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公开(公告)号:US10008600B2
公开(公告)日:2018-06-26
申请号:US15685459
申请日:2017-08-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Nam Kyu Kim , Dong Chan Suh , Kwan Heum Lee , Byeong Chan Lee , Cho Eun Lee , Su Jin Jung , Gyeom Kim , Ji Eon Yoon
IPC: H01L29/08 , H01L29/78 , H01L29/165 , H01L29/417
CPC classification number: H01L29/7848 , H01L29/0847 , H01L29/165 , H01L29/41766 , H01L29/7834
Abstract: A semiconductor device may include: a semiconductor substrate, a device isolating layer embedded within the semiconductor substrate and defining an active region, a channel region formed in the active region, a gate electrode disposed above the channel region, a gate insulating layer provided between the channel region and the gate electrode, and a silicon germanium epitaxial layer adjacent to the channel region within the active region and including a first epitaxial layer containing a first concentration of germanium, a second epitaxial layer containing a second concentration of germanium, higher than the first concentration, and a third epitaxial layer containing a third concentration of germanium, lower than the second concentration, the first to third epitaxial layers being sequentially stacked on one another in that order.
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公开(公告)号:US09608117B2
公开(公告)日:2017-03-28
申请号:US15049859
申请日:2016-02-22
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jin-Bum Kim , Nam Kyu Kim , Hyun-Ho Noh , Dong-Chan Suh , Byeong-Chan Lee , Su-Jin Jung , Jin-Yeong Joe , Bon-Young Koo
CPC classification number: H01L29/785 , H01L29/0649 , H01L29/16 , H01L29/161 , H01L29/165 , H01L29/7848 , H01L29/7856
Abstract: A semiconductor device includes an active fin structure extending in a first direction, the active fin structure including protruding portions divided by a recess, a plurality of gate structures extending in a second direction crossing the first direction and covering the protruding portions of the active fin structure, a first epitaxial pattern in a lower portion of the recess between the gate structures, a second epitaxial pattern on a portion of the first epitaxial pattern, the second epitaxial pattern contacting a sidewall of the recess, and a third epitaxial pattern on the first and second epitaxial patterns, the third epitaxial pattern filling the recess. The first epitaxial pattern includes a first impurity region having a first doping concentration, the second epitaxial pattern includes a second impurity region having a second doping concentration lower than the a first doping concentration, and the third epitaxial pattern includes a third impurity region having a third doping concentration higher than the second doping concentration. The semiconductor device may have good electrical characteristics.
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公开(公告)号:US09761719B2
公开(公告)日:2017-09-12
申请号:US14741454
申请日:2015-06-17
Applicant: Samsung Electronics Co., Ltd.
Inventor: Nam Kyu Kim , Dong Chan Suh , Kwan Heum Lee , Byeong Chan Lee , Cho Eun Lee , Su Jin Jung , Gyeom Kim , Ji Eon Yoon
IPC: H01L27/088 , H01L29/78 , H01L29/417 , H01L29/08 , H01L29/165
CPC classification number: H01L29/7848 , H01L29/0847 , H01L29/165 , H01L29/41766 , H01L29/7834
Abstract: A semiconductor device may include: a semiconductor substrate, a device isolating layer embedded within the semiconductor substrate and defining an active region, a channel region formed in the active region, a gate electrode disposed above the channel region, a gate insulating layer provided between the channel region and the gate electrode, and a silicon germanium epitaxial layer adjacent to the channel region within the active region and including a first epitaxial layer containing a first concentration of germanium, a second epitaxial layer containing a second concentration of germanium, higher than the first concentration, and a third epitaxial layer containing a third concentration of germanium, lower than the second concentration, the first to third epitaxial layers being sequentially stacked on one another in that order.
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