SYSTEM AND METHOD FOR RAILROAD SMART FLASHER LAMPS

    公开(公告)号:US20240237172A1

    公开(公告)日:2024-07-11

    申请号:US18616034

    申请日:2024-03-25

    摘要: A smart lamp system and method for monitoring a status of LEDs. The system can provide LED status monitoring using a logic controller communicating with at least one strip of LEDs. The system can utilize the logic controller to assign a unique identifier (ID) to the at least one strip of LEDs based on a physical position of a plurality of dual-inline package (DIP) switches incorporated within a smart lamp housing. The system can provide a hardware architecture to interface the logic controller with a power-line communication (PLC) transceiver. The system can establish a communication protocol between the PLC transceiver and a PLC receiver to efficiently communicate the statuses of the LEDs. The logic controller can generate a payload including a binary representation of the unique ID of the smart lamp and the statuses of the LEDs and transmit the payload to the PLC transceiver.

    Transistor bridge failure test
    4.
    发明授权

    公开(公告)号:US11686781B2

    公开(公告)日:2023-06-27

    申请号:US16932435

    申请日:2020-07-17

    摘要: A driver circuit arrangement for driving a transistor bridge, which includes at least a first half-bridge composed of a low-side transistor and a high-side transistor, is described herein. In accordance with one example of the description, the circuit includes a current source and a detection circuit. The current source is operably coupled to the high-side transistor of the first half-bridge and configured to supply a test current to the first half bridge. The detection circuit is configured to compare a voltage sense signal, which represents the voltage across the high-side transistor of the first half-bridge, with at least one first threshold to detect, dependent on the result of this comparison, whether a short-circuit is present in the first half-bridge.

    Manufacturing of light emitting modules

    公开(公告)号:US11649951B1

    公开(公告)日:2023-05-16

    申请号:US17540797

    申请日:2021-12-02

    摘要: The present disclosure relates to a method of manufacturing a tamper proof light emitting module comprising the steps of (a) pre-assembling the light emitting module into a testing configuration including a housing and one or more light emitting elements mounted within the housing, the housing including first and second housing components connected together using at least one removable fastener connecting the first and second housing components; (b) testing the light emitting module to confirm the light emitting elements are operable; (c) after step (b), removing the removable fastener; (d) replacing the removable fastener removed in step (c) with at least one breakaway fastener; and (e) tightening the breakaway fastener(s) until the head of the breakaway fastener(s) breaks off so that the breakaway fastener(s) is no longer removable, thereby creating a final, tamper proof configuration of the light emitting module.

    CIRCUIT ASSEMBLY AND METHOD FOR MONITORING A MICRO-CONTROLLER BASED ON A WATCHDOG VOLTAGE

    公开(公告)号:US20180314245A1

    公开(公告)日:2018-11-01

    申请号:US15769613

    申请日:2016-10-18

    IPC分类号: G05B23/02 G01R31/317

    摘要: A circuit assembly for monitoring the timing behavior of a microcontroller, including: a microcontroller to drive at least one watchdog voltage generating section for a temporally defined generation of at least one monitoring voltage and to detect and read in the generated monitoring voltage at a predetermined sampling point in time; in which the at least one watchdog voltage generating section is arranged to generate the monitoring voltage that is detectable at a predetermined sampling point in time by sampling by the microcontroller, in which a monitoring voltage that is detected at the sampling point in time and lies within a predetermined voltage tolerance range indicates a fault-free microcontroller state, and a monitoring voltage that is detected at the predetermined point in time and lies outside the predetermined voltage tolerance range indicates a faulty microcontroller state. Also described is a related method.