measured The spectra are combined and a check is made on the implementation of at least one multi-material criterion representative of the presence of a plurality of layers of materials and groups of pixels are formed according to the results of this check, where each group corresponds to a single layer of material and the measured spectra obtained for the pixels of the group are combined.
Abstract:
A method for identifying a material contained in a sample. The sample is subjected to irradiation via ionizing electromagnetic radiation, for example X-rays. The sample is inserted between a source emitting the radiation and a spectrometric detector configured to acquire a spectrum of the radiation transmitted by the sample. The spectrum is subject to different treatment operations to enable classification of the material. The steps are, consecutively: reducing dimensionality, followed by projecting along the predefined projection vectors. Projection makes it possible to establish classification parameters, on the basis of which classification is established.
Abstract:
A method and device that analyzes a sample with a diffractometer that includes a collimated source, a spectrometric detector, and a detection collimator. The sample is irradiated with an incident beam and the detector has a detection plane with multiple physical or virtual pixels. An measured energy spectrum is established for each pixel and each measured energy spectrum is readjusted. The spectrum is expressed as a function of a variable that accounts for the energy of the scattered radiation and an angle of diffraction. The fulfillment of at least one multiple material criterion is verified. Groups of pixels are formed using the results of the verification step, each group corresponding to a layer of material and different groups corresponding to different layers of material, and the spectra are combined by group, during which, for each group, the readjusted spectra for the pixels of the group are combined.
Abstract:
A method for analyzing an object, includes irradiating the object with incident photon radiation, acquiring a spectrum transmitted by the object using a spectrometric transmission detector, determining at least one first property of the object from the transmission spectrum, verifying that at least one doubt criterion relating to the first property of the object is met, and translating the fact that the object contains a material that is potentially dubious for the application under consideration. A second part, carried out only when the doubt criterion is met, includes acquiring an energy spectrum scattered by the object using a spectrometric scattering detector at an angle of 1° to 15°, and determining a second property of the object from at least the scatter spectrum and comparing at least the second property of the object with properties of standard materials stored in a database to identify the objects composition material.
Abstract:
The invention is a method of calibrating an X ray diffraction measuring system. The method includes moving a so-called calibration object along a propagation axis along which an irradiation beam propagates, the calibration object being adapted to occupy a plurality of successive positions along that axis. At each position of the object a spectrometry detector including at least one pixel acquires a spectrum of scattering radiation emitted by the object at an acute angle relative to the propagation axis. The method includes, in various spectra corresponding to various respective positions of the object, the identification of a so-called calibration peak and obtaining a parameter of said peak, which parameter can be the intensity or the energy of said peak. The parameters obtained on the various peaks then make it possible to establish an associated pixel dispersion function.
Abstract:
A method for analyzing an object includes irradiating the object with incident photon radiation and acquiring an energy spectrum scattered by the material using a spectrometric detector in scatter mode. An energy spectrum transmitted by the material is acquired using a spectrometric detector in transmission mode. A signature (f) is reconstructed representing the object, both from the scatter spectrum measured and from the transmission spectrum measured, and the reconstructed signature thereof is compared with signatures of standard materials.
Abstract:
A method for analyzing a sample by diffractometry and a diffractometer, where the diffractometer includes a collimated source, a detection collimator, and a spectrometric detector, the detection axis of the detector and the collimator form a diffraction angle with the central axis of an incident beam and an energy spectrum is established for each pixel of the detector. The measured spectra are readjusted by a change in variable that takes into account the energy of the scattered radiation and the angle of observation. The measured are combined and a check is made on the implementation of at least one multi-material criterion representative of the presence of a plurality of layers of materials and groups of pixels are formed according to the results of this check, where each group corresponds to a single layer of material and the measured spectra obtained for the pixels of the group are combined.