SYSTEM AND METHOD FOR NANOSCALE AXIAL LOCALIZATION AND SUPER RESOLUTION AXIAL IMAGING WITH HEIGHT-CONTROLLED MIRROR

    公开(公告)号:US20240345376A1

    公开(公告)日:2024-10-17

    申请号:US18642730

    申请日:2024-04-22

    发明人: Inhee Chung

    IPC分类号: G02B21/00

    摘要: Systems and methods for microscopic imaging include an inverted microscope directed at a sample on a coverglass, where the sample is comprised of one or more cells and one or more chromophores. A ridge separates the coverglass from a silicon dioxide layer, and a silicon mirror is situated on the silicon dioxide layer, opposite the ridge and coverglass, while a weight is situated against the silicon mirror, opposite the silicon dioxide layer. The inverted microscope uses a spatial light modulator to diffract light through a linear polarizer and a filter wheel comprised of one or more Fourier filters. A beam or beams of s-polarized light is directed to the silicon mirror to create axial light modulation with its reflection on the silicon mirror, producing image data that is captured at a light detector.