Electronic circuitry socket structure

    公开(公告)号:US10886647B2

    公开(公告)日:2021-01-05

    申请号:US16201367

    申请日:2018-11-27

    摘要: According to some embodiments, a socket for an electronic device includes a housing and pins connected to the housing. The housing includes a base extending laterally and having an inner face and an outer face; a riser connected to the base and extending away from the outer face; a wall extending laterally, connected to the riser, and having an exterior face and an interior face that faces the outer face of the base; mounting ports extending through the base from the inner face to the outer face; and exit ports extending through the wall from the interior face to the exterior face. Each pin includes a portion extending at least partially though one mounting port; a portion extending between the base and the wall; and a portion extending through one exit port.

    Press-fit apparatus for connectors

    公开(公告)号:US10535970B2

    公开(公告)日:2020-01-14

    申请号:US15415355

    申请日:2017-01-25

    IPC分类号: H01R43/20 H01R12/58 H01R12/70

    摘要: An apparatus and method for press-fitting a connector to a circuit board is provided. The apparatus has a universal press block fixedly connected to a machine press head. A bottom plate of the universal press block has multiple locating holes. A locating block is fixedly connected to the bottom plate. A press block is fixedly connected to the locating block at a predetermined position suitable for press-fitting the connector. The press block has a press block head, a press block body and a sensor provided between the head and the body. The press block head is movable to contact the connector to apply a pressing force to the connector. The sensor detects the pressing force and generates a signal indicative of the pressing force. The press block body receives the signal from the sensor and controls the movement of the press block head based on the signal.

    ELECTRONIC CIRCUITRY SOCKET STRUCTURE
    5.
    发明申请

    公开(公告)号:US20200169017A1

    公开(公告)日:2020-05-28

    申请号:US16201367

    申请日:2018-11-27

    摘要: According to some embodiments, a socket for an electronic device includes a housing and pins connected to the housing. The housing includes a base extending laterally and having an inner face and an outer face; a riser connected to the base and extending away from the outer face; a wall extending laterally, connected to the riser, and having an exterior face and an interior face that faces the outer face of the base; mounting ports extending through the base from the inner face to the outer face; and exit ports extending through the wall from the interior face to the exterior face. Each pin includes a portion extending at least partially though one mounting port; a portion extending between the base and the wall; and a portion extending through one exit port.

    ICT PROBE CONTACT IMPROVEMENT
    9.
    发明申请

    公开(公告)号:US20180074094A1

    公开(公告)日:2018-03-15

    申请号:US15264963

    申请日:2016-09-14

    IPC分类号: G01R1/067 G01R31/28

    CPC分类号: G01R31/2801 G01R1/06722

    摘要: A method of testing a printed circuit board (PCB) with an in-circuit test (ICT) probe having an improved probe-to-via contact is provided. The ICT probe includes a tip attached to a spindle; a housing having a cavity, a portion of the spindle insertable into the cavity; and a heating element wrapped helically around the spindle, the heating element coupled to the housing. The probe is contacted with a surface of a flux layer of a test via of the PCB, said contact compressing the heating element and recessing the insertable portion of the spindle into the cavity. The tip of the probe is heated with the heating element to a temperature capable of at least partially melting the flux layer, the tip at least partially penetrating the flux layer to contact a surface of a solder plugging the test via.

    NETWORKED ELECTROSTATIC DISCHARGE MEASUREMENT

    公开(公告)号:US20170276713A1

    公开(公告)日:2017-09-28

    申请号:US15077955

    申请日:2016-03-23

    摘要: A first electrostatic discharge measurement is received from a first sensor. The first sensor utilizes a wireless network to send the first measurement from a first stage of the assembly line of electronic components susceptible to electrostatic discharge damage. A second electrostatic discharge measurement is received from a second sensor. The second sensor utilizes the wireless network to send the second measurement from a second stage of the assembly line. An electrostatic discharge history is updated for the first assembly stage based on the first electrostatic discharge measurement. The electrostatic discharge history is updated for the second assembly stage based on the second electrostatic discharge measurement. A potential electrostatic danger condition is determined based on the electrostatic discharge history