DETECTION DEVICE AND DETECTION METHOD

    公开(公告)号:US20250060401A1

    公开(公告)日:2025-02-20

    申请号:US18725174

    申请日:2022-10-11

    Abstract: A detection device includes a signal output unit configured to output a 1-bit first digital signal representing a waveform of a predetermined pattern or a signal based on the first digital signal to a transmission line as a measurement signal, a signal reception unit configured to receive a response signal including a signal reflecting the measurement signal from the transmission line and convert the response signal into a 1-bit second digital signal, an operation unit configured to perform a logical operation of the second digital signal converted by the signal reception unit and a 1-bit third digital signal based on the predetermined pattern, and a detection unit configured to detect an abnormality of the transmission line, based on an operation result obtained by the operation unit.

    ENHANCED RESOLUTION TIME-DOMAIN REFLECTOMETRY

    公开(公告)号:US20240426893A1

    公开(公告)日:2024-12-26

    申请号:US18341047

    申请日:2023-06-26

    Abstract: Computer-implemented methods for performing enhanced resolution time-domain reflectometry are provided. Aspects include obtaining a plurality of waveforms by transmitting a first pulse on a transmission line, transmitting a second pulse on the transmission line, where the second pulse is transmitted after the first pulse by a delay, and capturing and measuring reflections of the transmitted pulses, wherein the delay corresponding to each of the plurality of waveforms is different. Aspects also include identifying a discontinuity of the transmission line based at least in part on the plurality of waveforms. Based on a determination that the transmission line includes the discontinuity, aspects include calculating third derivative curves for each of the plurality of waveforms and calculating a length of the discontinuity of the transmission line based on the third derivative curves. Aspects also include creating a notification indicating a location and the length of the discontinuity of the transmission line.

    Real-equivalent-time oscilloscope with time domain reflectometer

    公开(公告)号:US11898927B2

    公开(公告)日:2024-02-13

    申请号:US17735025

    申请日:2022-05-02

    Inventor: Kan Tan

    CPC classification number: G01M11/3118 G01M11/3145 G01R27/06

    Abstract: A test and measurement device includes one or more ports configured to connect to a device under test (DUT), a time domain reflectometry (TDR) source configured receive a source control signal and to produce an incident signal to be applied to the DUT, one or more analog-to-digital converters (ADC) configured to receive a sample clock and sample the incident signal from the TDR source and a time domain reflection (TDR) signal or a time domain transmission (TDT) signal from the DUT to produce an incident waveform and a TDR/TDT waveform, one or more processors configured to execute code to cause the one or more processors to: control a clock synthesizer to produce the sample clock and the source control signal, and use a period of the TDR source, a period of the sample clock, and the number of samples to determine time locations for samples in the incident waveform and the TDR/TDT waveform, and a display configured to display the incident waveform and the TDR/TDT waveform. A method of sampling a waveform using a real-equivalent-time oscilloscope having a time domain reflectometry source, comprising: controlling a clock synthesizer to produce a sample clock and a source control signal; using a time domain reflectometry (TDR) source to receive the source control signal and to produce an incident signal to be applied to a device under test (DUT); receiving the sample clock at one or more analog-to-digital converters (ADC) and sampling the incident signal from the TDR source and a TDR/TDT signal from the DUT to produce an incident waveform and a TDR/TDT waveform; determining time locations for samples in the incident waveform and the TDR/TDT waveform, using a period of the TDR source, a period of the sample clock, and a number of samples; and displaying the incident waveform and the TDR/TDT waveform.

    Fault location system
    8.
    发明授权

    公开(公告)号:US11815541B2

    公开(公告)日:2023-11-14

    申请号:US17670024

    申请日:2022-02-11

    Applicant: POMA

    CPC classification number: G01R31/11 G01R31/085 G01R31/088 G01R31/2812

    Abstract: A fault location system in a cable transport installation comprises a safety unit (10) and an end module (13) connected by an electrical safety line (11). The safety line (11) comprises a plurality of cable fault contacts (14) of the normally-closed type connected in series. The location system includes a plurality of location modules (20) distributed along the transport installation, each of which comprising a first test contact (21), of the normally-open type, for short-circuiting the safety line (11). Once a fault coming from one of the cable fault contacts (14) is detected, each location module (20) is capable of selectively closing its first test contact (21) so as to be able to locate said faulty contact (14) on the safety line.

    Test system
    9.
    发明授权

    公开(公告)号:US11726136B2

    公开(公告)日:2023-08-15

    申请号:US17495399

    申请日:2021-10-06

    CPC classification number: G01R31/28 G01R31/11 G01R31/2822 G01R31/308

    Abstract: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from the pulsed source; a second photoconductive element configured to receive a pulse; and a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element. At least one of the first and second photoconductive elements is provided on a different substrate to that of the transmission line arrangement.

    BUS AUTHENTICATION AND ANTI-PROBING ARCHITECTURE

    公开(公告)号:US20230050241A1

    公开(公告)日:2023-02-16

    申请号:US17795997

    申请日:2021-01-29

    Abstract: Method and apparatus for detecting in impedance change in a transmission line, such as a line in a computer bus. A CMOS-compatible time domain reflectometer circuit comprising a comparator is embedded in one or more chips and connected to the transmission line. The circuit measures the impedance inhomogeneity pattern (IIP) of the transmission line prior to use, and then repeatedly measures the HP during operation of the transmission line to detect a change in IIP, without Interfering with data transfer through the transmission line. The present invention can detect and locate wire-tapping magnetic probing or snooping, and Trojan and cold boot attacks on interconnecting buses between computer chips or integrated circuits in a computer system, such as on external memory buses.

Patent Agency Ranking