Abstract:
Aspects of the present disclosure provide a gimbal assembly test system including: a protective cover affixed to a test surface of a wafer probe card mounted within a gimbal bearing, wherein the protective cover includes an exterior surface oriented outward from the test surface of the wafer probe card; and a recess extending into the exterior surface of the protective cover and shaped to matingly engage a load cell tip therein.
Abstract:
A testing kit for luminaire lamps includes a shorting cap that is to be substituted for a photoelectric sensing device to test its operability, and a luminaire lamp testing instrument that is to be used while the shorting cap is in place for testing the operation of the starter and the ballast associated with the luminaire. The shorting cap includes a plurality of equidistantly distributed indicating lights to enable the user to see one of them from any angle, a built-in circuit breaker that trips when there is a short circuit downstream from the photoelectric sensing device, and a pair of jacks for connecting a voltmeter thereto. The luminaire lamp testing instrument has an evaluation circuitry that determines whether or not the starter or the ballast function properly and causes either one of two lights, depending on the design wattage of the luminaire lamp, to issue visually distinguishable signals indicative of proper operation of the starter and the ballast, respectively.
Abstract:
A method for producing an arc detection signal on the basis of a plurality of observation signals comprises producing an arc detection part-signal for each of at least two observation signals. Producing each of the part-signals includes correlating the respective observation signal with a correlation signal by influencing the correlation signal with the respective observation, thereby producing a correlation result; producing or modifying a coefficient on the basis of the correlation result; and weighting the respective observation signal with the coefficient. The arc detection part-signals are added to form the arc detection signal.
Abstract:
A combination lighting tester tool. The combination lighting tester tool includes at least three independent testing tools for identifying and diagnosing a problem in a lighting system. For example, the tester includes a lamp testing function in which a high voltage test signal is generated and transmitted using an antenna. When the test signal is in proximity to a gas filled lamp, the voltage is of sufficient magnitude to ionize the gas inside the lamp, causing the lamp to illuminate. The tester also includes a ballast testing function in which the power lines or wires connecting a ballast to a lamp or lighting fixture are tested, and a filament tester for testing the filaments in a lamp for continuity or resistance. The tester also includes a worklight for illuminating an area under test and one or more display devices (e.g., LEDs, an LCD display, or the like) which provide an indication of, for example, a test being performed or a result of a test.
Abstract:
A level shift IC (3b) of a power supply/shutoff section (3) is operable, when a shutoff signal (Sa) is input from a timer circuit (8) for a time T during an ON state of a discharge lamp (7), to turn off a MOSFET (3a) so as to shut off power supply to a smoothing capacitor (4). When a detection signal (Sb) of a capacitor voltage is lowered to a value less than a reference voltage Vr1 during input of the shutoff signal (Sa), an output of a comparator (10) is changed from an H level to an L level in an inverted manner. In conjunction with this change, respective outputs of an auxiliary control circuit (12) and a NOT element (12a, 12b) are changed from an L level to an H level in an inverted manner. As a result, a current flows from the NOT element (12a) to an LED (13b) through a resistor (13a) to turn on the LED (13b). Thus, a life end of the smoothing capacitor 4 is annunciated, and a main control circuit (6) is operable to suppress an output of an inverter main circuit (5).
Abstract:
A simulated load circuit for measuring the impedance of the arc discharge of an electrodeless discharge lamp of the type having an arc tube and an excitation coil for exciting the arc discharge in an ionizable fill contained therein includes: a secondary coil spaced apart from the excitation coil by a distance which is varied in order to vary the coupling coefficient between the secondary coil and the excitation coil; a fixed load resistance coupled to the secondary coil; and a variable matching network coupled in series or parallel with the load resistance, the impedance of the matching network being varied in order to vary the ratio of reactance to resistance of the load circuit. The distance between the secondary coil and the excitation coil is varied, and the impedance of the matching network is varied, until the input impedance of the load circuit is substantially equivalent to the operating impedance of the lamp. The simulated load circuit is useful for designing and testing ballast circuits for electrodeless discharge lamps and for providing measurements of arc discharge power and excitation coil efficiency.