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公开(公告)号:US10763268B2
公开(公告)日:2020-09-01
申请号:US16437914
申请日:2019-06-11
Applicant: Samsung Electronics Co., Ltd.
Inventor: Changseop Yoon
IPC: H01L27/11
Abstract: A semiconductor device includes a substrate including first and second active patterns thereon, a first gate electrode intersecting the first and second active patterns, first and second source/drain regions on the first and second active patterns, respectively, at one side of the first gate electrode, and an active contact on the first source/drain region so as to be electrically connected to the first source/drain region. The active contact includes a first sub-contact and a second sub-contact. The second sub-contact includes a vertical extension vertically extending toward the substrate. A bottom surface of the vertical extension is lower than a bottom surface of the first sub-contact.
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公开(公告)号:US09978684B2
公开(公告)日:2018-05-22
申请号:US15082820
申请日:2016-03-28
Applicant: Samsung Electronics Co., Ltd.
Inventor: Changseop Yoon , Hyung Jong Lee , Boram Im
IPC: H01L23/52 , H01L23/528 , H01L23/535 , H01L23/532 , H01L29/78 , H01L21/8238 , H01L27/02 , H01L29/165
CPC classification number: H01L23/5283 , H01L21/823871 , H01L23/53266 , H01L23/535 , H01L27/0207 , H01L29/165 , H01L29/7848 , H01L29/7851
Abstract: The inventive concepts relate to a semiconductor device including a field effect transistor and a method for manufacturing the same. The semiconductor device includes a substrate including first and second source/drain regions formed thereon, a gate electrode intersecting the substrate between the first and second source/drain regions, and an active contact electrically connecting the first and second source/drain regions to each other. The active contact is spaced apart from the gate electrode. The active contact includes first sub-contacts provided on the first and second source/drain regions so as to be connected to the first and second source/drain regions, respectively, a second sub-contact provided on the first sub-contacts to electrically connect the first sub-contacts to each other, and a barrier layer provided between the second sub-contact and each of the first sub-contacts.
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公开(公告)号:US09780033B2
公开(公告)日:2017-10-03
申请号:US15053182
申请日:2016-02-25
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Changseop Yoon , Kwangsub Yoon , Jongmil Youn , Hyung Jong Lee
IPC: H01L23/528 , H01L21/8238 , H01L29/06 , H01L27/02 , H01L23/485
CPC classification number: H01L23/5283 , H01L21/823871 , H01L23/485 , H01L27/0207 , H01L29/0653
Abstract: A semiconductor device includes a substrate including PMOSFET and NMOSFET regions, a first gate structure extending in a first direction and crossing the PMOSFET and NMOSFET regions, and a gate contact on and connected to the first gate structure, the gate contact being between the PMOSFET and NMOSFET regions, the gate contact including a first sub contact in contact with a top surface of the first gate structure, the first sub contact including a vertical extending portion extending vertically toward the substrate along one sidewall of the first gate structure, and a second sub contact spaced apart from the first gate structure, a top surface of the second sub contact being positioned at a same level as a top surface of the first sub contact.
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公开(公告)号:US20190296027A1
公开(公告)日:2019-09-26
申请号:US16437914
申请日:2019-06-11
Applicant: Samsung Electronics Co., Ltd.
Inventor: Changseop Yoon
IPC: H01L27/11
Abstract: A semiconductor device includes a substrate including first and second active patterns thereon, a first gate electrode intersecting the first and second active patterns, first and second source/drain regions on the first and second active patterns, respectively, at one side of the first gate electrode, and an active contact on the first source/drain region so as to be electrically connected to the first source/drain region. The active contact includes a first sub-contact and a second sub-contact. The second sub-contact includes a vertical extension vertically extending toward the substrate. A bottom surface of the vertical extension is lower than a bottom surface of the first sub-contact.
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公开(公告)号:US10388604B2
公开(公告)日:2019-08-20
申请号:US15956006
申请日:2018-04-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: Changseop Yoon , Hyung Jong Lee , Boram Im
IPC: H01L21/84 , H01L27/02 , H01L27/12 , H01L29/78 , H01L21/768 , H01L23/528 , H01L23/532 , H01L23/535 , H01L27/092 , H01L29/165 , H01L21/8238
Abstract: The inventive concepts relate to a semiconductor device including a field effect transistor and a method for manufacturing the same. The semiconductor device includes a substrate including first and second source/drain regions formed thereon, a gate electrode intersecting the substrate between the first and second source/drain regions, and an active contact electrically connecting the first and second source/drain regions to each other. The active contact is spaced apart from the gate electrode. The active contact includes first sub-contacts provided on the first and second source/drain regions so as to be connected to the first and second source/drain regions, respectively, a second sub-contact provided on the first sub-contacts to electrically connect the first sub-contacts to each other, and a barrier layer provided between the second sub-contact and each of the first sub-contacts.
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公开(公告)号:US10366997B2
公开(公告)日:2019-07-30
申请号:US15821230
申请日:2017-11-22
Applicant: Samsung Electronics Co., Ltd.
Inventor: Changseop Yoon
IPC: H01L27/11
Abstract: A semiconductor device includes a substrate including first and second active patterns thereon, a first gate electrode intersecting the first and second active patterns, first and second source/drain regions on the first and second active patterns, respectively, at one side of the first gate electrode, and an active contact on the first source/drain region so as to be electrically connected to the first source/drain region. The active contact includes a first sub-contact and a second sub-contact. The second sub-contact includes a vertical extension vertically extending toward the substrate. A bottom surface of the vertical extension is lower than a bottom surface of the first sub-contact.
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公开(公告)号:US10229911B2
公开(公告)日:2019-03-12
申请号:US15685657
申请日:2017-08-24
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Changseop Yoon , Sungmin Kim , Chiwon Cho
IPC: H01L27/092 , H01L27/088 , H01L29/66 , H01L29/06 , H01L23/485 , H01L21/8238 , H01L27/02 , H01L27/11 , H01L29/417 , H01L29/165 , H01L21/8234
Abstract: A semiconductor device including a first fin active area substantially parallel to a second fin active area, a first source/drain in the first fin active area, a second source/drain in the second fin active area, a first contact plug on the first source/drain, and a second contact plug on the second source/drain. The center of the second contact plug is offset from the center of the second source/drain.
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公开(公告)号:US20180233450A1
公开(公告)日:2018-08-16
申请号:US15956006
申请日:2018-04-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: Changseop Yoon , Hyung Jong Lee , Boram Im
IPC: H01L23/528 , H01L29/78 , H01L27/02 , H01L23/532 , H01L21/8238 , H01L23/535 , H01L29/165
CPC classification number: H01L23/5283 , H01L21/76895 , H01L21/823821 , H01L21/823871 , H01L21/845 , H01L23/53266 , H01L23/535 , H01L27/0207 , H01L27/0924 , H01L27/1211 , H01L29/165 , H01L29/7848 , H01L29/7851
Abstract: The inventive concepts relate to a semiconductor device including a field effect transistor and a method for manufacturing the same. The semiconductor device includes a substrate including first and second source/drain regions formed thereon, a gate electrode intersecting the substrate between the first and second source/drain regions, and an active contact electrically connecting the first and second source/drain regions to each other. The active contact is spaced apart from the gate electrode. The active contact includes first sub-contacts provided on the first and second source/drain regions so as to be connected to the first and second source/drain regions, respectively, a second sub-contact provided on the first sub-contacts to electrically connect the first sub-contacts to each other, and a barrier layer provided between the second sub-contact and each of the first sub-contacts.
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公开(公告)号:US20180108663A1
公开(公告)日:2018-04-19
申请号:US15821230
申请日:2017-11-22
Applicant: Samsung Electronics Co., Ltd.
Inventor: Changseop Yoon
IPC: H01L27/11
CPC classification number: H01L27/1104
Abstract: A semiconductor device includes a substrate including first and second active patterns thereon, a first gate electrode intersecting the first and second active patterns, first and second source/drain regions on the first and second active patterns, respectively, at one side of the first gate electrode, and an active contact on the first source/drain region so as to be electrically connected to the first source/drain region. The active contact includes a first sub-contact and a second sub-contact. The second sub-contact includes a vertical extension vertically extending toward the substrate. A bottom surface of the vertical extension is lower than a bottom surface of the first sub-contact.
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公开(公告)号:US10283502B2
公开(公告)日:2019-05-07
申请号:US15724874
申请日:2017-10-04
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Changseop Yoon , Jayeol Goo , Sang Gil Kim
IPC: H01L27/088 , H01L29/08 , H01L29/423 , H01L29/78 , H01L21/8234 , H01L27/092
Abstract: A semiconductor device includes a plurality of active patterns protruding from a substrate, a gate structure intersecting the plurality of active patterns, a plurality of source/drain regions respectively on the plurality of active patterns at opposite sides of the gate structure, and source/drain contacts intersecting the plurality of active patterns, each of the source/drain contacts connected in common to the source/drain regions thereunder, each of the plurality of source/drain regions including a first portion in contact with a top surface of the active pattern thereunder, the first portion having a width substantially increasing as a distance from the substrate increases, and a second portion extending from the first portion, the second portion having a width substantially decreasing as a distance from the substrate increases, bottom surfaces of the source/drain contacts being lower than an interface between the first and second portions.
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