Apparatus, circuits and methods for clock generation

    公开(公告)号:US11139778B1

    公开(公告)日:2021-10-05

    申请号:US16836405

    申请日:2020-03-31

    IPC分类号: H03B5/12

    摘要: Apparatus, circuits and methods for clock generation are disclosed herein. In some embodiments, an apparatus is disclosed. The apparatus includes: a first transistor pair electrically coupled to a pair of output nodes; a second transistor pair electrically coupled to the pair of output nodes; and an inductive unit electrically coupled between the output nodes and electrically coupled between gates of the first transistor pair. The inductive unit comprises: a first inductive element electrically coupled to one gate of the first transistor pair; and a second inductive element electrically coupled to one of the output nodes. The first inductive element and the second inductive element are configured to be magnetically coupled to each other.

    ALL-DIGITAL PHASE LOCKED LOOP USING SWITCHED CAPACITOR VOLTAGE DOUBLER

    公开(公告)号:US20180351558A1

    公开(公告)日:2018-12-06

    申请号:US15965110

    申请日:2018-04-27

    摘要: An all-digital phase locked loop (ADPLL) receives an analog input supply voltage which is utilized to operate analog circuitry within the ADPLL. The ADPLL of the present disclosure scales this analog input supply voltage to provide a digital input supply voltage which is utilized to operate digital circuitry within the ADPLL. The analog circuitry includes a time-to-digital converter (TDC) to measure phase errors within the ADPLL. The TDC can be characterized as having a resolution of the TDC which is dependent, at least in part, upon the digital input supply voltage. In some situations, process, voltage, and/or temperature (PVT) variations within the ADPLL can cause the digital input supply voltage to fluctuate, which in turn, can cause fluctuations in the resolution of the TDC. These fluctuations in the resolution of the TDC can cause in-band phase noise of the ADPLL to vary across the PVT variations. The digital circuitry regulates the digital input supply voltage to stabilize the resolution of the TDC across the PVT variations. This stabilization of the resolution of the TDC can cause the ADPLL to maintain a fixed in-band phase noise across the PVT variations.

    All-digital phase locked loop using switched capacitor voltage doubler

    公开(公告)号:US10862486B2

    公开(公告)日:2020-12-08

    申请号:US16429774

    申请日:2019-06-03

    摘要: An all-digital phase locked loop (ADPLL) receives an analog input supply voltage which is utilized to operate analog circuitry within the ADPLL. The ADPLL of the present disclosure scales this analog input supply voltage to provide a digital input supply voltage which is utilized to operate digital circuitry within the ADPLL. The analog circuitry includes a time-to-digital converter (TDC) to measure phase errors within the ADPLL. The TDC can be characterized as having a resolution of the TDC which is dependent, at least in part, upon the digital input supply voltage. In some situations, process, voltage, and/or temperature (PVT) variations within the ADPLL can cause the digital input supply voltage to fluctuate, which in turn, can cause fluctuations in the resolution of the TDC. These fluctuations in the resolution of the TDC can cause in-band phase noise of the ADPLL to vary across the PVT variations. The digital circuitry regulates the digital input supply voltage to stabilize the resolution of the TDC across the PVT variations. This stabilization of the resolution of the TDC can cause the ADPLL to maintain a fixed in-band phase noise across the PVT variations.

    All-digital phase locked loop using switched capacitor voltage doubler

    公开(公告)号:US11177810B2

    公开(公告)日:2021-11-16

    申请号:US17112450

    申请日:2020-12-04

    摘要: An all-digital phase locked loop (ADPLL) receives an analog input supply voltage which is utilized to operate analog circuitry within the ADPLL. The ADPLL of the present disclosure scales this analog input supply voltage to provide a digital input supply voltage which is utilized to operate digital circuitry within the ADPLL. The analog circuitry includes a time-to-digital converter (TDC) to measure phase errors within the ADPLL. The TDC can be characterized as having a resolution of the TDC which is dependent, at least in part, upon the digital input supply voltage. In some situations, process, voltage, and/or temperature (PVT) variations within the ADPLL can cause the digital input supply voltage to fluctuate, which in turn, can cause fluctuations in the resolution of the TDC. These fluctuations in the resolution of the TDC can cause in-band phase noise of the ADPLL to vary across the PVT variations. The digital circuitry regulates the digital input supply voltage to stabilize the resolution of the TDC across the PVT variations. This stabilization of the resolution of the TDC can cause the ADPLL to maintain a fixed in-band phase noise across the PVT variations.