公开(公告)号：US20170227661A1

公开(公告)日：2017-08-10

申请号：US15017215

申请日：2016-02-05

Applicant: Marc Battyani ,  Peter Hardman

Inventor： Marc Battyani ,  Peter Hardman

IPC: G01T7/00 ,  G01N23/223

CPC classification number: G01T7/005 ,  G01N23/223 ,  G01N2223/303 ,  G01T1/40

Abstract: Disclosed are circuits for automatic calibration of the gain of electronic amplification and digitization systems for use with X-ray detectors. The calibration is based on injecting predetermined pulses into the electronic system and deriving a calibration ratio based the digital value of their amplitude with the digital value of the same pulses, unamplified and digitized with a high accuracy reference ADC. All ADCs, as well as the DACs used to control the pulser amplitude are referenced to a single common reference voltage. Calibration for non-linearity of the gain is disclosed with an alternative embodiment for the same circuits.

公开(公告)号：US20170123075A1

公开(公告)日：2017-05-04

申请号：US14931921

申请日：2015-11-04

Applicant: Marc Battyani

Inventor： Marc Battyani

IPC: G01T1/175 ,  G01N23/223

CPC classification number: G01T1/175 ,  G01N23/223 ,  G01N2223/076 ,  G01N2223/3103

Abstract: Disclosed is a circuit for controlling the temperature and the bias voltage of a detector used by an X-ray analytical instrument. The circuit uses a single common reference voltage for the temperature measurement and for all the ADCs and DACs in the circuit, resulting in reduced drift and improved reproducibility of detector temperature and bias voltage. ADCs with a larger number of bits are used to produce precision values of the temperature, the bias voltage, and their respective setpoints. The setpoints are digitally varied until the precision setpoint values correspond to desired values of temperature and bias setpoints.

公开(公告)号：US20130226764A1

公开(公告)日：2013-08-29

申请号：US13768773

申请日：2013-02-15

Applicant: Marc Battyani

Inventor： Marc Battyani

IPC: G06Q40/04

CPC classification number: G06Q30/0201 ,  G06Q10/1097 ,  G06Q40/04 ,  H04L67/32

Abstract: High volume data processing systems and methods are provided to enable ultra-low latency processing and distribution of data. The systems and methods can be implemented to service primary trading houses where microsecond delays can significantly impact performance and value. According to one aspect, the systems and methods are configured to process data from a variety of market data sources in a variety of formats, while maintaining target latencies of less than 1 microsecond. A matrix of FPGA nodes is configured to provide ultra-low latencies while enabling deterministic and distributed processing. In some embodiments, the matrix can be to configured to provide consistent latencies even during microburst conditions. Further book building operations (determination of current holdings and assets) can occur under ultra-low latency timing, providing for near instantaneous risk management, management, and execution processes, even under micro-burst conditions. In further embodiments, a FPGA matrix provides a readily expandable and convertible processing platform.

Abstract translation: 提供大容量数据处理系统和方法，以实现超低延迟处理和数据分发。 可以实施系统和方法来服务于初级贸易公司，其中微秒延迟会显着影响性能和价值。 根据一个方面，系统和方法被配置为以各种格式处理来自各种市场数据源的数据，同时保持小于1微秒的目标延迟。 FPGA节点的矩阵被配置为提供超低延迟，同时实现确定性和分布式处理。 在一些实施例中，矩阵可以被配置为即使在微爆发条件期间提供一致的延迟。 进一步的书籍建筑操作（确定当前持有量和资产）可以在超低延迟时间下进行，即使在微突发条件下也能实现即时的即时风险管理，管理和执行流程。 在另外的实施例中，FPGA矩阵提供易于扩展和可转换的处理平台。

公开(公告)号：US10267925B2

公开(公告)日：2019-04-23

申请号：US16108199

申请日：2018-08-22

Applicant: Marc Battyani

Inventor： Marc Battyani

IPC: G01N23/223 ,  G01T1/175

Abstract: Disclosed is a circuit for controlling the temperature and the bias voltage of a detector used by an X-ray analytical instrument. The circuit uses a single common reference voltage for the temperature measurement and for all the ADCs and DACs in the circuit, resulting in reduced drift and improved reproducibility of detector temperature and bias voltage. ADCs with a larger number of bits are used to produce precision values of the temperature, the bias voltage, and their respective setpoints. The setpoints are digitally varied until the precision setpoint values correspond to desired values of temperature and bias setpoints.

公开(公告)号：US20170276803A1

公开(公告)日：2017-09-28

申请号：US15082647

申请日：2016-03-28

Applicant: Marc Battyani

Inventor： Marc Battyani

IPC: G01T1/175 ,  G01N23/223

CPC classification number: G01T1/175 ,  G01N23/223 ,  G01T1/17 ,  G01T1/366

Abstract: Disclosed is an electronic system for resetting the voltage of a charge-sensitive pre-amplifier having input from an X-ray detector and output to an ADC. The pre-amplifier gain is increased so that the RMS ADC noise is less than 1% of a representative digitized X-ray signal. The reset logic is configured to avoid loss of X-ray counts and to prevent the pre-amplifier output being outside the allowable input range of the ADC. Reset is initiated when the pre-amplifier output rises above an upper level, which is below the maximum allowable ADC input. Reset is also initiated when a pile-up event is detected, provided that such reset will not cause the pre-amplifier output to fall below the minimum allowable ADC input. At each reset a known amount of charge is removed from the pre-amplifier, and the reset time is continuously adjusted to ensure that the charge amount does not drift.

公开(公告)号：US10267932B2

公开(公告)日：2019-04-23

申请号：US15017215

申请日：2016-02-05

Applicant: Marc Battyani ,  Peter Hardman

Inventor： Marc Battyani ,  Peter Hardman

IPC: G01T7/00 ,  G01N23/223

Abstract: Disclosed are circuits for automatic calibration of the gain of electronic amplification and digitization systems for use with X-ray detectors. The calibration is based on injecting predetermined pulses into the electronic system and deriving a calibration ratio based the digital value of their amplitude with the digital value of the same pulses, unamplified and digitized with a high accuracy reference ADC. All ADCs, as well as the DACs used to control the pulser amplitude are referenced to a single common reference voltage. Calibration for non-linearity of the gain is disclosed with an alternative embodiment for the same circuits.

公开(公告)号：US20190004184A1

公开(公告)日：2019-01-03

申请号：US16108199

申请日：2018-08-22

Applicant: Marc Battyani

Inventor： Marc Battyani

IPC: G01T1/175 ,  G01N23/223

Abstract: Disclosed is a circuit for controlling the temperature and the bias voltage of a detector used by an X-ray analytical instrument. The circuit uses a single common reference voltage for the temperature measurement and for all the ADCs and DACs in the circuit, resulting in reduced drift and improved reproducibility of detector temperature and bias voltage. ADCs with a larger number of bits are used to produce precision values of the temperature, the bias voltage, and their respective setpoints. The setpoints are digitally varied until the precision setpoint values correspond to desired values of temperature and bias setpoints.

公开(公告)号：US10094936B2

公开(公告)日：2018-10-09

申请号：US14931921

申请日：2015-11-04

Applicant: Marc Battyani

Inventor： Marc Battyani

IPC: G01T1/24 ,  G01T1/175 ,  G01N23/223

Abstract: Disclosed is a circuit for controlling the temperature and the bias voltage of a detector used by an X-ray analytical instrument. The circuit uses a single common reference voltage for the temperature measurement and for all the ADCs and DACs in the circuit, resulting in reduced drift and improved reproducibility of detector temperature and bias voltage. ADCs with a larger number of bits are used to produce precision values of the temperature, the bias voltage, and their respective setpoints. The setpoints are digitally varied until the precision setpoint values correspond to desired values of temperature and bias setpoints.

公开(公告)号：US20070008166A1

公开(公告)日：2007-01-11

申请号：US10560820

申请日：2004-06-16

Applicant: Christian Kovacik ,  Marc Battyani

Inventor： Christian Kovacik ,  Marc Battyani

IPC: G08B5/22

CPC classification number: G01D9/005 ,  G01K1/022

Abstract: Disclosed is a device for acquiring and monitoring over time the development of at least one product-related variable. Said device comprises a support (34) that is associated with the product and supports a set of at least one sensor (26) for measuring said variable and means (30, 32, 34) for processing the data output by the sensor so as to monitor the development of said variable relative to threshold values. Said processing means are provided with a file system (30) in which the data output by the sensor is stored and a management algorithm (32) that organizes storing of the data in the file system and manages retrieval of said data. The file system and the management algorithm are mounted within the support.

Abstract translation: 公开了一种用于随时间获取和监测至少一个与产品相关的变量的开发的装置。 所述装置包括与产品相关联的支撑件（34），并且支撑用于测量所述变量的一组至少一个传感器（26）和用于处理由传感器输出的数据的装置（30,32,34），以便 监测所述变量相对于阈值的发展。 所述处理装置设置有存储由传感器输出的数据的文件系统（30），以及管理算法（32），其将数据存储在文件系统中并管理所述数据的检索。 文件系统和管理算法安装在支持中。