Invention Application
- Patent Title: XRF ANALYZER WITH IMPROVED RESOLUTION BY USING MICRO-RESET
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Application No.: US15082647Application Date: 2016-03-28
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Publication No.: US20170276803A1Publication Date: 2017-09-28
- Inventor: Marc Battyani
- Applicant: Marc Battyani
- Applicant Address: US MA Waltham
- Assignee: Olympus Scientific Solutions Americas Inc.
- Current Assignee: Olympus Scientific Solutions Americas Inc.
- Current Assignee Address: US MA Waltham
- Main IPC: G01T1/175
- IPC: G01T1/175 ; G01N23/223

Abstract:
Disclosed is an electronic system for resetting the voltage of a charge-sensitive pre-amplifier having input from an X-ray detector and output to an ADC. The pre-amplifier gain is increased so that the RMS ADC noise is less than 1% of a representative digitized X-ray signal. The reset logic is configured to avoid loss of X-ray counts and to prevent the pre-amplifier output being outside the allowable input range of the ADC. Reset is initiated when the pre-amplifier output rises above an upper level, which is below the maximum allowable ADC input. Reset is also initiated when a pile-up event is detected, provided that such reset will not cause the pre-amplifier output to fall below the minimum allowable ADC input. At each reset a known amount of charge is removed from the pre-amplifier, and the reset time is continuously adjusted to ensure that the charge amount does not drift.
Public/Granted literature
- US11415710B2 XRF analyzer with improved resolution by using micro-reset Public/Granted day:2022-08-16
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