SEMICONDUCTOR MICRO-ANALYSIS CHIP AND METHOD OF MANUFACTURING THE SAME
    1.
    发明申请
    SEMICONDUCTOR MICRO-ANALYSIS CHIP AND METHOD OF MANUFACTURING THE SAME 审中-公开
    半导体微分析芯片及其制造方法

    公开(公告)号:US20150041316A1

    公开(公告)日:2015-02-12

    申请号:US14198425

    申请日:2014-03-05

    Abstract: One of embodiments is a semiconductor micro-analysis chip for detecting particles in a sample liquid. The chip comprises a semiconductor substrate, a first flow channel provided on the semiconductor substrate to allow the sample liquid to flow therein, a second flow channel provided at a different position from the first flow channel of the semiconductor substrate to allow the sample liquid or an electrolyte solution to flow therein, a contact portion where a portion of the first flow channel and a portion of the second flow channel abut each other or intersect one another with a partition being arranged between the flow channels, and a fine hole provided on the partition of the contact portion to allow the particles to pass therethrough.

    Abstract translation: 一个实施例是用于检测样品液体中的颗粒的半导体微分析芯片。 芯片包括半导体衬底,设置在半导体衬底上以允许样品液体流过的第一流动通道,设置在与半导体衬底的第一流动通道不同的位置处的第二流动通道,以允许样品液体或 在其中流动的电解质溶液,其中第一流动通道的一部分和第二流动通道的一部分彼此邻接或相互交叉的接触部分设置在流动通道之间的分隔件和设置在分隔件上的细孔 的接触部分以允许颗粒通过。

    DETECTION DEVICE, DETECTION METHOD, AND ELECTRODE WITH PROBE

    公开(公告)号:US20190064157A1

    公开(公告)日:2019-02-28

    申请号:US15908700

    申请日:2018-02-28

    Abstract: According to one embodiment, a detection device is disclosed. The detection device includes a first region, a first electrode on the first region, a second region, a second electrode on the second region, a partition partitioning the first region and the second region and including a through hole, thereby communicating the first region with the second region. The device further includes a probe which binds specifically to the detection target, and is detachably connected to the first electrode, a detacher to detach the probe from the first electrode, a determination unit to determine whether the first liquid contains a detection target based on a change of electrical condition between the first electrode and the second electrode in a state where the first region and the second region are supplied with the first liquid and the second liquid, respectively.

    ANALYSIS PACKAGE
    3.
    发明申请
    ANALYSIS PACKAGE 有权
    分析包

    公开(公告)号:US20160231263A1

    公开(公告)日:2016-08-11

    申请号:US14848312

    申请日:2015-09-08

    Abstract: According to one embodiment, an analysis package including a board including an electrical terminal, an analysis chip provided at the board, the chip including a detector for detecting a particle, a flow channel of a sample liquid for particle detection to the detector, and a liquid receiver for introducing the sample liquid into the flow channel, a mold provided to cover the board on which the analysis chip is provided, the mold comprising an opening above the liquid receiver, a first shield layer provided on a back surface of the board, and a second shield layer provided to be attachable and detachable on an opposite side to the analysis chip of the mold, the second shield layer being electrically connected to a part of the electrical terminal.

    Abstract translation: 根据一个实施例,一种分析包装,包括包括电子端子的板,设置在板上的分析芯片,包括用于检测颗粒的检测器的芯片,用于检测器的用于颗粒检测的样品液体的流动通道,以及 用于将样品液体引入流动通道的液体接收器,设置成覆盖设置有分析芯片的板的模具,模具包括在液体接收器上方的开口,设置在板的背面上的第一屏蔽层, 以及第二屏蔽层,其设置成在与所述模具的分析芯片相反的一侧上可附接和拆卸,所述第二屏蔽层电连接到所述电端子的一部分。

    PARTICLE INSPECTION UNIT AND PARTICLE INSPECTION SYSTEM
    4.
    发明申请
    PARTICLE INSPECTION UNIT AND PARTICLE INSPECTION SYSTEM 审中-公开
    颗粒检查单元和颗粒检查系统

    公开(公告)号:US20160320286A1

    公开(公告)日:2016-11-03

    申请号:US15205691

    申请日:2016-07-08

    Abstract: According to one embodiment, a particle inspection system includes an inspection module and a determination module. The inspection module includes a particle inspection chip includes electrodes for detecting existence of particles in a sample liquid by a change in an electrical signal, and a memory element which is provided separately from the electrodes and configured to store whether the inspection chip is a used chip or not. The determination module includes a determination circuit configured to determine the existence of the particles based on a detection signal of the inspection chip, and a control circuit configured to control an operation of the determination circuit from information in the memory element.

    Abstract translation: 根据一个实施例,颗粒检查系统包括检查模块和确定模块。 检查模块包括:粒子检查芯片,包括用于通过电信号的变化来检测样品液体中的颗粒的存在的电极;以及与电极分开设置的存储元件,其被配置为存储检查芯片是否是使用的芯片 或不。 确定模块包括确定电路,其被配置为基于检查芯片的检测信号确定颗粒的存在;以及控制电路,被配置为根据存储元件中的信息控制确定电路的操作。

    ANALYSIS PACKAGE
    5.
    发明申请
    ANALYSIS PACKAGE 有权
    分析包

    公开(公告)号:US20160231262A1

    公开(公告)日:2016-08-11

    申请号:US14848307

    申请日:2015-09-08

    Abstract: According to one embodiment, an analysis package, including a board, an analysis chip provided on the board, the chip including a detector for detecting a particle, a flow channel of a sample liquid, and a liquid receiver of the sample liquid, a first mold layer provided on the analysis chip, the first mold layer including an opening above the liquid receiver, and a second mold layer provided on the board and the first mold layer, the second mold layer including an opening above the opening of the first mold layer, wherein the respective openings of the first and second mold layers are connected above the liquid receiver to allow the sample liquid to be introduced into the liquid receiver from outside.

    Abstract translation: 根据一个实施例,包括板的分析包,设置在板上的分析芯片,包括用于检测颗粒的检测器,样品液体的流动通道和样品液体的液体接收器的芯片,第一 设置在分析芯片上的模具层,第一模具层包括在液体接收器上方的开口,以及设置在板和第一模具层上的第二模具层,第二模具层包括在第一模具层的开口上方的开口 其中第一和第二模具层的相应开口连接在液体接收器上方,以允许样品液体从外部引入到液体接收器中。

    SEMICONDUCTOR MICRO-ANALYSIS CHIP AND MANUFACTURING METHOD THEREOF
    6.
    发明申请
    SEMICONDUCTOR MICRO-ANALYSIS CHIP AND MANUFACTURING METHOD THEREOF 审中-公开
    半导体微分析芯片及其制造方法

    公开(公告)号:US20140256028A1

    公开(公告)日:2014-09-11

    申请号:US14012566

    申请日:2013-08-28

    Abstract: According to one embodiment, a semiconductor micro-analysis chip for detecting fine particles in sample liquid includes a semiconductor substrate, a first flow channel that is formed in the semiconductor substrate and into which the sample liquid is introduced, and a plurality of columnar structures fully arranged in the first flow channel at regulation distance.

    Abstract translation: 根据一个实施例,用于检测样品液体中的细颗粒的半导体微分析芯片包括半导体衬底,形成在半导体衬底中并且其中引入样品液体的第一流动通道和多个柱状结构 在调节距离处布置在第一流道中。

    SAMPLE DETECTION APPARATUS AND DETECTION METHOD
    7.
    发明申请
    SAMPLE DETECTION APPARATUS AND DETECTION METHOD 有权
    样品检测装置和检测方法

    公开(公告)号:US20140255911A1

    公开(公告)日:2014-09-11

    申请号:US14011666

    申请日:2013-08-27

    Abstract: According to one embodiment, a sample detection apparatus including an insulating partition to divide a first and a second region, a pore formed in the partition, a first electrode arranged in the first region, a second electrode arranged in the second region, a power source configured to apply electrical current between the first and second electrode in a state in which a reagent containing a capture substance to be bound to a target and a tag particle bound to the capture substance is introduced into the first region together with a sample, and an electrolyte solution is introduced into the second region, a measurement unit configured to observe a change in a conductive state, and a detection unit to detect presence/absence of the target in the sample based on an observation result.

    Abstract translation: 根据一个实施例,一种样本检测装置,包括分隔第一和第二区域的绝缘隔板,形成在隔板中的孔,布置在第一区域中的第一电极,布置在第二区域中的第二电极,电源 被配置为在所述第一和第二电极之间以与待结合的捕获物质的试剂和与所述捕获物质结合的标签颗粒与试样一起被引入到所述第一区域的状态,在所述第一和第二电极之间施加电流, 电解质溶液被引入到第二区域中,测量单元被配置为观察导电状态的变化,以及检测单元,其基于观察结果来检测样品中的目标的存在/不存在。

    PARTICLE INSPECTION SYSTEM AND DRIVING METHOD EMPLOYED THEREIN

    公开(公告)号:US20170122859A1

    公开(公告)日:2017-05-04

    申请号:US15408702

    申请日:2017-01-18

    Abstract: According to one embodiment, a particle inspection system includes a voltage driving circuit which applies a driving voltage for a particle inspection to a particle inspection chip, a current-voltage conversion circuit which converts, into a voltage signal, a current signal output from the particle inspection chip when the driving voltage is applied to the particle inspection chip, a detection circuit which detects, based on the voltage signal, whether the sample liquid is introduced into a detection region of the particle inspection chip, and an analysis circuit which analyzes the fine particle, in the sample liquid based on the voltage signal. The voltage driving circuit varies the driving voltage based on the detection result of the detection circuit.

    SEMICONDUCTOR ANALYSIS CHIP AND PARTICLE INSPECTION METHOD
    9.
    发明申请
    SEMICONDUCTOR ANALYSIS CHIP AND PARTICLE INSPECTION METHOD 审中-公开
    半导体分析芯片和粒子检测方法

    公开(公告)号:US20170074824A1

    公开(公告)日:2017-03-16

    申请号:US15058896

    申请日:2016-03-02

    Abstract: According to one embodiment, a semiconductor analysis chip for detecting a particle in a sample liquid includes a semiconductor substrate, a first flow channel provided in a surface portion of the semiconductor substrate, a second flow channel provided in a surface portion of the semiconductor substrate, part of the second flow channel contacting or intersecting the first flow channel, a micropore provided in a contact portion or an intersection of the first and second flow channels, and configured to permit the particle to pass therethrough, a first electrode provided in the first flow channels, a second electrode provided in the second passage, and a third electrode provided in the first flow channel downstream of the first electrode.

    Abstract translation: 根据一个实施例,用于检测样品液体中的颗粒的半导体分析芯片包括半导体衬底,设置在半导体衬底的表面部分中的第一流动通道,设置在半导体衬底的表面部分中的第二流动通道, 与所述第一流动通道接触或相交的所述第二流动通道的一部分,设置在所述第一和第二流动通道的接触部分或交叉点中并被配置为允许所述粒子通过的微孔,设置在所述第一流动中的第一电极 通道,设置在第二通道中的第二电极,以及设置在第一电流通道下游的第三电极。

    ANALYSIS PACKAGE
    10.
    发明申请
    ANALYSIS PACKAGE 有权
    分析包

    公开(公告)号:US20160231265A1

    公开(公告)日:2016-08-11

    申请号:US14848351

    申请日:2015-09-09

    Abstract: According to one embodiment, an analysis package including an analysis chip provided on a main surface of a semiconductor substrate, the chip including a flow channel, both ends of which are open at peripheral parts of the substrate, and a microaperture which is provided in a middle of the flow channel and which allows a particle to pass therethrough, a package board on which the chip is mounted, liquid receivers provided on the package board, the liquid receivers being connected to openings, and electrodes, at least parts of which are provided on parts of bottom surfaces of the liquid receivers, the electrodes being provided at positions corresponding to an upstream side and a downstream side of the microaperture.

    Abstract translation: 根据一个实施例,一种分析包装,其包括设置在半导体基板的主表面上的分析芯片,该芯片包括其两端在基板的周边部分开口的流动通道和设置在该基板的周边部分的微孔 流动通道的中间并允许颗粒通过其中,其上安装有芯片的封装板,设置在封装板上的液体接收器,连接到开口的液体接收器和至少部分设置的电极 在液体接收器的底表面的一部分上,电极设置在对应于微孔的上游侧和下游侧的位置处。

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