Method and apparatus of RFID tag contactless testing
    6.
    发明授权
    Method and apparatus of RFID tag contactless testing 有权
    RFID标签无接触测试方法和装置

    公开(公告)号:US09098757B2

    公开(公告)日:2015-08-04

    申请号:US13926596

    申请日:2013-06-25

    摘要: A semiconductor wafer includes a plurality of dies. Each of the plurality of dies includes a radio frequency identification (RFID) tag circuit and a coil. The RFID tag circuit includes a tag core, an RF front-end circuit, an ID decoder, a comparator and conductive line for a unique ID. The RF front-end circuit is configured to receive electromagnetic signals through the coil in each of the plurality of dies and to convert the received electromagnetic signals into commands. The ID decoder is configured to receive the commands and to generate an expect ID. The comparator is configured to compare the unique ID with the expect ID to generate a comparison result. The comparison result is arranged to decide if the tag core is configured to receive commands.

    摘要翻译: 半导体晶片包括多个管芯。 多个管芯中的每一个都包括射频识别(RFID)标签电路和线圈。 RFID标签电路包括标签芯,RF前端电路,ID解码器,用于唯一ID的比较器和导线。 RF前端电路被配置为通过多个管芯中的每一个中的线圈接收电磁信号,并将接收到的电磁信号转换为命令。 ID解码器被配置为接收命令并产生期望ID。 比较器被配置为将唯一ID与期望ID进行比较以产生比较结果。 布置比较结果来确定标签核心是否配置为接收命令。

    Method and apparatus for RFID tag testing
    7.
    发明授权
    Method and apparatus for RFID tag testing 有权
    RFID标签测试方法和装置

    公开(公告)号:US09304164B2

    公开(公告)日:2016-04-05

    申请号:US13655047

    申请日:2012-10-18

    摘要: A semiconductor wafer includes a plurality of dies and at least one test probe. Each of the plurality of dies includes a radio frequency identification (RFID) tag circuit. The at least one test probe includes a plurality of probe pads. The plurality of probe pads is configured to transmit power signals and data to each of the plurality of dies, and to receive test results from each of the plurality of dies. The data are transmitted to each of the plurality of dies in a serial manner. The test results of each of the plurality of dies are also transmitted to the plurality of probe pads in a serial manner.

    摘要翻译: 半导体晶片包括多个管芯和至少一个测试探针。 多个管芯中的每一个都包括射频识别(RFID)标签电路。 所述至少一个测试探针包括多个探针垫。 多个探针焊盘被配置为将功率信号和数据传送到多个管芯中的每一个,并且从多个管芯中的每一个接收测试结果。 以串行方式将数据发送到多个管芯中的每一个。 多个管芯中的每一个的测试结果也以串行方式传输到多个探针焊盘。

    Method and Apparatus for RFID Tag Testing
    9.
    发明申请
    Method and Apparatus for RFID Tag Testing 审中-公开
    RFID标签测试方法与设备

    公开(公告)号:US20160187380A1

    公开(公告)日:2016-06-30

    申请号:US15065530

    申请日:2016-03-09

    IPC分类号: G01R1/067 G01R31/28 G01R31/26

    摘要: A semiconductor wafer includes a plurality of dies and at least one test probe. Each of the plurality of dies includes a radio frequency identification (RFID) tag circuit. The at least one test probe includes a plurality of probe pads. The plurality of probe pads is configured to transmit power signals and data to each of the plurality of dies, and to receive test results from each of the plurality of dies. The data are transmitted to each of the plurality of dies in a serial manner. The test results of each of the plurality of dies are also transmitted to the plurality of probe pads in a serial manner.

    摘要翻译: 半导体晶片包括多个管芯和至少一个测试探针。 多个管芯中的每一个都包括射频识别(RFID)标签电路。 所述至少一个测试探针包括多个探针垫。 多个探针焊盘被配置为将功率信号和数据传送到多个管芯中的每一个,并且从多个管芯中的每一个接收测试结果。 以串行方式将数据发送到多个管芯中的每一个。 多个管芯中的每一个的测试结果也以串行方式传输到多个探针焊盘。

    METHOD AND APPARATUS OF RFID TAG CONTACTLESS TESTING
    10.
    发明申请
    METHOD AND APPARATUS OF RFID TAG CONTACTLESS TESTING 有权
    RFID标签接口测试的方法和设备

    公开(公告)号:US20140145749A1

    公开(公告)日:2014-05-29

    申请号:US13926596

    申请日:2013-06-25

    IPC分类号: G01R31/265

    摘要: A semiconductor wafer includes a plurality of dies. Each of the plurality of dies includes a radio frequency identification (RFID) tag circuit and a coil. The RFID tag circuit includes a tag core, an RF front-end circuit, an ID decoder, a comparator and conductive line for a unique ID. The RF front-end circuit is configured to receive electromagnetic signals through the coil in each of the plurality of dies and to convert the received electromagnetic signals into commands. The ID decoder is configured to receive the commands and to generate an expect ID. The comparator is configured to compare the unique ID with the expect ID to generate a comparison result. The comparison result is arranged to decide if the tag core is configured to receive commands.

    摘要翻译: 半导体晶片包括多个管芯。 多个模具中的每一个都包括射频识别(RFID)标签电路和线圈。 RFID标签电路包括标签芯,RF前端电路,ID解码器,用于唯一ID的比较器和导线。 RF前端电路被配置为通过多个管芯中的每一个中的线圈接收电磁信号,并将接收到的电磁信号转换为命令。 ID解码器被配置为接收命令并产生期望ID。 比较器被配置为将唯一ID与期望ID进行比较以产生比较结果。 布置比较结果来确定标签核心是否配置为接收命令。