Invention Grant
- Patent Title: Method of analysing a sample of material by diffractometry and associated diffractometer
- Patent Title (中): 通过衍射和相关衍射仪分析材料样品的方法
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Application No.: US14368748Application Date: 2012-12-26
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Publication No.: US09285329B2Publication Date: 2016-03-15
- Inventor: Bahaa Ghammraoui , Joachim Tabary , Caroline Paulus
- Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
- Applicant Address: FR Paris
- Assignee: Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Current Assignee: Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Current Assignee Address: FR Paris
- Agency: Brinks Gilson & Lione
- Priority: FR1162497 20111228; FR1258851 20120920
- International Application: PCT/FR2012/053080 WO 20121226
- International Announcement: WO2013/098520 WO 20130704
- Main IPC: G01N23/207
- IPC: G01N23/207 ; G01N23/20 ; G01T1/36 ; G21K1/02

Abstract:
A method for analyzing a sample by diffractometry and a diffractometer, where the diffractometer includes a collimated source, a detection collimator, and a spectrometric detector, the detection axis of the detector and the collimator form a diffraction angle with the central axis of an incident beam and an energy spectrum is established for each pixel of the detector. The measured spectra are readjusted by a change in variable that takes into account the energy of the scattered radiation and the angle of observation. The measured are combined and a check is made on the implementation of at least one multi-material criterion representative of the presence of a plurality of layers of materials and groups of pixels are formed according to the results of this check, where each group corresponds to a single layer of material and the measured spectra obtained for the pixels of the group are combined.
Public/Granted literature
- US20140348298A1 Method Of Analysing A Sample Of Material By Diffractometry And Associated Diffractometer Public/Granted day:2014-11-27
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