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    X-ray fluorescence spectrometer
    2.
    发明授权
    X-ray fluorescence spectrometer 有权

    公开(公告)号：US11656190B2

    公开(公告)日：2023-05-23

    申请号：US17790384

    申请日：2021-09-10

    申请人： RIGAKU CORPORATION

    发明人： Shinya Hara ,  Yasujiro Yamada ,  Hisashi Homma

    IPC分类号： G01N23/223

    CPC分类号： G01N23/223 ,  G01N2223/61 ,  G01N2223/633

    摘要： An X-ray fluorescence spectrometer of the present invention includes: a determination module (21) configured to determine, with respect to every one of measurement lines that correspond to secondary X-rays having intensities to be measured, whether or not a ratio of a theoretical intensity in thin film calculated on the basis of an assumed thickness and known contents of respective components to a theoretical intensity in bulk calculated on the basis of the known contents of the respective components exceeds a predetermined threshold; and a saturation thickness quantification module (23) configured to, according to a positive determination by the determination module (21), calculate a saturation thickness with respect to each of the measurement lines, at which the theoretical intensity saturates, on the basis of the known contents of the respective components and to adopt a largest saturation thickness as a quantitative value of a thickness.

    Method for measuring the mass thickness of a target sample for electron microscopy
    3.
    发明授权
    Method for measuring the mass thickness of a target sample for electron microscopy 有权

    公开(公告)号：US10054557B2

    公开(公告)日：2018-08-21

    申请号：US15329902

    申请日：2015-07-29

    申请人： Oxford Instruments Nanotechnology Tools Limited

    发明人： Peter Statham

    IPC分类号： H01J37/26 ,  G01N23/2252

    CPC分类号： G01N23/2252 ,  G01N2223/304 ,  G01N2223/633 ,  H01J37/261 ,  H01J2237/24578

    摘要： A method is provided of measuring the mass thickness of a target sample for use in electron microscopy. Reference data are obtained which is representative of the X-rays (28) generated within a reference sample (12) when a particle beam (7) is caused to impinge upon a region (14) of the reference sample (12). The region (14) is of a predetermined thickness of less than 300 nm and has a predetermined composition. The particle beam (7) is caused to impinge upon a region (18) of the target sample (16). The resulting X-rays (29) generated within the target sample (16) are monitored (27) so as to produce monitored data. Output data are then calculated based upon the monitored data and the reference data, the output data including the mass thickness of the region (18) of the target sample (16).

    Method for the measurement of a measurement object by means of X-ray fluorescence
    4.
    发明授权
    Method for the measurement of a measurement object by means of X-ray fluorescence 有权

    公开(公告)号：US09885676B2

    公开(公告)日：2018-02-06

    申请号：US14634979

    申请日：2015-03-02

    申请人： Helmut Fischer GmbH Institut fur Elektronik und Messtechnik

    发明人： Volker Roessiger

    IPC分类号： G01N23/223 ,  G01B15/02

    CPC分类号： G01N23/223 ,  G01B15/02 ,  G01N2223/076 ,  G01N2223/6113 ,  G01N2223/633

    摘要： A method for measurement of the thickness of thin layers or determination of an element concentration of a measurement object. A primary beam is directed from an X-ray radiation source onto the measurement object. A secondary radiation emitted by the measurement object is detected by a detector and is relayed to an evaluation device. The primary beam is moved within a grid surface which is divided into grid partial surfaces as well as subdivided into at least one line and at least one column. For each grid partial surface a primary beam is directed onto the grid surface. A measuring spot of the primary beam fills at least the grid point. A lateral dimension of the measurement surface is detected and compared to the size of the measuring spot of the primary beam appearing on the measurement object, for size determination of the measurement surface of the measurement object.

    USING 3D COMPUTED TOMOGRAPHY TO ANALYZE SHAPED CHARGE EXPLOSIVES
    5.
    发明申请
    USING 3D COMPUTED TOMOGRAPHY TO ANALYZE SHAPED CHARGE EXPLOSIVES 有权
    使用3D计算机图形分析形状的电荷爆炸

    公开(公告)号：US20160370305A1

    公开(公告)日：2016-12-22

    申请号：US14901772

    申请日：2015-05-13

    申请人： HALLIBURTON ENERGY SERVICES, INC.

    发明人： John Norris Smith ,  Patrick William Powell ,  Corbin Sean Glenn

    IPC分类号： G01N23/04 ,  G01N33/22

    CPC分类号： G01N23/046 ,  G01N33/222 ,  G01N2223/302 ,  G01N2223/303 ,  G01N2223/419 ,  G01N2223/616 ,  G01N2223/633 ,  G01V5/08 ,  G01V13/00

    摘要： A method may include positioning at least one calibration disk in a computed tomography (CT) scanner and positioning a pellet in the CT scanner. The at least one calibration disk and the pellet may both be made of a same powder exhibiting a known density. The method may further include scanning the at least one calibration disk and the pellet using the CT scanner to obtain one or more CT images of the pellet and the at least one calibration disk, and comparing a density of the pellet with the known density of the at least one calibration disk based on the one or more CT images.

    摘要翻译： 一种方法可以包括将计算机断层摄影（CT）扫描器中的至少一个校准盘定位并将颗粒定位在CT扫描器中。 至少一个校准盘和颗粒都可以由表现出已知密度的相同粉末制成。 该方法还可以包括使用CT扫描器扫描至少一个校准盘和颗粒，以获得颗粒和至少一个校准盘的一个或多个CT图像，并将颗粒的密度与已知密度的 基于所述一个或多个CT图像的至少一个校准盘。

    Method and device for performing an x-ray fluorescence analysis
    6.
    发明授权
    Method and device for performing an x-ray fluorescence analysis 有权
    用于进行X射线荧光分析的方法和装置

    公开(公告)号：US09513238B2

    公开(公告)日：2016-12-06

    申请号：US14648264

    申请日：2013-10-22

    申请人： Helmut Fischer GmbH Institut fur Elektronik und Messtechnik

    发明人： Jens Kessler

    IPC分类号： G01N23/223

    CPC分类号： G01N23/223 ,  G01N2223/076 ,  G01N2223/313 ,  G01N2223/61 ,  G01N2223/633

    摘要： The invention relates to a method for performing an x-ray fluorescence analysis, in which method a primary radiation (16) is directed at a specimen (12) by an x-radiation source (14) and in which method a secondary radiation (18) emitted by the specimen (12) is detected by a detector (20) and evaluated by means of an evaluating unit (21), wherein at least one filter (23) having at least one filter layer (25) forming a filter plane is brought into the beam path of the secondary radiation (18) and acts as a band-pass filter in dependence on an angle α of the filter layer (25) to the secondary radiation (18) and an interfering wavelength of the secondary radiation (18) is coupled out by Bragg reflection, the angle α of the filter layer (25) of the filter (23) is set by means of a setting apparatus (31) to reflect at least one interfering wavelength of the secondary radiation (18) by Bragg reflection, and the coupled-out wavelength of the secondary radiation (18) is detected by a second detector (32) and the signals determined therefrom are forwarded to the evaluating unit (21).

    摘要翻译： 本发明涉及一种用于进行X射线荧光分析的方法，其中主辐射（16）通过x辐射源（14）指向样本（12），并且在该方法中，辅助辐射（18） ）由检测器（20）检测并通过评估单元（21）进行评估，其中至少一个具有至少一个形成过滤器平面的过滤层（25）的过滤器（23）是 进入次级辐射（18）的光束路径，并且根据过滤层（25）与次级辐射（18）的角度α和次级辐射（18）的干涉波长而作为带通滤波器 ）通过布拉格反射耦合出来，滤波器（23）的滤波器层（25）的角度α通过设定装置（31）设定，以将二次辐射（18）的至少一个干涉波长反射到 二次辐射（18）的布拉格反射和耦合输出波长被检测 检测器（32）和从其确定的信号被转发到评估单元（21）。

    METHOD OF MEASURING THICKNESS OF Fe-Zn ALLOY PHASE OF GALVANNEALED STEEL SHEET AND APPARATUS FOR MEASURING THE SAME
    8.
    发明申请
    METHOD OF MEASURING THICKNESS OF Fe-Zn ALLOY PHASE OF GALVANNEALED STEEL SHEET AND APPARATUS FOR MEASURING THE SAME 有权
    测量钢铁薄板的Fe-Zn合金相厚度的方法及其测量装置

    公开(公告)号：US20150055756A1

    公开(公告)日：2015-02-26

    申请号：US14380441

    申请日：2013-04-25

    申请人： Nippon Steel & Sumitomo Metal Corporation

    发明人： Makoto Nakazawa

    IPC分类号： G01N23/207 ,  G01B15/02

    CPC分类号： G01N23/207 ,  C23C2/06 ,  C23C2/28 ,  G01B15/02 ,  G01N2223/605 ,  G01N2223/633

    摘要： A method of measuring a thickness of a Fe—Zn alloy phase included in the Fe—Zn alloy coating of the galvannealed steel sheet includes: an X-ray irradiation process of irradiating the galvannealed steel sheet with the incident X-rays; and an X-ray detection process of detecting the diffracted X-rays obtained in the X-ray irradiation process, derived from a Γ·Γ1 phase, a δ1 phase, and a ζ phase included in the Fe—Zn alloy coating with a crystal lattice spacing d of 1.5 Å or higher.

    摘要翻译： 测定合金化热镀锌钢板的Fe-Zn合金涂层中所含的Fe-Zn合金相的厚度的方法包括：对入射的X射线照射合金化热浸镀锌钢板的X射线照射工序; 以及X射线检测处理，其检测从X射线照射处理得到的衍射X射线，衍射自Fe-Zn合金涂层中包含的＆Ggr。·Ggr; 1相，δ1相和ζ相 晶格间距d为1.5或更高。