Heat stable SnAl and SnMg based dielectrics
    3.
    发明授权
    Heat stable SnAl and SnMg based dielectrics 有权
    耐热SnAl和SnMg基电介质

    公开(公告)号:US09296651B2

    公开(公告)日:2016-03-29

    申请号:US14299341

    申请日:2014-06-09

    摘要: A transparent dielectric composition comprising tin, oxygen and one of aluminum or magnesium with preferably higher than 15% by weight of aluminum or magnesium offers improved thermal stability over tin oxide with respect to appearance and optical properties under high temperature processes. For example, upon a heat treatment at temperatures higher than 500 C, changes in color and index of refraction of the present transparent dielectric composition are noticeably less than those of tin oxide films of comparable thickness. The transparent dielectric composition can be used in high transmittance, low emissivity coated panels, providing thermal stability so that there are no significant changes in the coating optical and structural properties, such as visible transmission, IR reflectance, microscopic morphological properties, color appearance, and haze characteristics, of the as-coated and heated treated products.

    摘要翻译: 包含锡,氧和铝或镁中的一种优选高于15重量%的铝或镁的透明电介质组合物相对于在高温过程下的外观和光学性质提供了比氧化锡更好的热稳定性。 例如,当在高于500℃的温度下进行热处理时,本发明透明电介质组合物的颜色变化和折射率显着小于具有相当厚度的氧化锡膜的变化。 透明电介质组合物可用于高透光率,低发射率涂层面板,提供热稳定性,使得涂层的光学和结构性能如可见透射率,IR反射率,微观形态特性,颜色外观和 涂层和加热处理产品的雾度特性。

    Novel silver barrier materials for low-emissivity applications
    4.
    发明申请
    Novel silver barrier materials for low-emissivity applications 有权
    用于低发射率应用的新型银阻挡材料

    公开(公告)号:US20140177042A1

    公开(公告)日:2014-06-26

    申请号:US13725126

    申请日:2012-12-21

    IPC分类号: G02B5/20

    摘要: A method for making low emissivity panels, including control the composition of a barrier layer formed on a thin conductive silver layer. The barrier structure can include an alloy of a first element having high oxygen affinity with a second element having low oxygen affinity. The first element can include Ta, Nb, Zr, Hf, Mn, Y, Si, and Ti, and the second element can include Ru, Ni, Co, Mo, and W, which can have low oxygen affinity property. The alloy barrier layer can reduce optical absorption in the visible range, can provide color-neutral product, and can improve adhesion to the silver layer.

    摘要翻译: 一种制造低发射率面板的方法,包括控制形成在薄导电银层上的阻挡层的组成。 阻挡结构可以包括具有高氧亲和力的第一元素与具有低氧亲合力的第二元素的合金。 第一元素可以包括Ta,Nb,Zr,Hf,Mn,Y,Si和Ti,第二元素可以包括可以具有低氧亲和性的Ru,Ni,Co,Mo和W。 合金阻挡层可以减少可见光范围内的光吸收,可以提供颜色中性的产品,并可以提高对银层的粘附性。

    Silver barrier materials for low-emissivity applications
    5.
    发明授权
    Silver barrier materials for low-emissivity applications 有权
    用于低发射率应用的银屏障材料

    公开(公告)号:US09448345B2

    公开(公告)日:2016-09-20

    申请号:US13725126

    申请日:2012-12-21

    摘要: A method for making low emissivity panels, including control the composition of a barrier layer formed on a thin conductive silver layer. The barrier structure can include an alloy of a first element having high oxygen affinity with a second element having low oxygen affinity. The first element can include Ta, Nb, Zr, Hf, Mn, Y, Si, and Ti, and the second element can include Ru, Ni, Co, Mo, and W, which can have low oxygen affinity property. The alloy barrier layer can reduce optical absorption in the visible range, can provide color-neutral product, and can improve adhesion to the silver layer.

    摘要翻译: 一种制造低发射率面板的方法,包括控制形成在薄导电银层上的阻挡层的组成。 阻挡结构可以包括具有高氧亲和力的第一元素与具有低氧亲合力的第二元素的合金。 第一元素可以包括Ta,Nb,Zr,Hf,Mn,Y,Si和Ti,第二元素可以包括可以具有低氧亲和性的Ru,Ni,Co,Mo和W。 合金阻挡层可以减少可见光范围内的光吸收,可以提供颜色中性的产品,并可以提高对银层的粘附性。

    Heat Stable SnAl and SnMg Based Dielectrics
    6.
    发明申请
    Heat Stable SnAl and SnMg Based Dielectrics 有权
    热稳定SnAl和SnMg基电介质

    公开(公告)号:US20140287254A1

    公开(公告)日:2014-09-25

    申请号:US14299341

    申请日:2014-06-09

    IPC分类号: C03C17/36 C23C28/00 H01B3/10

    摘要: A transparent dielectric composition comprising tin, oxygen and one of aluminum or magnesium with preferably higher than 15% by weight of aluminum or magnesium offers improved thermal stability over tin oxide with respect to appearance and optical properties under high temperature processes. For example, upon a heat treatment at temperatures higher than 500 C, changes in color and index of refraction of the present transparent dielectric composition are noticeably less than those of tin oxide films of comparable thickness. The transparent dielectric composition can be used in high transmittance, low emissivity coated panels, providing thermal stability so that there are no significant changes in the coating optical and structural properties, such as visible transmission, IR reflectance, microscopic morphological properties, color appearance, and haze characteristics, of the as-coated and heated treated products.

    摘要翻译: 包含锡,氧和铝或镁中的一种优选高于15重量%的铝或镁的透明电介质组合物相对于在高温过程下的外观和光学性质提供了比氧化锡更好的热稳定性。 例如,当在高于500℃的温度下进行热处理时,本发明透明电介质组合物的颜色变化和折射率显着小于具有相当厚度的氧化锡膜的变化。 透明电介质组合物可用于高透光率,低发射率涂层面板,提供热稳定性,使得涂层的光学和结构性能如可见透射率,IR反射率,微观形态特性,颜色外观和 涂层和加热处理产品的雾度特性。

    Low Resistivity Nitrogen-Doped Zinc Telluride and Methods for Forming the Same
    8.
    发明申请
    Low Resistivity Nitrogen-Doped Zinc Telluride and Methods for Forming the Same 审中-公开
    低电阻率氮掺杂锌碲化物及其形成方法

    公开(公告)号:US20150171260A1

    公开(公告)日:2015-06-18

    申请号:US14108697

    申请日:2013-12-17

    IPC分类号: H01L31/18 H01L31/0224

    摘要: Embodiments provided herein describe methods for forming nitrogen-doped zinc telluride, such as for use in photovoltaic devices. The zinc telluride layer is formed using physical vapor deposition (PVD) at a processing temperature of between about 100° C. and about 450° C. in a gaseous environment that includes between about 3% and about 10% by volume of nitrogen gas.

    摘要翻译: 本文提供的实施方案描述了形成氮掺杂的碲化锌的方法,例如用于光伏器件中的方法。 在包括约3体积%至约10体积%的氮气的气体环境中,使用物理气相沉积(PVD)在约100℃至约450℃的加工温度下形成碲化锌层。

    Methods for forming resistive switching memory elements
    10.
    发明申请
    Methods for forming resistive switching memory elements 审中-公开
    形成电阻式开关存储元件的方法

    公开(公告)号:US20140231744A1

    公开(公告)日:2014-08-21

    申请号:US14264475

    申请日:2014-04-29

    IPC分类号: H01L45/00

    摘要: Resistive switching memory elements are provided that may contain electroless metal electrodes and metal oxides formed from electroless metal. The resistive switching memory elements may exhibit bistability and may be used in high-density multi-layer memory integrated circuits. Electroless conductive materials such as nickel-based materials may be selectively deposited on a conductor on a silicon wafer or other suitable substrate. The electroless conductive materials can be oxidized to form a metal oxide for a resistive switching memory element. Multiple layers of conductive materials can be deposited each of which has a different oxidation rate. The differential oxidization rates of the conductive layers can be exploited to ensure that metal oxide layers of desired thicknesses are formed during fabrication.

    摘要翻译: 提供电阻式开关存储器元件,其可以包含由无电金属形成的化学金属电极和金属氧化物。 电阻式开关存储器元件可以表现出双稳态,并且可以用于高密度多层存储器集成电路中。 诸如镍基材料的无电导电材料可以选择性地沉积在硅晶片或其它合适的衬底上的导体上。 无电导电材料可以被氧化以形成用于电阻式开关存储元件的金属氧化物。 可以沉积多层导电材料,每层具有不同的氧化速率。 可以利用导电层的差异氧化速率来确保在制造期间形成所需厚度的金属氧化物层。