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    High Bandwidth Oscilloscope
    1.
    发明申请
    High Bandwidth Oscilloscope 审中-公开

    公开(公告)号：US20190115930A1

    公开(公告)日：2019-04-18

    申请号：US16162472

    申请日：2018-10-17

    Applicant: Teledyne LeCroy, Inc.

    Inventor： Peter J. Pupalaikis ,  David C. Graef

    IPC: H03M1/12 ,  G01R13/02 ,  G01R19/25 ,  H03M1/60

    CPC classification number: H03M1/121 ,  G01R13/02 ,  G01R13/0272 ,  G01R19/25 ,  G06F17/40 ,  G06F19/00 ,  H03M1/60 ,  H05K999/99

    Abstract: An oscilloscope comprises a first channel that includes a first channel physical input adapted to receive a first input signal, and a first channel digitizer connectable to the first channel physical input. The oscilloscope comprises a second channel that includes a second channel physical input adapted to receive a second input signal, and a second channel digitizer connected to the second channel physical input. The oscilloscope comprises a switch to change the first channel digitizer from connecting to the first channel physical input, to connecting to the second channel physical input. The oscilloscope includes a combiner to combine an output of the first channel digitizer and an output of the second channel digitizer, when a high bandwidth mode is activated, to generate an output that has a bandwidth of frequency content that exceeds a bandwidth of the first digitizer and exceeds a bandwidth of the second channel digitizer.

    SYSTEM AND METHOD FOR SIGNAL ANALYSIS
    2.
    发明申请
    SYSTEM AND METHOD FOR SIGNAL ANALYSIS 审中-公开

    公开(公告)号：US20190026551A1

    公开(公告)日：2019-01-24

    申请号：US15901978

    申请日：2018-02-22

    Applicant: Tata Consultancy Services Limited

    Inventor： Snehasis BANERJEE ,  Swarnava DEY ,  Arijit MUKHERJEE ,  Swagata BISWAS

    IPC: G06K9/00 ,  G01R13/02

    CPC classification number: G06K9/00503 ,  G01R13/02 ,  G06F17/148 ,  G06K9/00536 ,  G06N3/0454 ,  G06N3/08

    Abstract: Signal analysis is applied in various industries and medical field. In signal analysis, wavelet analysis plays an important role. The wavelet analysis needs to identify a mother wavelet associated with an input signal. However, identifying the mother wavelet associated with the input signal in an automatic way is challenging. Systems and methods of the present disclosure provides signal analysis with automatic selection of wavelets associated with the input signal. The method provided in the present disclosure receives the input signal and a set of parameters associated with the signal. Further, the input signal is analyzed converted into waveform. The waveforms are analyzed to provide image units. Further, the image units are processed by a plurality of deep architectures. The deep architectures provides a set of comparison scores and a matching wavelet family is determined by utilizing the set of comparison scores.

    LOGIC ANALYZER AND PROBE THEREOF
    3.
    发明申请
    LOGIC ANALYZER AND PROBE THEREOF 审中-公开

    公开(公告)号：US20180120377A1

    公开(公告)日：2018-05-03

    申请号：US15326440

    申请日：2015-05-18

    Applicant: ZEROPLUS TECHNOLOGY CO., LTD.

    Inventor： CHIU-HAO CHENG

    IPC: G01R31/3177 ,  G01R31/319 ,  G01R31/3183 ,  G01R31/28

    CPC classification number: G01R31/3177 ,  G01R1/06788 ,  G01R13/02 ,  G01R31/2808 ,  G01R31/318314 ,  G01R31/31905

    Abstract: A logic analyzer includes a probe, a first transmission line, a display, a second transmission line, and a processing unit. The probe is adapted to abut against a DUT to retrieve digital signals therefrom. The first transmission line is electrically connected to the probe. The display is provided on the probe. The second transmission line is electrically connected to the display. The processing unit is electrically connected to the first transmission line and the second transmission line, and is adapted to be electrically connected to a computer. The digital signal retrieved by the probe would be transmitted to the processing unit through the first transmission line to be analyzed therein. After completing the analysis, an analysis result would be transmitted to the computer for display. Meanwhile, a part of the analysis result is transmitted to the display through the second transmission line to be displayed thereon.

    Apparatus and method for performing burst triggering in a test and measurement instrument
    4.
    发明授权
    Apparatus and method for performing burst triggering in a test and measurement instrument 有权

    公开(公告)号：US09934355B2

    公开(公告)日：2018-04-03

    申请号：US13861998

    申请日：2013-04-12

    Applicant: Tektronix, Inc.

    Inventor： Patrick A. Smith ,  David L. Kelly ,  Que T. Tran ,  Shane A. Hazzard

    IPC: G01R13/02 ,  G06F19/00 ,  G01R31/02

    CPC classification number: G06F19/00 ,  G01R13/02 ,  G01R13/0254 ,  G01R31/02

    Abstract: A test and measurement apparatus, system, and method for synchronizing an acquisition or triggering system to a specific burst of interest. The subject apparatus and method triggers on varying energy content of a signal qualified by time in the presence of high-frequency input signal bursts, by using an adjustable pulse width envelope detector, disposed in the signal path of the trigger circuitry, as a digital rectifier or to otherwise process and extract an envelope signal. An RF envelope probe having an analog envelope detector among other suitable components is disclosed. A method is implemented for isolating an interval of interest in a signal under test. An envelope detector circuit produces an envelope signal from the signal. Trigger circuitry receives the envelope signal from the envelope detector, and isolates the interval of interesting in the signal under test using the envelope signal.

    Asynchronous on-die eye scope
    5.
    发明授权
    Asynchronous on-die eye scope 有权

    公开(公告)号：US09922248B2

    公开(公告)日：2018-03-20

    申请号：US14865401

    申请日：2015-09-25

    Applicant: Intel Corporation

    Inventor： Mingming Xu ,  Stefano Giaconi ,  Wei Wang

    IPC: H04L27/14 ,  G06K9/00 ,  G01R13/02

    CPC classification number: G06K9/0053 ,  G01R13/02 ,  G06K9/00503 ,  G06K9/00557 ,  G06K9/00604

    Abstract: Some embodiments include apparatuses and methods having a receiver unit included in a die and a measurement unit included in the die. The receiver unit includes a sampler to sample a first signal based on timing of a first clock signal to generate a second signal. The measurement unit is arranged to sample the first signal based on timing of a second clock signal to provide information for generation of a graph presenting an eye scan of the first signal. The second clock signal has a frequency asynchronous with a frequency of the first clock signal.

    HIGH BANDWIDTH OSCILLOSCOPE
    6.
    发明申请
    HIGH BANDWIDTH OSCILLOSCOPE 审中-公开

    公开(公告)号：US20170250700A1

    公开(公告)日：2017-08-31

    申请号：US15596045

    申请日：2017-05-16

    Applicant: Teledyne LeCroy, Inc.

    Inventor： Peter J. Pupalaikis ,  David C. Graef

    IPC: H03M1/12 ,  G01R13/02

    CPC classification number: H03M1/121 ,  G01R13/02 ,  G01R13/0272 ,  G01R19/25 ,  G06F17/40 ,  G06F19/00 ,  H03M1/60

    Abstract: A method for improving bandwidth of an oscilloscope involves, in preferred embodiments, the use of frequency up-conversion and down-conversion techniques. In an illustrative embodiment the technique involves separating an input signal into a high frequency content and a low frequency content, down-converting the high frequency content in the analog domain so that it may be processed by the oscilloscope's analog front end, digitizing the low frequency content and the down-converted high frequency content, and forming a digital representation of the received analog signal from the digitized low frequency content and high frequency content.

    CONTOUR GENERATION OF PROMPTED DATA SIGNAL
    8.
    发明申请
    CONTOUR GENERATION OF PROMPTED DATA SIGNAL 审中-公开

    公开(公告)号：US20170089953A1

    公开(公告)日：2017-03-30

    申请号：US14866510

    申请日：2015-09-25

    Applicant: Microsoft Technology Licensing, LLC

    Inventor： Darryl Robert Liang ,  Jeffrey J. Halnon ,  Gary F. Grimm, JR.

    IPC: G01R13/02 ,  H04N17/04

    CPC classification number: G01R31/3167 ,  G01R13/02 ,  G01R31/3016 ,  G01R31/31711 ,  G06F11/267 ,  H04N17/004 ,  H04N17/045

    Abstract: The testing of a received data signal accessed from a device under test. Communication circuitry first generates an instruction that causes the device under to emit the data signal towards quality parameter contour generation circuitry. The contour generation circuitry is then configured to generate quality parameter (e.g., bit error ratio) contour of the data signal, which is then received at the contour generation circuitry. The generated contour map may then be evaluated to diagnose the performance of the device under test in emitting the data signal. For instance, each device under test may be evaluated after manufacture. The quality parameter contour generation circuitry may be embedded within an electronic device, such as a consumer electronic device. A diagnostic component within the electronic device is configured to use the quality parameter contour generated by the contour generation circuitry to self-test the device.

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