CURRENT REFERENCES FOR MEMORY CELLS
    1.
    发明公开

    公开(公告)号:US20240203490A1

    公开(公告)日:2024-06-20

    申请号:US18590692

    申请日:2024-02-28

    IPC分类号: G11C13/00

    CPC分类号: G11C13/004 G11C2013/0054

    摘要: A variety of applications can include one or more memory devices having one or more memory arrays of memory cells, where each memory cell is a resistive memory cell arranged such that a clamp current for the memory cell can be provided by an access line biasing circuit to the memory cell opposite a coupling of a sense circuit to a digit line to the memory array. The access line biasing circuit and the sense circuit can be operated in a digit line precharge phase and an access line biasing phase of a memory cell of the memory array using a set of switches to control activities for the memory cell in the memory array, the sense circuit, and the access line biasing circuit. A reference current can be provided from the access line biasing circuit to the sense circuit. Additional devices, systems, and methods are discussed.

    CURRENT REFERENCES FOR MEMORY CELLS
    3.
    发明公开

    公开(公告)号:US20230335191A1

    公开(公告)日:2023-10-19

    申请号:US17720957

    申请日:2022-04-14

    IPC分类号: G11C13/00

    CPC分类号: G11C13/004 G11C2013/0054

    摘要: A variety of applications can include one or more memory devices having one or more memory arrays of memory cells, where each memory cell is a resistive memory cell arranged such that a clamp current for the memory cell can be provided by an access line biasing circuit to the memory cell opposite a coupling of a sense circuit to a digit line to the memory array. The access line biasing circuit and the sense circuit can be operated in a digit line precharge phase and an access line biasing phase of a memory cell of the memory array using a set of switches to control activities for the memory cell in the memory array, the sense circuit, and the access line biasing circuit. A reference current can be provided from the access line biasing circuit to the sense circuit. Additional devices, systems, and methods are discussed.

    Methods and systems for improving access to memory cells

    公开(公告)号:US11705211B2

    公开(公告)日:2023-07-18

    申请号:US17415646

    申请日:2020-07-14

    摘要: The present disclosure relates to a method for accessing an array of memory cells, including storing a set of user data in a plurality of memory cells, storing, in a portion of the array, additional information representative of a voltage difference between a first threshold voltage and a second threshold voltage of the memory cells programmed to a first logic state, applying to the array a read voltage to activate a first group of memory cells corresponding to a preset number of memory cells, determining that the first group of memory cells has been activated based on applying the read voltage, wherein the read voltage is equal to the first threshold voltage when the first group of memory cells has been activated, and based on the additional data information, applying the voltage difference to the array to activate a second group of memory cells programmed to the first logic state.

    System and method for reading memory cells

    公开(公告)号:US11694748B2

    公开(公告)日:2023-07-04

    申请号:US17716716

    申请日:2022-04-08

    IPC分类号: G11C11/00 G11C13/00

    摘要: A method, a circuit, and a system for reading memory cells. The method may include: applying a first voltage with a first polarity to a plurality of the memory cells; applying a second voltage with a second polarity to one or more of said plurality of the memory cells; applying at least a third voltage with the first polarity to one or more of said plurality of the memory cells; detecting electrical responses of memory cells to the first voltage, the second voltage, and the third voltage; and determining a logic state of respective memory cells based on the electrical responses of the memory cells to the first voltage, the second voltage, and the third voltage.

    Charge separation for memory sensing

    公开(公告)号:US11538526B2

    公开(公告)日:2022-12-27

    申请号:US17162693

    申请日:2021-01-29

    IPC分类号: G11C11/22 G11C14/00

    摘要: The present disclosure includes apparatuses, methods, and systems for charge separation for memory sensing. An embodiment includes applying a sensing voltage to a memory cell, and determining a data state of the memory cell based, at least in part, on a comparison of an amount of charge discharged by the memory cell while the sensing voltage is being applied to the memory cell before a particular reference time and an amount of charge discharged by the memory cell while the sensing voltage is being applied to the memory cell after the particular reference time.

    Read algorithm for memory device
    9.
    发明授权

    公开(公告)号:US11527279B2

    公开(公告)日:2022-12-13

    申请号:US16908299

    申请日:2020-06-22

    IPC分类号: G06F11/30 G11C11/22 G06F11/07

    摘要: Methods, systems, and devices for a read algorithm for a memory device are described. When performing a read operation, the memory device may access a memory cell to retrieve a value stored by the memory cell. The memory device may compare a set of reference voltages with a signal output by the memory cell based on accessing the memory cell. Thus, the memory device may determine a set of candidate values stored by the memory cell, where each candidate value is associated with one of the reference voltages. The memory device may determine and output the value stored by the memory cell based on determining the set of candidate values. In some cases, the memory device may determine the value stored by the memory cell based on performing an error control operation on each of the set of candidate values to detect a quantity of errors within each candidate value.

    METHODS AND SYSTEMS FOR IMPROVING ACCESS TO MEMORY CELLS

    公开(公告)号:US20220319618A1

    公开(公告)日:2022-10-06

    申请号:US17415646

    申请日:2020-07-14

    摘要: The present disclosure relates to a method for accessing an array of memory cells, including storing a set of user data in a plurality of memory cells, storing, in a portion of the array, additional information representative of a voltage difference between a first threshold voltage and a second threshold voltage of the memory cells programmed to a first logic state, applying to the array a read voltage to activate a first group of memory cells corresponding to a preset number of memory cells, determining that the first group of memory cells has been activated based on applying the read voltage, wherein the read voltage is equal to the first threshold voltage when the first group of memory cells has been activated, and based on the additional data information, applying the voltage difference to the array to activate a second group of memory cells programmed to the first logic state.