Abstract:
An electronic non-volatile computer storage apparatus and methods for reducing decoder error floor for such a storage apparatus are disclosed. An analysis process it utilized to study one or more performance metrics of a decoder of the storage apparatus in order to determine various endurance points throughout the lifetime of that particular type of storage apparatus. Theses endurance points indicate when different scaling factors should be applied and/or when log-likelihood ratio should be re-measured to accommodate physical degradations over time.
Abstract:
An apparatus comprising a memory and a controller. The memory may be configured to process a plurality of read/write operations. The memory comprises a plurality of memory units each having a size less than a total size of the memory. The controller may be configured to perform error correction code decoding on the memory units. The controller may be configured to generate a plurality of original log likelihood ratios each comprising a real value. The controller may be configured to convert each of the original log likelihood ratios to a converted log likelihood ratio comprising a fixed point value. The conversion comprises (a) scaling down a magnitude of each of the original log likelihood ratios, and (b) rounding each of the original log likelihood ratios having a scaled down magnitude to the fixed point value.
Abstract:
A system includes a processor configured to read information from a plurality of memory cells. The processor initiates a first read of raw data from a group of memory cells using a first reference voltage. The processor also initiates a second read of raw data from the group of memory cells using a second reference voltage different from the first reference voltage. The processor further compares the first read to the second read to identify memory cells read with a bit value that changes between the first and second reads. The processor also assigns the memory cells read with a bit value that changes between the first and second reads to a region associated with the second reference voltage. The processor further counts the number of cells read with a bit value that changes to generate a histogram corresponding to soft information for the group of memory cells.
Abstract:
Systems and method relating generally to data processing, and more particularly to systems and methods for scaling messages in a data decoding circuit.
Abstract:
Systems and method relating generally to solid state memory, and more particularly to systems and methods for recovering data from a solid state memory.
Abstract:
Systems and method relating generally to solid state memory, and more particularly to systems and methods for reducing errors in a solid state memory.
Abstract:
An apparatus includes a memory and a controller. The memory includes a plurality of memory devices. Each memory device has a plurality of page types. The plurality of page types are classified based on error rate variations. The controller may be configured to write user data and error-correction data to the memory. The user data and the error-correction data are organized as a super-page. The super-page includes a plurality of sub-pages. The plurality of sub-pages are written across the plurality of memory devices such that the plurality of sub-pages are stored using more than one of the plurality of page types.
Abstract:
Systems and method relating generally to data processing, and more particularly to systems and methods for characterizing a solid state memory.
Abstract:
An apparatus comprising a memory and a controller. The memory may be configured to process a plurality of read/write operations. The memory comprises a plurality of memory units each having a size less than a total size of the memory. The controller may be configured to perform a first error correction code decoding on the memory units using a plurality of initial log likelihood ratio values. The controller may be configured to count a number of unsatisfied checks if the first error correction code decoding fails. The controller may be configured to generate a plurality of measured log likelihood ratio values if the number of unsatisfied checks is below a threshold. The plurality of measured log likelihood ratio values are (a) based on calculations using decoded bits of the first error correction code decoding, and (b) used to perform a second error correction code decoding on the memory units.
Abstract:
An apparatus includes an error correction code circuit and an error correction code selection circuit. The error correction code circuit may be configured to encode and decode data using any of a plurality of error correction codes. The error correction code selection circuit may be configured to control which of the plurality of error correction codes is used by the error correction code circuit to encode and decode data responsive to one or more reliability statistics and predetermined data characterizing distribution properties of each of the plurality of error correction codes.