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公开(公告)号:US20190096446A1
公开(公告)日:2019-03-28
申请号:US15941877
申请日:2018-03-30
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Min-su Lee , Jong-cheol Kim
Abstract: A memory device includes memory cell blocks, bit line sense amplifier blocks, and a control circuit connected to one or more of the bit line sense amplifier blocks arranged between the memory cell blocks. The control circuit controls levels of currents respectively supplied to a first sensing driving voltage line and a second sensing driving voltage line driving bit line sense-amplifiers, to be constant. A first sensing driving control signal and/or a second sensing driving control signal, output from the sensing-matching control circuit is provided to the bit line sense amplifiers in all of the bit line sense amplifier blocks, so that the bit line sense amplifiers are constantly driven based on the constant levels of currents supplied to the first sensing driving voltage line and the second sensing driving voltage line.
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公开(公告)号:US10658014B2
公开(公告)日:2020-05-19
申请号:US15941877
申请日:2018-03-30
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Min-su Lee , Jong-cheol Kim
IPC: G11C7/08 , G11C11/4094 , G11C11/4091 , G11C7/06 , G11C7/12
Abstract: A memory device includes memory cell blocks, bit line sense amplifier blocks, and a control circuit connected to one or more of the bit line sense amplifier blocks arranged between the memory cell blocks. The control circuit controls levels of currents respectively supplied to a first sensing driving voltage line and a second sensing driving voltage line driving bit line sense-amplifiers, to be constant. A first sensing driving control signal and/or a second sensing driving control signal, output from the sensing-matching control circuit is provided to the bit line sense amplifiers in all of the bit line sense amplifier blocks, so that the bit line sense amplifiers are constantly driven based on the constant levels of currents supplied to the first sensing driving voltage line and the second sensing driving voltage line.
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公开(公告)号:US09874886B2
公开(公告)日:2018-01-23
申请号:US15265872
申请日:2016-09-15
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jong-cheol Kim
IPC: G05F1/10 , G05F1/46 , G11C11/4074 , G11C11/4099 , G11C5/14 , G11C7/04 , G11C7/14
CPC classification number: G05F1/468 , G11C5/147 , G11C7/04 , G11C7/14 , G11C11/4074 , G11C11/4099 , G11C29/021 , G11C29/028 , G11C29/56012 , G11C2029/5602
Abstract: An integrated circuit may include a reference voltage generating circuit for generating a reference voltage. The reference voltage generating circuit may include a digital operation circuit and a digital-to-analog converter. The digital operation circuit is configured to adjust a reference voltage to temperature code relationship using a coefficient that adjusts a relative relationship between the reference voltage and the temperature code, and separate code that adjusts an absolute relationship between the reference voltage and the temperature code, wherein the temperature code reflects a temperature at the integrated circuit. The digital-to-analog converter is configured to generate the reference voltage based on an output from the digital operation circuit.
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公开(公告)号:US09755503B2
公开(公告)日:2017-09-05
申请号:US15212614
申请日:2016-07-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jong-cheol Kim , Seung-jun Bae
IPC: H03L7/00 , H02M1/36 , H01L25/065 , G11C5/14 , G11C5/02
CPC classification number: H02M1/36 , G11C5/025 , G11C5/148 , H01L25/0657
Abstract: A semiconductor device for controlling a power-up sequence is provided. The semiconductor device includes a plurality of chips. Each of the chips includes a power-up sequence controller configured to differently control generation sequences of internal source voltages. The power-up sequence controller changes the generation sequences of the internal source voltages in response to a power stabilization signal which is generated according to an external source voltage applied thereto in powering up the semiconductor device. Accordingly, a power-up current which is generated according to the internal source voltages being generated has a peak current distribution where a peak current may be equally distributed.
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公开(公告)号:US09964553B2
公开(公告)日:2018-05-08
申请号:US14669537
申请日:2015-03-26
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Im-ho Shin , Jong-cheol Kim , Ki-ju Lee , Chung-ung Kim
CPC classification number: G01N35/00584 , A61B5/145 , A61B5/7495 , A61B2505/01 , A61B2560/0487 , G01N35/00069 , G01N35/00732 , G01N35/0092 , G01N2035/00316 , G01N2035/00752 , G01N2035/00772 , G01N2035/0091 , G05D7/00
Abstract: A blood testing apparatus includes a loader configured to receive a test medium, the test medium including a test object to be tested; a controller configured to perform control to operate the loader to receive the test medium in response to receiving an input of a trigger signal indicating a test start in an emergency mode; a display configured to display a user interface screen indicating the emergency mode; and an analyzer configured to automatically start analysis of the test object under the control of the controller when the test medium is received.
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公开(公告)号:US20170147019A1
公开(公告)日:2017-05-25
申请号:US15265872
申请日:2016-09-15
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jong-cheol Kim
IPC: G05F1/46 , G11C11/4099 , G11C11/4074
CPC classification number: G05F1/468 , G11C5/147 , G11C7/04 , G11C7/14 , G11C11/4074 , G11C11/4099 , G11C29/021 , G11C29/028 , G11C29/56012 , G11C2029/5602
Abstract: An integrated circuit may include a reference voltage generating circuit for generating a reference voltage. The reference voltage generating circuit may include a digital operation circuit and a digital-to-analog converter. The digital operation circuit is configured to adjust a reference voltage to temperature code relationship using a coefficient that adjusts a relative relationship between the reference voltage and the temperature code, and separate code that adjusts an absolute relationship between the reference voltage and the temperature code, wherein the temperature code reflects a temperature at the integrated circuit. The digital-to-analog converter is configured to generate the reference voltage based on an output from the digital operation circuit
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