公开(公告)号：US12080858B2

公开(公告)日：2024-09-03

申请号：US17637982

申请日：2020-03-30

申请人： RIGAKU CORPORATION

发明人： Koichiro Ito ,  Suguru Sasaki

IPC分类号： G01N23/207 ,  G01N23/20041 ,  H01M10/42 ,  H01M10/0525

CPC分类号： H01M10/4285 ,  G01N23/20041 ,  G01N23/207 ,  H01M10/0525

摘要： A structure for battery analysis of the present invention includes a pressurizing unit (30) having a pressurizing mechanism, and a pressure receiving unit (10) for receiving pressure acting on a sample battery (S), and pressurizes the sample battery (S) accommodated in a hollow portion of a battery accommodation unit (20) between the pressurizing unit (30) and the pressure receiving unit (10) to suppress expansion and contraction of the sample battery (S).

公开(公告)号：US12031927B2

公开(公告)日：2024-07-09

申请号：US17546656

申请日：2021-12-09

申请人： Rigaku Corporation

发明人： Hideo Toraya

IPC分类号： G01N23/2055

CPC分类号： G01N23/2055 ,  G01N2223/605

摘要： Provided is a method of analyzing a diffraction pattern of a mixture, the method including: a first step of fitting, through use of a fitting pattern including a term obtained by multiplying a known target pattern indicating a target component by a first intensity ratio, and a term obtained by multiplying an unknown pattern indicating a residual group consisting of one or more residual components by a second intensity ratio, and having the first intensity ratio, the second intensity ratio, and the unknown pattern as fitting parameters, the fitting pattern to the observed pattern by changing the first and the second intensity ratio in a state where the unknown pattern is set to an initial pattern; and a second step of fitting the fitting pattern to the observed pattern by changing the unknown pattern while restricting the changes of the first and the second intensity ratio.

公开(公告)号：US20240167968A1

公开(公告)日：2024-05-23

申请号：US18283011

申请日：2021-12-10

申请人： Rigaku Corporation

发明人： Takuya KIKUCHI ,  Tetsuya OZAWA ,  Ryuji MATSUO

IPC分类号： G01N23/20025

CPC分类号： G01N23/20025

摘要： A pair of support sections arranged with a space for placing a sample, a frame supported by the pair of support sections, an irradiation section movably connected to the frame for irradiating radiation, and a detection section movably connected to the frame for detecting radiation scattered by the sample are comprised on a same plane, and the irradiation section and the detection section are movable on the same plane with respect to the frame. Thus, using a space formed between the pair of support sections, it is possible to measure a large sample in a wide range of diffraction angles. Therefore, it is easy to measure the diffraction of the low angle side. Further, since each part is movable on the same plane, it is easy to arrange the parts.

公开(公告)号：US20240133829A1

公开(公告)日：2024-04-25

申请号：US18379198

申请日：2023-10-12

申请人： Rigaku Corporation

发明人： Takumi OTA ,  Norihiro MUROYAMA ,  Akihiro HIMEDA

IPC分类号： G01N23/2055 ,  G01N23/207 ,  G06F17/16

CPC分类号： G01N23/2055 ,  G01N23/207 ,  G06F17/16

摘要： A processing apparatus, a system, a method and a program for applying non-negative matrix factorization to one or more measured profiles of X-ray powder diffraction based on known information are provided. A processing apparatus for applying non-negative matrix factorization to a measured profile of X-ray powder diffraction comprises a measured profile acquiring section for acquiring one or more measured profiles, a known information acquiring section for acquiring known information including a shape of a predetermined profile corresponding to a background or a predetermined substance included in the measured profile, or a restriction of a coefficient matrix of the predetermined profile, and a decomposition section for applying non-negative matrix factorization to the measured profile based on the known information.

公开(公告)号：US11942231B2

公开(公告)日：2024-03-26

申请号：US16950081

申请日：2020-11-17

申请人： RIGAKU CORPORATION

发明人： Koichiro Ito ,  Tetsuya Ozawa ,  Takeshi Ozawa

IPC分类号： G21F7/04 ,  G01N23/20016 ,  G01N23/20025 ,  G21F7/047 ,  G01N35/00

CPC分类号： G21F7/04 ,  G21F7/047 ,  G01N23/20016 ,  G01N23/20025 ,  G01N35/00 ,  G01N2035/00277

摘要： An airtight apparatus in which an airtight box (30) for measurement is combined with a glove box (20) is provided. The airtight box (30) for measurement includes a hollow housing (31), and a sample stage (34) having a sample loading portion. The sample stage (34) is transported by a transport stage (35) installed in the housing (31). The housing (31) is provided with a measurement window (40) for measuring a sample loaded on the sample stage (34) from the outside by a measurement apparatus (10).

公开(公告)号：US11913891B2

公开(公告)日：2024-02-27

申请号：US17482591

申请日：2021-09-23

申请人： RIGAKU CORPORATION

发明人： Koichiro Ito

IPC分类号： H01M10/05 ,  H01M10/48 ,  G01N23/20 ,  G01N23/20041 ,  H01M10/0562 ,  G01N23/2055 ,  G01N23/20033

CPC分类号： G01N23/20041 ,  G01N23/2055 ,  H01M10/0562 ,  H01M10/48 ,  G01N23/20033 ,  G01N2223/056 ,  G01N2223/1016 ,  G01N2223/307 ,  G01N2223/3106 ,  G01N2223/317 ,  Y02E60/10

摘要： A structure for pressurization analysis includes a sample accommodating unit (10) for accommodating an all-solid-state battery (S) therein, and a pressurizing unit (30) having a pressurizing mechanism for causing pressure to act on the all-solid-state battery (S). The all-solid-state battery (S) is pressurized inside the sample accommodating unit (10) while being sandwiched between a pressure receiving member (21) and a pressing member (22). Further, an X-ray window (14) is provided in an outer radial direction orthogonal to an acting direction of the pressure from the pressurizing unit (30), and reflection type X-ray diffraction measurement can be performed through the X-ray window (14).

公开(公告)号：US20240019385A1

公开(公告)日：2024-01-18

申请号：US18448939

申请日：2023-08-13

申请人： Rigaku Corporation

发明人： Takashi SATO

IPC分类号： G01N23/207 ,  G01N1/28 ,  G01N23/20025

CPC分类号： G01N23/207 ,  G01N1/28 ,  G01N23/20025

摘要： A user-friendly single-crystal X-ray structure analysis apparatus for quickly performing a single-crystal X-ray structure analysis using a crystalline sponge and easily making it possible by including managing related information and a method therefor, are provided. There are provided a sample holder comprising a porous complex crystal capable of soaking a sample in a plurality of fine pores formed therein; a goniometer that rotationally moves, the sample holder being attached to the goniometer; an information acquisition section 600 that acquires invariable information about the porous complex crystal or variable information provided after the sample is soaked therein; and an information storage section 111 that stores the invariable information or the variable information acquired by the information acquisition section 600.

公开(公告)号：US11874238B2

公开(公告)日：2024-01-16

申请号：US17295858

申请日：2019-11-21

申请人： Rigaku Corporation

发明人： Takashi Sato

IPC分类号： G01N23/207 ,  G01N23/20025

CPC分类号： G01N23/2076 ,  G01N23/20025 ,  G01N2223/1016

摘要： User-friendly single-crystal X-ray structure analysis apparatus and method for quickly performing a single-crystal X-ray structure analysis using a crystalline sponge and enabling the analysis including management of related information, and a sample holder and an applicator therefor are provided. There are provided a single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material is provided, the apparatus comprising a sample holder that comprises a porous complex crystal capable of soaking the sample in a plurality of fine pores formed therein and that holds the sample; a goniometer that rotationally moves with the sample holder 250 being attached; and an information acquisition section 600 that acquires information about the porous complex crystal.

公开(公告)号：US11874204B2

公开(公告)日：2024-01-16

申请号：US17295859

申请日：2019-11-21

申请人： Rigaku Corporation

发明人： Takashi Sato

IPC分类号： G01N1/28 ,  G01N23/207 ,  G01N23/20025

CPC分类号： G01N23/207 ,  G01N1/28 ,  G01N23/20025

摘要： A user-friendly single-crystal X-ray structure analysis apparatus for quickly performing a single-crystal X-ray structure analysis using a crystalline sponge and easily making it possible by including managing related information and a method therefor, are provided. There are provided a sample holder comprising a porous complex crystal capable of soaking a sample in a plurality of fine pores formed therein; a goniometer that rotationally moves, the sample holder being attached to the goniometer; an information acquisition section 600 that acquires invariable information about the porous complex crystal or variable information provided after the sample is soaked therein; and an information storage section 111 that stores the invariable information or the variable information acquired by the information acquisition section 600.

公开(公告)号：US11867646B2

公开(公告)日：2024-01-09

申请号：US18034886

申请日：2021-11-01

申请人： Rigaku Corporation

发明人： Makoto Kambe ,  Kazuhiko Omote ,  Toshifumi Higuchi ,  Tsutomu Tada ,  Hajime Fujimura ,  Masahiro Nonoguchi ,  Licai Jiang ,  Boris Verman ,  Yuriy Platonov

IPC分类号： G01N23/223

CPC分类号： G01N23/223

摘要： Provided is a total reflection X-ray fluorescence spectrometer which has high analysis sensitivity and analysis speed. The total reflection X-ray fluorescence spectrometer includes: an X-ray source that has an electron beam focal point having an effective width in a direction parallel to a surface of a sample, and orthogonal to an X-ray irradiation direction, that is larger than a dimension in the irradiation direction; a reflective optic that has an effective width in the orthogonal direction that is larger than that of the electron beam focal point, and has a curved surface in the irradiation direction; and a plurality of detectors that are arranged in a row in the orthogonal direction, and are configured to measure intensities of fluorescent X-rays emitted from the sample irradiated with primary X-rays focused by the reflective optic.