Method for characterizing an object using spectral imaging

    公开(公告)号:US10983070B2

    公开(公告)日:2021-04-20

    申请号:US16448227

    申请日:2019-06-21

    Abstract: The invention is a method for characterizing an object (20), comprising the following steps: a) placing the object between a radiation source (10) and a radiation detector (30); b) irradiating the object with the radiation source and detecting radiation transmitted by the object (14) using the radiation detector, the radiation detector defining a plurality of pixels; c) for each pixel (30i), forming an energy spectrum (Si) of the detected radiation, each spectrum comprising at least two distinct energy bands; d) from each spectrum formed in c), estimating, in each pixel, at least two equivalent thicknesses ({circumflex over (L)}i,1 . . . {circumflex over (L)}i,M,{circumflex over (L)}′i,1 . . . {circumflex over (L)}′i,M) respectively associated with at least two basic materials (mat1 . . . matM,mat′1 . . . mat′M); wherein the method comprises, following d), the following steps: e) from the equivalent thicknesses resulting from d), calculating a structural parameter (Pi) of the object in various pixels (30i); f) spatially smoothing the structural parameter calculated in a plurality of pixels; g) from the structural parameter smoothed in each pixel, and from each spectrum formed in c), estimating, in each pixel, regularized equivalent thicknesses ({circumflex over (L)}i,m=1|Pi* . . . {circumflex over (L)}i,m=M|Pi*,{circumflex over (L)}′i,m=1|Pi* . . . {circumflex over (L)}i,m=M|Pi*).

    Method Of Analysing A Sample Of Material By Diffractometry And Associated Diffractometer
    4.
    发明申请
    Method Of Analysing A Sample Of Material By Diffractometry And Associated Diffractometer 有权
    通过衍射和相关衍射仪分析材料样品的方法

    公开(公告)号:US20140348298A1

    公开(公告)日:2014-11-27

    申请号:US14368748

    申请日:2012-12-26

    Abstract: A method for analyzing a sample by diffractometry and a diffractometer, where the diffractometer includes a collimated source, a detection collimator, and a spectrometric detector, the detection axis of the detector and the collimator form a diffraction angle with the central axis of an incident beam and an energy spectrum is established for each pixel of the detector. and The measured spectra are readjusted by a change in variable that takes into account the energy of the scattered radiation and the angle of observation. measured The spectra are combined and a check is made on the implementation of at least one multi-material criterion representative of the presence of a plurality of layers of materials and groups of pixels are formed according to the results of this check, where each group corresponds to a single layer of material and the measured spectra obtained for the pixels of the group are combined.

    Abstract translation: 通过衍射法和衍射仪分析样品的方法,其中衍射仪包括准直源,检测准直仪和光谱检测器,检测器和准直器的检测轴与入射光束的中心轴形成衍射角 并且为检测器的每个像素建立能谱。 并且通过考虑到散射辐射的能量和观察角度的变量的变化来重新调整测量的光谱。 测量的光谱被组合,并且对至少一个多材料标准的实施进行检查,该标准代表多个材料层的存在,并且根据该检查的结果形成各组的像素,其中每个组对应 到单层材料,并且对于组的像素获得的测量光谱进行组合。

    Material identification method
    5.
    发明授权

    公开(公告)号:US10564113B2

    公开(公告)日:2020-02-18

    申请号:US15742191

    申请日:2016-07-07

    Inventor: Caroline Paulus

    Abstract: A method for identifying a material contained in a sample. The sample is subjected to irradiation via ionizing electromagnetic radiation, for example X-rays. The sample is inserted between a source emitting the radiation and a spectrometric detector configured to acquire a spectrum of the radiation transmitted by the sample. The spectrum is subject to different treatment operations to enable classification of the material. The steps are, consecutively: reducing dimensionality, followed by projecting along the predefined projection vectors. Projection makes it possible to establish classification parameters, on the basis of which classification is established.

    Method of analyzing an object in two stages using a transmission spectrum then a scattering spectrum

    公开(公告)号:US10605749B2

    公开(公告)日:2020-03-31

    申请号:US15322542

    申请日:2015-06-25

    Abstract: A method for analyzing an object, includes irradiating the object with incident photon radiation, acquiring a spectrum transmitted by the object using a spectrometric transmission detector, determining at least one first property of the object from the transmission spectrum, verifying that at least one doubt criterion relating to the first property of the object is met, and translating the fact that the object contains a material that is potentially dubious for the application under consideration. A second part, carried out only when the doubt criterion is met, includes acquiring an energy spectrum scattered by the object using a spectrometric scattering detector at an angle of 1° to 15°, and determining a second property of the object from at least the scatter spectrum and comparing at least the second property of the object with properties of standard materials stored in a database to identify the objects composition material.

    Method of calibrating an X ray diffraction analysis system

    公开(公告)号:US10386508B2

    公开(公告)日:2019-08-20

    申请号:US15389783

    申请日:2016-12-23

    Abstract: The invention is a method of calibrating an X ray diffraction measuring system. The method includes moving a so-called calibration object along a propagation axis along which an irradiation beam propagates, the calibration object being adapted to occupy a plurality of successive positions along that axis. At each position of the object a spectrometry detector including at least one pixel acquires a spectrum of scattering radiation emitted by the object at an acute angle relative to the propagation axis. The method includes, in various spectra corresponding to various respective positions of the object, the identification of a so-called calibration peak and obtaining a parameter of said peak, which parameter can be the intensity or the energy of said peak. The parameters obtained on the various peaks then make it possible to establish an associated pixel dispersion function.

    Method of analysing a sample of material by diffractometry and associated diffractometer
    10.
    发明授权
    Method of analysing a sample of material by diffractometry and associated diffractometer 有权
    通过衍射和相关衍射仪分析材料样品的方法

    公开(公告)号:US09285329B2

    公开(公告)日:2016-03-15

    申请号:US14368748

    申请日:2012-12-26

    Abstract: A method for analyzing a sample by diffractometry and a diffractometer, where the diffractometer includes a collimated source, a detection collimator, and a spectrometric detector, the detection axis of the detector and the collimator form a diffraction angle with the central axis of an incident beam and an energy spectrum is established for each pixel of the detector. The measured spectra are readjusted by a change in variable that takes into account the energy of the scattered radiation and the angle of observation. The measured are combined and a check is made on the implementation of at least one multi-material criterion representative of the presence of a plurality of layers of materials and groups of pixels are formed according to the results of this check, where each group corresponds to a single layer of material and the measured spectra obtained for the pixels of the group are combined.

    Abstract translation: 通过衍射法和衍射仪分析样品的方法,其中衍射仪包括准直源,检测准直仪和光谱检测器,检测器和准直器的检测轴与入射光束的中心轴形成衍射角 并且为检测器的每个像素建立能谱。 测量的光谱通过考虑散射辐射的能量和观察角度的变量的变化来重新调整。 将所测量的组合起来,并且对至少一个多材料标准的实现进行检查,该标准代表多个材料层的存在,并且根据该检查的结果形成各组的像素,其中每个组对应于 组合单层材料和获得的针对组的像素的测量光谱。

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