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公开(公告)号:US10720416B2
公开(公告)日:2020-07-21
申请号:US16103938
申请日:2018-08-15
发明人: Shih-Wei Chen , Chih-Hua Chen , Hsin-Yu Pan , Hao-Yi Tsai , Lipu Kris Chuang , Tin-Hao Kuo
IPC分类号: H01L21/56 , H01L23/528 , H01L23/00 , H01L23/522 , H01L23/34 , H01L23/31 , H01L25/18
摘要: A semiconductor device includes a bottom package, a top package, and a heat dissipating structure. The bottom package includes a redistribution structure, and a die disposed on a first surface of the redistribution structure and electrically connected to the redistribution structure. The top package is disposed on a second surface of the redistribution structure opposite to the first surface. The heat dissipating structure is disposed over the bottom package, and includes a thermal relaxation block. The thermal relaxation block contacts the redistribution structure and is disposed beside the top package.
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公开(公告)号:US20200058632A1
公开(公告)日:2020-02-20
申请号:US16103938
申请日:2018-08-15
发明人: Shih-Wei Chen , Chih-Hua Chen , Hsin-Yu Pan , Hao-Yi Tsai , Lipu Kris Chuang , Tin-Hao Kuo
IPC分类号: H01L25/18 , H01L23/00 , H01L23/31 , H01L23/522 , H01L23/528 , H01L23/34 , H01L21/56
摘要: A semiconductor device includes a bottom package, a top package, and a heat dissipating structure. The bottom package includes a redistribution structure, and a die disposed on a first surface of the redistribution structure and electrically connected to the redistribution structure. The top package is disposed on a second surface of the redistribution structure opposite to the first surface. The heat dissipating structure is disposed over the bottom package, and includes a thermal relaxation block. The thermal relaxation block contacts the redistribution structure and is disposed beside the top package.
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公开(公告)号:US11984372B2
公开(公告)日:2024-05-14
申请号:US17875656
申请日:2022-07-28
发明人: Teng-Yuan Lo , Lipu Kris Chuang , Hsin-Yu Pan
IPC分类号: H01L23/24 , H01L21/48 , H01L21/56 , H01L23/00 , H01L23/31 , H01L23/498 , H01L25/00 , H01L25/065 , H01L25/10
CPC分类号: H01L23/24 , H01L21/4846 , H01L21/561 , H01L23/3135 , H01L23/3185 , H01L23/49827 , H01L24/16 , H01L24/81 , H01L24/97 , H01L25/0655 , H01L25/105 , H01L25/50 , H01L2224/16145 , H01L2224/81815 , H01L2225/1035 , H01L2225/1058
摘要: A package structure and a method of forming the same are provided. A method includes forming first electrical connectors and second electrical connectors on a first side of an interposer wafer. An integrated circuit die is bonded to the first side of the interposer wafer using the first electrical connectors. A stiffener structure is attached to the first side of the interposer wafer adjacent the integrated circuit die. The stiffener structure covers the second electrical connectors in a plan view. The integrated circuit die and the stiffener structure are encapsulated with a first encapsulant. The interposer wafer and the stiffener structure are singulated to form a stacked structure.
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公开(公告)号:US20220068736A1
公开(公告)日:2022-03-03
申请号:US17162073
申请日:2021-01-29
发明人: Teng-Yuan Lo , Lipu Kris Chuang , Hsin-Yu Pan
IPC分类号: H01L23/24 , H01L21/56 , H01L23/00 , H01L25/00 , H01L25/065 , H01L23/31 , H01L23/498 , H01L25/10 , H01L21/48
摘要: A package structure and a method of forming the same are provided. A method includes forming first electrical connectors and second electrical connectors on a first side of an interposer wafer. An integrated circuit die is bonded to the first side of the interposer wafer using the first electrical connectors. A stiffener structure is attached to the first side of the interposer wafer adjacent the integrated circuit die. The stiffener structure covers the second electrical connectors in a plan view. The integrated circuit die and the stiffener structure are encapsulated with a first encapsulant. The interposer wafer and the stiffener structure are singulated to form a stacked structure.
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公开(公告)号:US20200135692A1
公开(公告)日:2020-04-30
申请号:US16713009
申请日:2019-12-13
发明人: Shih-Wei Chen , Chih-Hua Chen , Hsin-Yu Pan , Hao-Yi Tsai , Lipu Kris Chuang , Tin-Hao Kuo
IPC分类号: H01L23/00 , H01L25/00 , H01L21/56 , H01L25/065 , H01L23/31 , H01L23/538 , H01L23/373 , H01L23/367
摘要: A semiconductor package includes a redistribution structure, at least one semiconductor device, a heat dissipation component, and an encapsulating material. The at least one semiconductor device is disposed on and electrically connected to the redistribution structure. The heat dissipation component is disposed on the redistribution structure and includes a concave portion for receiving the at least one semiconductor device and an extending portion connected to the concave portion and contacting the redistribution structure, wherein the concave portion contacts the at least one semiconductor device. The encapsulating material is disposed over the redistribution structure, wherein the encapsulating material fills the concave portion and encapsulates the at least one semiconductor device.
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公开(公告)号:US20230154764A1
公开(公告)日:2023-05-18
申请号:US17655645
申请日:2022-03-21
发明人: Tzu-Sung Huang , Tsung-Hsien Chiang , Ming Hung Tseng , Hao-Yi Tsai , Yu-Hsiang Hu , Chih-Wei Lin , Lipu Kris Chuang , Wei Lun Tsai , Kai-Ming Chiang , Ching Yao Lin , Chao-Wei Li , Ching-Hua Hsieh
IPC分类号: H01L21/48 , H01L23/498
CPC分类号: H01L21/4857 , H01L23/49822 , H01L23/49838 , H01L24/32
摘要: A method includes forming a first metal mesh over a carrier, forming a first dielectric layer over the first metal mesh, and forming a second metal mesh over the first dielectric layer. The first metal mesh and the second metal mesh are staggered. The method further includes forming a second dielectric layer over the second metal mesh, attaching a device die over the second dielectric layer, with the device die overlapping the first metal mesh and the second metal mesh, encapsulating the device die in an encapsulant, and forming redistribution lines over and electrically connecting to the device die.
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公开(公告)号:US11551999B2
公开(公告)日:2023-01-10
申请号:US16897300
申请日:2020-06-10
发明人: Lipu Kris Chuang , Chung-Shi Liu , Han-Ping Pu , Hsin-Yu Pan , Ming-Kai Liu , Ting-Chu Ko
IPC分类号: H01L25/065 , H01L23/00 , H01L23/48 , H01L23/31 , H01L21/56 , H01L21/48 , H01L23/367
摘要: A memory device including a base chip and a memory cube mounted on and connected with the base chip is described. The memory cube includes multiple stacked tiers, and each tier of the multiple stacked tiers includes semiconductor chips laterally wrapped by an encapsulant and a redistribution structure. The semiconductor chips of the multiple stacked tiers are electrically connected with the base chip through the redistribution structures in the multiple stacked tiers. The memory cube includes a thermal path structure extending through the multiple stacked tiers and connected to the base chip. The thermal path structure has a thermal conductivity larger than that of the encapsulant. The thermal path structure is electrically isolated from the semiconductor chips in the multiple stacked tiers and the base chip.
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公开(公告)号:US10510713B1
公开(公告)日:2019-12-17
申请号:US16172842
申请日:2018-10-28
发明人: Shih-Wei Chen , Chih-Hua Chen , Hsin-Yu Pan , Hao-Yi Tsai , Lipu Kris Chuang , Tin-Hao Kuo
IPC分类号: H01L23/495 , H01L23/00 , H01L23/31 , H01L25/065 , H01L21/56 , H01L25/00 , H01L23/367 , H01L23/373 , H01L23/538 , H01L23/29
摘要: A semiconductor package includes a redistribution structure, at least one semiconductor device, a heat dissipation component, and an encapsulating material. The at least one semiconductor device is disposed on and electrically connected to the redistribution structure. The heat dissipation component is disposed on the redistribution structure and includes a concave portion for receiving the at least one semiconductor device and an extending portion connected to the concave portion and contacting the redistribution structure, wherein the concave portion contacts the at least one semiconductor device. The encapsulating material is disposed over the redistribution structure, wherein the encapsulating material fills the concave portion and encapsulates the at least one semiconductor device.
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公开(公告)号:US10256203B2
公开(公告)日:2019-04-09
申请号:US15662261
申请日:2017-07-27
发明人: Lipu Kris Chuang , Han-Ping Pu , Hsin-Yu Pan , Sen-Kuei Hsu
IPC分类号: H01L23/00 , H01L23/31 , H01L23/42 , H01L23/367 , H01L23/538
摘要: A semiconductor package includes a die, a passivation layer, a plurality of first electrical conductive vias, a plurality of second electrical conductive vias, a plurality of thermal conductive vias and a connecting pattern. The die includes a plurality of first pads and a plurality of second pads. The passivation layer is disposed on the die. The first electrical conductive vias and the second electrical conductive vias extend through the passivation layer and contact the first pads and the second pads respectively. The thermal conductive vias are disposed on the passivation layer. Each of the thermal conductive vias is spaced apart from the first and second electrical conductive vias. The connecting pattern is disposed on the passivation layer and connects the first electrical conductive vias and the thermal conductive vias. The thermal conductive vias are connected to the first pads through the connecting pattern and the first electrical conductive vias.
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公开(公告)号:US20190035752A1
公开(公告)日:2019-01-31
申请号:US15662261
申请日:2017-07-27
发明人: Lipu Kris Chuang , Han-Ping Pu , Hsin-Yu Pan , Sen-Kuei Hsu
IPC分类号: H01L23/00 , H01L23/538 , H01L23/367 , H01L23/31
摘要: A semiconductor package includes a die, a passivation layer, a plurality of first electrical conductive vias, a plurality of second electrical conductive vias, a plurality of thermal conductive vias and a connecting pattern. The die includes a plurality of first pads and a plurality of second pads. The passivation layer is disposed on the die. The first electrical conductive vias and the second electrical conductive vias extend through the passivation layer and contact the first pads and the second pads respectively. The thermal conductive vias are disposed on the passivation layer. Each of the thermal conductive vias is spaced apart from the first and second electrical conductive vias. The connecting pattern is disposed on the passivation layer and connects the first electrical conductive vias and the thermal conductive vias. The thermal conductive vias are connected to the first pads through the connecting pattern and the first electrical conductive vias.
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