-
1.发明公开公开(公告)号：US20240192287A1
公开(公告)日：2024-06-13
申请号：US18554298
申请日：2022-03-30
Applicant: ONEPREDICT CO., LTD.
Inventor： Bo Seong SEO , Jae Kyung SHIN
Abstract: A method for determining an integrity factor through machine learning, and a device for performing such a method can include the steps in which: a device status determination device determines an integrity feature on the basis of machine learning; the device state determination device generates an integrity plane on the basis of the integrity feature; the device state determination device receives target input data of a target device; the device state determination device determines an integrity factor corresponding to the target input data on the basis of the integrity plane; and the device status determination device determines the status of the target device on the basis of the integrity factor.
-
公开(公告)号：US11864311B1
公开(公告)日：2024-01-02
申请号：US16393953
申请日：2019-04-24
Applicant: Heathkit Company, Inc.
Inventor： Andrew S. Cromarty , Donald J. Peterson , Jasen Levoy , William Charles Calhoun , David Brainerd , Ann E. Cromarty , Simon A. Cromarty
CPC classification number: H05K1/0295 , F24C7/046 , F24C7/085 , G01R31/28 , G09B23/185 , H05K1/0266 , H05K5/0217 , H05K7/1402
Abstract: Systems and methods for educational electronics devices such as may be assembled by non-manufacturer builders, including by personal or hobbyist individuals and by groups such as clubs or classes. Methods and systems relate to Surface Mount Device (SMD) use, measurement systems, communications skill acquisition, physical construction of educational electronics, builder construction/configuration and maintenance of devices, subsystem componentry designed for effective use in educational electronics, circuit designs that permit individual builders to construct professional quality devices, and cognitively adapted methods and systems to optimize learning and performance during and after builder assembly.
-
公开(公告)号：US20230324452A1
公开(公告)日：2023-10-12
申请号：US18335360
申请日：2023-06-15
Applicant: TeraView Limited
Inventor： Bryan Edward Cole
CPC classification number: G01R31/28 , G01R31/308 , G01R31/2822 , G01R31/11
Abstract: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from the pulsed source; a second photoconductive element configured to receive a pulse; and a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element. At least one of the first and second photoconductive elements is provided on a different substrate to that of the transmission line arrangement.
-
公开(公告)号：US11740299B2
公开(公告)日：2023-08-29
申请号：US17099638
申请日：2020-11-16
Applicant: Power Probe Group, Inc.
Inventor： Jeff Whisenand , Randy Cruz
CPC classification number: G01R31/52 , G01R23/16 , G01R31/005 , G01R31/006 , G01R31/1272 , G01R31/28 , G01R31/007
Abstract: An electrical test device may include a power supply, a conductive probe element, and a spectral analysis block. The power supply may be connected to an external power source. The conductive probe element may be connected to the power supply and may be configured to be energized by the power supply. The probe element may be configured to be placed in contact with an electrical system under test and apply an input signal containing current for measuring at least one parameter of the electrical system. The spectral analysis block may be connected to the probe element and may be configured to receive an output signal from the electrical system in response to the application of the current to the electrical system. The spectral analysis block may be configured to analyze frequency spectra of the output signal and detect a broadband increase in energy of the frequency spectra above a predetermined energy threshold. The broadband increase in energy may be representative of the occurrence of arcing in the electrical system.
-
公开(公告)号：US20190237033A1
公开(公告)日：2019-08-01
申请号：US16339538
申请日：2017-09-06
Applicant: Rohm Co., Ltd.
Inventor： Yasuhito Sugimoto , Sukenori ITO , Hiromitsu Nakaoka
CPC classification number: G09G3/3648 , G01R31/28 , G09G3/04 , G09G3/18 , G09G2310/0286 , G09G2310/0289 , H01L21/822 , H01L27/04
Abstract: A display driver IC (200) comprises: a digital circuit including a logic circuit (2); an output unit (11) for outputting, to the outside, a drive control signal with a level corresponding to the output from the logic circuit; and at least one of a first decision unit (21) for determining whether or not an abnormality is present in the register value in a register in the digital circuit and a second decision unit (22) for determining whether or not the level of the drive control signal is the level corresponding to the output from the logic circuit.
-
Patent Agency Ranking
公开(公告)号：US20190212365A1
公开(公告)日：2019-07-11
申请号：US16323801
申请日：2017-08-08
Applicant: SEKISUI CHEMICAL CO., LTD.
Inventor： Masao SASADAIRA , Xiaoge WANG
IPC: G01R1/073
Abstract: Provided is a conduction inspection device member, wherein cracks and voids are less likely to form in conductive parts, conduction performance is less likely to be impaired even when a conduction test is repeated, and contact marks are less likely to remain in the portion of the member in contact with a member to be tested. Also provided is a conduction inspection device comprising the conduction inspection device member. The conduction inspection device member comprises a substrate 13, through holes 11, and conductive parts 12. The multiple through holes 11 are arranged in the substrate 13, the conductive parts 12 are housed inside the through holes 11, and the conductive parts 12 contain conductive particles 2. The conductive particles 2 each comprise a substrate particle 21 and a conductive layer 22 on the surface of the substrate particle 21. The conductive layer 22 has multiple protrusions 23 on the outer surface thereof.
-
公开(公告)号：US20190064244A1
公开(公告)日：2019-02-28
申请号：US15795259
申请日：2017-10-27
Inventor： WEN-RU HE
CPC classification number: G01R31/025 , A43B3/001 , G01R27/18 , G01R31/024 , G01R31/28 , G08B21/182 , G08B21/185
Abstract: A method for detecting an electrical leakage includes acquiring a voltage of a source of the electrical leakage detected by a voltage detector of a shoe when a walking user is wearing the shoe on a wet ground, and acquiring electromagnetic field strength between the source of the electrical leakage and the shoe, by a first induced circuit of the shoe. A distance between the shoe and the source of the electrical leakage is acquired and the voltage and distance sent to a mobile device as representing a danger when the voltage of the source of the electrical leakage is greater than the predetermined voltage.
-
8.发明申请公开(公告)号：US20180276470A1
公开(公告)日：2018-09-27
申请号：US15466957
申请日：2017-03-23
Applicant: Rohde & Schwarz GmbH & Co. KG
Inventor： Philip DIEGMANN
CPC classification number: G06K9/00671 , G01R1/025 , G01R1/067 , G01R13/02 , G01R19/2516 , G01R31/28 , G06F3/14 , G06F3/167 , G06K7/1413 , G06K7/146 , G06T11/206 , G06T11/60 , H04W4/02 , H04W88/02
Abstract: A measuring system comprises a measuring device for measuring data with respect to a measurement setup comprising circuits with the aid of a probe, and at least one mobile device wirelessly connected to the measuring device, wherein the at least one mobile device displays a live view of the measurement setup superimposed on at least one measurement result of the measuring device.
-
公开(公告)号：US10073133B2
公开(公告)日：2018-09-11
申请号：US15482273
申请日：2017-04-07
Applicant: Infineon Technologies AG
Inventor： Michael Leutschacher , Walter Slamnig
CPC classification number: G01R31/28 , G01R1/06711 , G01R1/07307 , G01R31/2879 , G01R31/31924 , H02H9/04 , H02H9/045 , H02M3/04
Abstract: An electronic device for testing of semiconductor components with test needles includes an electric power source, a plurality of test needles connected with the electric power source, a plurality of electric circuits, each one of the electric circuits connected upstream of one of the test needles, each one of the electric circuits including at least one circuit component which has low resistance in a range of electric currents and has high resistance above a given limit electric current, a control voltage source connected with each one of the electric circuits, and two DC/DC converter circuits connected between the control voltage source and the electric circuits.
-
公开(公告)号：US20180231591A1
公开(公告)日：2018-08-16
申请号：US15952611
申请日：2018-04-13
Applicant: Tyco Electronics (Shanghai) Co. Ltd.
Inventor： Minjie Chen , Mingjie Fan
IPC: G01R19/175 , G01R31/28
CPC classification number: G01R19/175 , G01R21/133 , G01R31/28
Abstract: An alternating current load detection circuit comprises a first resistor connected in parallel to a load circuit, a diode full bridge circuit connected in series to the load circuit, a filter capacitor connected in parallel to the diode full bridge circuit, a second resistor, and a photoelectric coupler connected in series to the diode full bridge circuit. The photoelectric coupler and the diode full bridge circuit are connected in parallel to the second resistor. The diode full bridge circuit includes a first diode, a second diode having a positive electrode electrically connected to a negative electrode of the first diode, a third diode having a negative electrode electrically connected to a positive electrode of the first diode, and a fourth diode having a positive electrode electrically connected to a negative electrode of the second diode and a negative electrode electrically connected to a positive electrode of the third diode.
-
-
-
-
-
-
-
-
-
Search Results
506
records
(took 0.018 seconds)
