-
公开(公告)号:US20250048627A1
公开(公告)日:2025-02-06
申请号:US18427977
申请日:2024-01-31
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jaehyeok Heo , Kyoung-Ho Kim , Hojun Lee , Sungsu Moon , Sea Hoon Lee , Jaeduk Lee , Junhee Lim
Abstract: Disclosed are semiconductor devices and electronic systems including the same. The semiconductor device includes a substrate that has a recess region, a gate electrode on a bottom surface of the recess region, a gate dielectric layer between the gate electrode and the bottom surface of the recess region, a plurality of shield electrodes on laterally opposite sides of the gate electrode and on inner sidewalls of the recess region, a plurality of dielectric patterns between the shield electrodes and the inner sidewalls of the recess region, a plurality of impurity regions in the substrate and on opposite sides of the shield electrodes, and a channel region in the substrate and below the bottom surface of the recess region.
-
公开(公告)号:US11380711B2
公开(公告)日:2022-07-05
申请号:US17154583
申请日:2021-01-21
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sohyeon Lee , Sungsu Moon , Jaeduk Lee , Ikhyung Joo
IPC: H01L27/12 , H01L21/84 , H01L29/08 , H01L29/78 , H01L29/417 , H01L29/423 , H01L29/786 , H01L27/088 , H01L21/8234
Abstract: A semiconductor device includes a substrate having an active region defined by a device isolation film and providing a first channel region; a first source/drain region in the active region on first and second sides of the first channel region; a gate structure having a first gate insulating film, a shared gate electrode, and a second gate insulating film, sequentially arranged on the active region; a cover semiconductor layer on the second gate insulating film and electrically separated from the active region to provide a second channel region; a second source/drain region in the cover semiconductor layer on first and second sides of the second channel region first and second source/drain contacts respectively connected to the first and second source/drain regions; and a shared gate contact connected to the shared gate electrode.
-
公开(公告)号:US20250024677A1
公开(公告)日:2025-01-16
申请号:US18660638
申请日:2024-05-10
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kang Lib Kim , Sungsu Moon , Seahoon Lee , Junhee Lim
Abstract: A semiconductor device includes a gate electrode structure, a memory channel structure, and first and second contact plugs. The gate electrode structure includes gate electrodes spaced apart from each other in a first direction, and each of the gate electrodes extends in a second direction. The gate electrode structure has a staircase shape including step layers each of which includes two gate electrodes. The memory channel structure extends through the gate electrode structure. The first contact plug contacts an upper surface of a first gate electrode of the two gate electrodes at an upper level in a corresponding step layer. The second contact plug contacts a sidewall of a second gate electrode of the two gate electrodes at a lower level in the corresponding step layer. The second contact plug extends in the first direction and is electrically insulated from gate electrodes disposed below the second gate electrode.
-
公开(公告)号:US20240373632A1
公开(公告)日:2024-11-07
申请号:US18406913
申请日:2024-01-08
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Kang Lib Kim , Sungsu Moon , Sea Hoon Lee , Junhee Lim
IPC: H10B43/27 , H01L23/522 , H10B43/40
Abstract: Disclosed are 3D semiconductor memory devices and electronic systems including the same. The 3D semiconductor memory device comprises a first substrate including a cell array region and a contact region, a stack structure including interlayers and gate electrodes and including a pad part having a stepwise structure on the contact region, a first dielectric layer covering the pad part of the stack structure, a second dielectric layer on the first dielectric layer, an interlayer capacitor between the first dielectric layer and the second dielectric layer, cell contact plugs penetrating the pad part of the stack structure, the first dielectric layer, and the second dielectric layer and correspondingly connected to the gate electrodes, and lower and upper conductive lines penetrating the pad part of the stack structure, the first dielectric layer, and the second dielectric layer and electrically connected to the interlayer capacitor.
-
公开(公告)号:US12080799B2
公开(公告)日:2024-09-03
申请号:US17715887
申请日:2022-04-07
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sohyeon Lee , Sungsu Moon , Jaeduk Lee , Ikhyung Joo
IPC: H01L29/78 , H01L29/06 , H01L29/786
CPC classification number: H01L29/78603 , H01L29/0607
Abstract: A semiconductor device includes a substrate having a recess therein that is partially filled with at least two semiconductor active regions. The recess has sidewalls and a bottom that are sufficiently lined with corresponding substrate insulating layers that the at least two semiconductor active regions are electrically isolated from the substrate, which surrounds the sidewalls and bottom of the recess. A sidewall insulating layer is provided, which extends as a partition between first and second ones of the at least two semiconductor active regions, such that the first and second ones of the at least two semiconductor active regions are electrically isolated from each other. First and second gate electrodes are provided in the first and second active regions, respectively.
-
公开(公告)号:US11916078B2
公开(公告)日:2024-02-27
申请号:US17854128
申请日:2022-06-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sohyeon Lee , Sungsu Moon , Jaeduk Lee , Ikhyung Joo
IPC: H01L27/12 , H01L21/8234 , H01L21/84 , H01L27/088 , H01L29/08 , H01L29/417 , H01L29/423 , H01L29/78 , H01L29/786
CPC classification number: H01L27/1207 , H01L21/823431 , H01L21/823437 , H01L21/823456 , H01L21/823487 , H01L21/84 , H01L27/0886 , H01L29/0843 , H01L29/41733 , H01L29/41791 , H01L29/4236 , H01L29/42392 , H01L29/7831 , H01L29/785 , H01L29/78642 , H01L29/78696
Abstract: A semiconductor device includes a substrate having an active region defined by a device isolation film and providing a first channel region; a first source/drain region in the active region on first and second sides of the first channel region; a gate structure having a first gate insulating film, a shared gate electrode, and a second gate insulating film, sequentially arranged on the active region; a cover semiconductor layer on the second gate insulating film and electrically separated from the active region to provide a second channel region; a second source/drain region in the cover semiconductor layer on first and second sides of the second channel region; first and second source/drain contacts respectively connected to the first and second source/drain regions; and a shared gate contact connected to the shared gate electrode.
-
公开(公告)号:US20220376116A1
公开(公告)日:2022-11-24
申请号:US17715887
申请日:2022-04-07
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sohyeon Lee , Sungsu Moon , Jaeduk Lee , Ikhyung Joo
IPC: H01L29/786 , H01L29/06
Abstract: A semiconductor device includes a substrate having a recess therein that is partially filled with at least two semiconductor active regions. The recess has sidewalls and a bottom that are sufficiently lined with corresponding substrate insulating layers that the at least two semiconductor active regions are electrically isolated from the substrate, which surrounds the sidewalls and bottom of the recess. A sidewall insulating layer is provided, which extends as a partition between first and second ones of the at least two semiconductor active regions, such that the first and second ones of the at least two semiconductor active regions are electrically isolated from each other. First and second gate electrodes are provided in the first and second active regions, respectively.
-
公开(公告)号:US20220336501A1
公开(公告)日:2022-10-20
申请号:US17854128
申请日:2022-06-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sohyeon Lee , Sungsu Moon , Jaeduk Lee , Ikhyung Joo
IPC: H01L27/12 , H01L21/84 , H01L29/08 , H01L29/78 , H01L29/417 , H01L29/423 , H01L29/786 , H01L27/088 , H01L21/8234
Abstract: A semiconductor device includes a substrate having an active region defined by a device isolation film and providing a first channel region; a first source/drain region in the active region on first and second sides of the first channel region; a gate structure having a first gate insulating film, a shared gate electrode, and a second gate insulating film, sequentially arranged on the active region; a cover semiconductor layer on the second gate insulating film and electrically separated from the active region to provide a second channel region; a second source/drain region in the cover semiconductor layer on first and second sides of the second channel region; first and second source/drain contacts respectively connected to the first and second source/drain regions; and a shared gate contact connected to the shared gate electrode.
-
-
-
-
-
-
-