公开(公告)号：US20190086656A1

公开(公告)日：2019-03-21

申请号：US16064533

申请日：2016-12-23

Applicant: Leica Microsystems CMS GmbH

Inventor： Florian FAHRBACH ,  Werner KNEBEL

IPC: G02B21/36 ,  G02B21/00 ,  G02B27/00 ,  G02B7/04

Abstract: A method for examining a sample by light sheet microscopy includes illuminating a sample surface located in an illumination plane by a light sheet propagating in the illumination plane. A position of a light sheet focal point of the light sheet in the illumination plane is moved by changing an optical length of a light path of illumination light forming the light sheet. Detection light emanating from the illumination plane is detected.

公开(公告)号：US20160320301A1

公开(公告)日：2016-11-03

申请号：US15104997

申请日：2014-12-17

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Werner KNEBEL ,  Wernher FOUQUET ,  Frank SIECKMANN

IPC: G01N21/59 ,  G01N21/64 ,  G02B21/00 ,  G01N21/47

Abstract: The invention relates to a method for tomographic investigation of a sample (9), in which method a sample (9) is illuminated with an illuminating light bundle (3) and in which a transmitted light bundle (10) that contains the light of the illuminating light bundle (3) transmitted through the sample (9) is detected with a transmission detector (13). The invention further relates to an apparatus for tomographic investigation of a sample (9). Provision is made that the illuminating light bundle (3) and the transmitted light bundle (10) pass in opposite propagation directions through the same objective (7).

Abstract translation: 本发明涉及一种用于样品（9）的断层摄影研究的方法，其中样品（9）用照明光束（3）照射，并且其中包含所述样品（9）的光的透射光束（10） 用透射检测器（13）检测通过样品（9）透射的照明光束（3）。 本发明还涉及一种用于样品（9）的层析成像研究的装置。 设置照明光束（3）和透射光束（10）通过相同的物镜（7）在相反的传播方向上通过。

公开(公告)号：US20180180864A1

公开(公告)日：2018-06-28

申请号：US15566729

申请日：2016-04-18

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Werner KNEBEL ,  Frank SIECKMANN ,  Florian FAHRBACH

IPC: G02B21/00 ,  G02B21/24 ,  G02B21/18

CPC classification number: G02B21/006 ,  G02B21/0032 ,  G02B21/18 ,  G02B21/248 ,  G02B21/367

Abstract: A method for analyzing a microscopic sample with a microscope includes illuminating at least a sub-region of the microscopic sample by illumination light. Detection light emanating from the microscopic sample is guided on a detection beam path, which includes at least one focusing optical element and which has a plurality of detection beam path branches, each with at least one detector element. The detector elements are parts of the same surface detector. By art adjusting element in at least a first one of the detection beam path branches, an optical path length of the first detection beam path branch is adjusted in such a way that the portion of the detection light guided on the first detection beam path branch is focused on the detector element of the first detection beam path branch.

公开(公告)号：US20130034913A1

公开(公告)日：2013-02-07

申请号：US13648740

申请日：2012-10-10

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Volker SEYFRIED ,  Werner KNEBEL

IPC: G01N21/76

CPC classification number: G02B21/0076 ,  G01N21/6428 ,  G01N21/6458 ,  G01N2201/0675 ,  G02B21/0056 ,  G03H1/0404 ,  G03H1/08 ,  G03H1/0866

Abstract: In order to investigate a specimen (30) with the aid of a microscope (20), dye particles (40, 42) in the specimen (30) are excited to fluoresce with the aid of a first illumination light beam (24). Fluorescent light proceeding from the specimen (30) is directed via an optical arrangement (34) onto an areal sensor (36), the optical arrangement (34) acting on the fluorescent light in such a way that sub-beams of the fluorescent light interfere with themselves, so that interference patterns produced as a result of the interference are imaged on a sensitive surface of the areal sensor (36) and sensed thereby. Positions of the dye particles (40, 42) within the specimen (30) are ascertained as a function of the interference patterns.

Abstract translation: 借助于显微镜（20）研究样品（30），借助于第一照明光束（24）激发样品（30）中的染料颗粒（40,42）以发荧光。 从样品（30）进行的荧光通过光学装置（34）引导到面传感器（36）上，光学装置（34）以荧光的子光束干涉 使得由于干扰而产生的干涉图案被成像在面传感器（36）的敏感表面上并被感测。 确定样品（30）内的染料颗粒（40,42）的位置作为干涉图案的函数。

公开(公告)号：US20210278651A1

公开(公告)日：2021-09-09

申请号：US17292474

申请日：2019-11-12

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Werner KNEBEL ,  Florian FAHRBACH ,  Christof FRANKE ,  Dirk-Oliver FEHRER

IPC: G02B21/08 ,  G02B21/00 ,  G02B21/04 ,  G02B21/24

Abstract: A light sheet microscope includes: a detection objective configured to image a target region of a sample located in a focal plane of the detection objective; an illumination objective configured to focus an illumination light beam in the sample, the detection objective and the illumination objective being opposite to one another, and the optical axis of the detection objective and the optical axis of the illumination objective being parallel to one another; a first light deflection device having at least one first deflection surface and one second deflection surface, which are each arranged offset to the optical axis of the detection objective and are configured to deflect the illumination light beam focused by the illumination objective in a direction perpendicular to the optical axis of the detection objective such that a deflected illumination light beam forms a light-sheet-like illumination light distribution focused in the focal plane.

公开(公告)号：US20190025563A1

公开(公告)日：2019-01-24

申请号：US15766375

申请日：2016-10-10

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Florian FAHRBACH ,  Werner KNEBEL

IPC: G02B21/00 ,  G02B21/18 ,  G02B21/06

Abstract: A method for examining a sample in light sheet fluorescence microscopy includes generating an illumination light beam using a light source. The illumination light beam is spatially split into at least two partial illumination light beams using a splitter. The partial illumination light beams are guided through an illumination objective shared by the partial illumination light beams. After the partial illumination light beams have passed through the illumination objective, at least one of the partial illumination light beams is deflected using at least one deflector such that the partial illumination light beams interfere with one another in an illumination plane so as to generate an illumination pattern in the illumination plane. An image of a sample region illuminated by the illumination pattern is produced, wherein detection light that emanates from the sample region reaches a position-sensitive detector through a detection objective.

公开(公告)号：US20160048014A1

公开(公告)日：2016-02-18

申请号：US14778908

申请日：2014-03-24

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Werner KNEBEL ,  Vishnu Vardan KRISHNAMACHARI

IPC: G02B21/36 ,  G02B21/00 ,  H04N5/374 ,  G02B27/42

CPC classification number: G02B21/367 ,  G02B21/002 ,  G02B21/0032 ,  G02B21/006 ,  G02B21/0076 ,  G02B21/008 ,  G02B21/086 ,  G02B21/361 ,  G02B27/4211 ,  H04N5/374

Abstract: A selective/single plane illumination microscopy (SPIM) arrangement having an illumination device (1) for generating a light sheet (3) illuminating a sample (2); and a detection device (5), comprising a detector (4), for detected light proceeding from the sample (2), is configured and refined in the interest of efficient and low-impact sample investigation with physically simple means in such a way that the detection device (5) comprises a device (6) for allocating different focal planes of the light sheet (3) to different regions (7) of the detector (4).

Abstract translation: 一种具有照明装置（1）的选择性/单平面照明显微镜（SPIM）装置，用于产生照亮样品（2）的光片（3）; 以及检测装置（5），其包括用于从样品（2）进行的检测光的检测器（4），以便以物理上简单的方式进行有效和低影响的样品调查，以这样的方式被设计和改进： 检测装置（5）包括用于将光板（3）的不同焦平面分配给检测器（4）的不同区域（7）的装置（6）。

公开(公告)号：US20160048012A1

公开(公告)日：2016-02-18

申请号：US14778926

申请日：2014-03-20

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Werner KNEBEL ,  Wernher FOUQUET ,  Frank SIECKMANN

IPC: G02B21/32 ,  G02B26/08 ,  G02B21/00

CPC classification number: G02B21/32 ,  G02B21/0032 ,  G02B21/0076 ,  G02B21/16 ,  G02B21/367 ,  G02B26/0816

Abstract: The invention relates to a method in which a sample is manipulated with manipulation light, and in which the sample is imaged by means of the SPIM technique under illumination with illumination light, in particular excitation light for fluorescence excitation, in the form of an illumination light sheet. The method is notable for the fact that both the manipulation light and the illumination light are focused by the same objective that is arranged in an objective working position, or by different objectives that are brought successively into an objective working position; and that the manipulation light and/or the illumination light, after passing through the objective, is diverted by means of a diverting device in such a way that it propagates at an angle different from zero degrees with respect to the optical axis of the objective.

Abstract translation: 本发明涉及一种方法，其中用操作光对样品进行操作，并且其中采用照明光照射下的SPIM技术成像样品，特别是用于荧光激发的激发光，以照明光的形式 片。 该方法的特征在于，操作光和照明光均被设置在目标工作位置的相同目标或通过连续进入目标工作位置的不同目标聚焦; 并且操纵光和/或照明光在通过物镜之后通过转向装置转向，使得其以相对于物镜的光轴不成零的角度传播。

公开(公告)号：US20210063714A1

公开(公告)日：2021-03-04

申请号：US16977820

申请日：2019-02-20

Applicant: Leica Microsystems CMS GmbH

Inventor： Florian FAHRBACH ,  Werner KNEBEL ,  Peter POTT ,  Wernher FOUQUET

IPC: G02B21/00 ,  G02B21/33 ,  G02B21/24 ,  G01N21/64 ,  G01N21/47

Abstract: An optical device for illuminating a sample located in a sample volume with illumination light and for detecting scattered and/or fluorescent light from the sample includes an optical illumination assembly, an optical detection assembly and at least one attachment element. The optical illumination assembly is configured to transmit the illumination light along an illumination path into the sample volume. The optical detection assembly is configured to collect and relay the scattered and/or fluorescent light from the sample volume along a detection path. At least portions of the illumination path and/or of the detection path extend in the at least one attachment element.

公开(公告)号：US20190278072A1

公开(公告)日：2019-09-12

申请号：US16310472

申请日：2017-06-21

Applicant: Leica Microsystems CMS GmbH

Inventor： Florian FAHRBACH ,  Lars FRIEDRICH ,  Werner KNEBEL

IPC: G02B21/16 ,  G02B21/06 ,  G02B27/10

Abstract: An illumination apparatus for a microscope, for producing a de-excitation or switching light distribution, includes a light source configured to produce a primary illumination light beam and a beam splitter configured to divide the primary illumination light beam into two partial illumination light beams. An illumination objective is configured to focus the partial illumination light beams onto and/or into a sample such that the partial illumination light beams extend, spatially separated from one another, through an entry pupil of the illumination objective and are spatially superposed on and/or in the sample after passing through the illumination objective. A phase influencer is configured to cause a relative phase offset of the partial illumination light beams with respect to one another in such a way that the partial illumination light beams in the entry pupil of the illumination objective have a phase offset of π.