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    Potential difference early-warning circuit and system
    1.
    发明授权
    Potential difference early-warning circuit and system 有权

    公开(公告)号：US11994565B2

    公开(公告)日：2024-05-28

    申请号：US18043972

    申请日：2021-07-30

    Applicant: INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO., LTD.

    Inventor： Jie Cui ,  Lemei Bao

    IPC: G01R31/52 ,  G01R31/28 ,  H02H3/26 ,  G01R19/165

    CPC classification number: G01R31/52 ,  G01R31/2801 ,  H02H3/26 ,  G01R19/16576

    Abstract: A potential difference early-warning circuit, comprising: a sensing resistor (R2), (PCB GND); a first MOS (M1), a drain of the first MOS being connected to the sensing resistor (R2), and a source of the first MOS (M1) being connected to a safety ground (GND); an operational amplifier (U1A), a positive input end of the operational amplifier being connected to one end of the sensing resistor (R2), and a negative input end of the operational amplifier (U1A) being connected to the other end of the sensing resistor (R2); a second MOS (M2), a gate of the second MOS (M2) being connected to an output end of the operational amplifier (U1A), and a source of the second MOS (M2) being connected to the signal ground; and a controller, a first input end of the controller being connected to the drain of the second MOS (M2), and an output end of the controller being connected to the gate of the second MOS (M2).

    Monitoring system with bridges for interconnecting system elements
    2.
    发明授权
    Monitoring system with bridges for interconnecting system elements 有权

    公开(公告)号：US11841390B2

    公开(公告)日：2023-12-12

    申请号：US17889800

    申请日：2022-08-17

    Applicant: Bently Nevada, LLC

    Inventor： Michael Alan Tart ,  Steven Thomas Clemens ,  Dustin Hess ,  Paul Richetta

    IPC: G01R31/28 ,  G05B19/4065 ,  G05B19/418

    CPC classification number: G01R31/2801 ,  G05B19/4065 ,  G05B19/4185 ,  G05B2219/33144 ,  G05B2219/33328

    Abstract: Systems, methods, and devices for monitoring operation of industrial equipment are disclosed. In one embodiment, a monitoring system is provided that includes a passive backplane and one more functional circuits that can couple to the backplane. Each of the functional circuits that are coupled to the backplane can have access to all data that is delivered to the backplane. Therefore, resources (e.g., computing power, or other functionality) from each functional circuits can be shared by all active functional circuits that are coupled to the backplane. Because resources from each of the functional circuits can be shared, and because the functional circuits can be detachably coupled to the backplane, performance of the monitoring systems can be tailored to specific applications. For example, processing power can be increased by coupling additional processing circuits to the backplane.

    Methods, systems, and computer readable media for detecting electrical disconnection between integrated circuit chip electrical connections and corresponding electrical contacts on a printed circuit board or chip socket during testing of the chip under environmental conditions
    10.
    发明授权
    Methods, systems, and computer readable media for detecting electrical disconnection between integrated circuit chip electrical connections and corresponding electrical contacts on a printed circuit board or chip socket during testing of the chip under environmental conditions 有权
    用于在环境条件下测试芯片期间检测集成电路芯片电连接和印刷电路板或芯片插座上的相应电触点之间的电断开的方法，系统和计算机可读介质

    公开(公告)号：US09442151B2

    公开(公告)日：2016-09-13

    申请号：US14299665

    申请日：2014-06-09

    Applicant: SanDisk Technologies Inc.

    Inventor： Shai Tubul ,  Evgeni Bassin ,  Victor Romanov

    IPC: G01R31/04 ,  G01R31/28

    CPC classification number: G01R31/046 ,  G01R31/04 ,  G01R31/041 ,  G01R31/043 ,  G01R31/045 ,  G01R31/2801 ,  G01R31/2805 ,  G01R31/2884

    Abstract: A method for detecting electrical disconnections of a chip during testing under environmental conditions includes providing n monitor connections on a chip from which a voltage or current can be sensed during testing of the chip under environmental conditions, where n is an integer of at least one. M sensing connections are provided on the chip, where m>n. An electrical circuit for electrically connects the n monitor connections with the m sensing connections. The electrical circuit has a characteristic that changes when one or more of the m sensing connections is disconnected from its corresponding contact on the printed circuit board or chip socket. The electrical circuit is monitored via the n monitor connections during the testing. It is determined based on changes in the characteristic, whether one or more of the m sensing connections is disconnected from the printed circuit board or chip socket.

    Abstract translation: 一种用于在环境条件下检测芯片的电断开的方法包括在芯片上提供n个监视器连接，芯片可在环境条件下测试芯片期间感测电压或电流，其中n为至少一个整数。 芯片上提供M个感测连接，其中m> n。 用于将n个监视器连接与m个感测连接电连接的电路。 该电路具有当一个或多个m个感测连接与印刷电路板或芯片插座上的相应触点断开连接时变化的特性。 在测试期间，通过n个监视器连接来监控电路。 根据特性的变化确定m个感测连接中的一个或多个是否与印刷电路板或芯片插座断开。

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