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    INSPECTION SYSTEM AND METHOD FOR INSPECTING LIGHT-EMITTING DIODES
    4.
    发明公开
    INSPECTION SYSTEM AND METHOD FOR INSPECTING LIGHT-EMITTING DIODES 审中-公开

    公开(公告)号：US20240110968A1

    公开(公告)日：2024-04-04

    申请号：US18334387

    申请日：2023-06-14

    Applicant: Industrial Technology Research Institute

    Inventor： Yan-Rung Lin ,  Chung-Lun Kuo ,  Chia-Liang Yeh

    IPC: G01R31/26 ,  G01R31/44

    CPC classification number: G01R31/2635 ,  G01R31/44

    Abstract: An inspection system includes an excitation light source, a voltage-sensing film, an illumination light source, an image capture device. The excitation light source provides an excitation beam to light-emitting diodes to generate open-circuit voltages. The voltage-sensing film is at a top side of the light-emitting diodes and includes a voltage-sensing medium layer and a first electrode layer. The first electrode layer is in the voltage-sensing medium layer to provide a gain effect of the open-circuit voltages, so that the voltage-sensing medium layer senses the open-circuit voltages, and a display of the voltage-sensing medium layer is changed with a portion or all of the open-circuit voltages. The illumination light source provides an illumination beam to the voltage-sensing film to generate a sensing image according to a display change. The image capture device is on a transmission path of the sensing image and receives the sensing image to generate an inspection result.

    EYE TRACKING APPARATUS AND METHOD THEREOF
    5.
    发明申请
    EYE TRACKING APPARATUS AND METHOD THEREOF 审中-公开

    公开(公告)号：US20190056781A1

    公开(公告)日：2019-02-21

    申请号：US15846209

    申请日：2017-12-19

    Applicant: Industrial Technology Research Institute

    Inventor： Hsiao-Wei Liu ,  Yu-Ying Lan ,  Hsin-Cheng Lin ,  Chung-Lun Kuo ,  Chia-Liang Yeh

    IPC: G06F3/01 ,  G06K9/00

    Abstract: An eye tracking apparatus and an eye tracking method for the eye tracking apparatus are provided. The eye tracking apparatus includes an image capture device and a computing device. The image capture device is adapted to capture at least one face image. The computing device is coupled to the image capture device. The computing device receives the face image to obtain an eye image and identifies at least one iris region of the eye image. The computing device chooses the largest iris region from the iris regions to obtain a fitting pattern of the largest iris region and obtains a gaze point of the eye image based on the fitting pattern.

    Scattering measurement system and method
    6.
    发明授权
    Scattering measurement system and method 有权

    公开(公告)号：US10094774B2

    公开(公告)日：2018-10-09

    申请号：US15369190

    申请日：2016-12-05

    Applicant: Industrial Technology Research Institute

    Inventor： Chia-Liang Yeh ,  Yi-Chang Chen ,  Yi-Sha Ku ,  Chun-Wei Lo

    IPC: G01B11/30 ,  G01N21/47 ,  G01B11/24 ,  H01L21/66

    Abstract: A scattering measurement system is provided, including: a light source generator for generating a detection light beam with discontinuous multi-wavelengths, and generating a multi-order diffraction light beam with three-dimensional feature information when the detection light beam is incident on an object; a detector having a photosensitive array for receiving and converting the multi-order diffraction light beam into multi-order diffraction signals with the three-dimensional feature information; and a processing module for receiving the multi-order diffraction signals and comparing the multi-order diffraction signals with multi-order diffraction feature patterns in a database so as to analyze the three-dimensional feature information of the object.

    Object identification method and device
    8.
    发明授权
    Object identification method and device 有权

    公开(公告)号：US11069084B2

    公开(公告)日：2021-07-20

    申请号：US16231701

    申请日：2018-12-24

    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

    Inventor： Hsin-Yi Chen ,  Chia-Liang Yeh ,  Hsin-Cheng Lin ,  Sen-Yih Chou

    IPC: G06T7/73 ,  G06T7/90

    Abstract: An object identification method includes: establishing a training data base including a photographing distance of a training image and a training camera parameter; in photographing a target test object, obtaining a test image, a depth image, an RGB image and a test camera parameter; and based on the training database, the depth image and the test camera parameter, adjusting the RGB image wherein the adjusted RGB image having a size equivalent to the training image of the training database.

    Quality detecting device and method
    10.
    发明授权
    Quality detecting device and method 有权

    公开(公告)号：US09857314B1

    公开(公告)日：2018-01-02

    申请号：US15392713

    申请日：2016-12-28

    Applicant: Industrial Technology Research Institute

    Inventor： Fu-Cheng Yang ,  Chia-Liang Yeh ,  Wei-Hsiung Tsai ,  Keng-Li Lin ,  Yeou-Sung Lin ,  Mao-Sheng Huang

    IPC: G01J3/00 ,  G01N21/958 ,  G01N21/47 ,  G01N21/95

    CPC classification number: G01N21/958 ,  G01N21/4788 ,  G01N2021/9513

    Abstract: A device and method for detecting crystal quality of a low temperature poly-silicon (LTPS) backplane are provided, the method including: projecting narrowband light to the LTPS backplane; performing image capturing of each position on a surface of the LTPS backplane at a first angle in a first axial direction to obtain a first diffraction image, the first angle being an angle of maximum diffraction light intensity in the first axial direction; performing another image capturing of each position on the surface of the LTPS backplane at a second angle in a second axial direction to obtain a second diffraction image, the second angle being an angle of maximum diffraction light intensity in the second axial direction; and determining the crystal quality of the LTPS backplane based on a diffraction light intensity distribution obtained from the first and second diffraction images.

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