Abstract:
A radiation detector of a compact size and producing almost no image defect is disclosed, comprising a first radiation-transmissive substrate, a first adhesive layer, a second radiation-transmissive substrate, a scintillator layer and an output substrate provided with a photoelectric conversion element layer which are provided sequentially in this order, wherein an arrangement region of the scintillator layer in a planar direction of the layer includes an arrangement region of the photoelectric conversion element layer in a planar direction of the layer and an arrangement region of the first substrate in a planar direction of the substrate, and the arrangement region of the first substrate includes the arrangement region of the photoelectric conversion element layer; and when the arrangement region of the scintillator layer is divided to plural areas, a coefficient of variation of filling factor is 20% or less which is defined as a standard deviation of filling factor of phosphor of the plural areas, divided by an average value of the filling factor.
Abstract:
A method of manufacturing a scintillator panel comprising the sequential steps of: forming an electroconductive metal reflection layer on a polymer film substrate; forming a protective layer on the electroconductive metal reflection layer; cutting the polymer film substrate having thereon the electroconductive metal reflection layer and the protective layer into a prescribed size; forming a scintillator layer by a vacuum evaporation method on the protective layer of the polymer film substrate cut in the prescribed size to prepare a scintillator sheet; and sealing the scintillator sheet with sealing films provided above and below the scintillator sheet to prepare the scintillator panel, wherein static electricity is removed from the polymer film substrate through a cut surface of the electroconductive metal reflection layer when the scintillator layer is vacuum evaporated.
Abstract:
A scintillator plate comprising: (i) a radiation transmissive substrate; (ii) a light absorbing layer formed on the substrate, the light absorbing layer absorbing light of a prescribed wavelength range; and (iii) a scintillator layer formed on the light absorbing layer, the scintillator layer converting radiation to the light having a wavelength absorbable to the light absorbing layer.
Abstract:
A lower carbon film as a provisional film, a lower SiO2 film and an upper carbon film are formed, and then trenches having a wiring pattern are formed in the upper carbon film. Next, contact holes are formed through the lower carbon film and the lower SiO2 film. Then, wires and plugs are formed by filling in the trenches and contact holes with a barrier metal film and a Cu alloy film. After these process steps are repeatedly performed several times, a dummy opening is formed to extend downward through the uppermost SiO2 film. Thereafter, the carbon films are removed by performing ashing with oxygen introduced through the dummy opening. As a result, gas layers are formed to surround the wires and plugs. In this manner, a highly reliable gas-dielectric interconnect structure can be obtained by performing simple process steps.
Abstract:
After formation of a connection hole or before deposition of an insulator film, a semiconductor device is placed onto a cathode of a plasma generator. A surface of a metal silicide film such as a silicide of titanium is exposed to a plasma of a nitrogen-containing gas at 550 degrees centigrade or less. As a result of such processing, a barrier compound layer, composed of a compound of nitrogen, oxygen, metal and silicon, is formed at a near-surface region of the metal silicide film of the titanium silicide film. Thereafter, while forming a buried layer from material superior in step coverage such as an Al--Ti compound and an aluminum alloy, reaction between the metal silicide film and the buried layer in a later annealing treatment can be avoided without depositing a barrier metal such as a titanium nitride/nitride film in the connection hole. Accordingly, contact resistance, sheet resistance and junction leakage can be reduced and reliability can be improved.
Abstract:
A method of the invention for fabricating a semiconductor device includes the steps of: forming an oxide film having a non-uniform thickness on silicon; reducing at least a portion of the oxide film using gas containing a metal element, and growing a metal film containing the metal element on the silicon by reacting an exposed surface of the silicon with the gas; and removing the metal film.
Abstract:
A method of the invention for fabricating a semiconductor device includes the steps of: forming an oxide film having a non-uniform thickness on silicon; reducing at least a portion of the oxide film using gas containing a metal element, and growing a metal film containing the metal element on the silicon by reacting an exposed surface of the silicon with the gas; and removing the metal film.
Abstract:
A fluorescent labeling substance that is capable of realizing highly appropriate labeling through enhancing of the luminous efficiency of semiconductor nanoparticles or nanorods. The fluorescent labeling substance can be provided by disposing on a surface of shell of nanorods or nanoparticles having a modification group capable of adsorption with a biosubstance, such as protein, nucleic acid or antibody, a region devoid of the above modification group.
Abstract:
A scintillator panel containing a substrate having thereon a reflection layer, and intermediate layer, and a scintillator layer in the sequence set forth, wherein the intermediate layer contains a resin having a glass transition temperature, and the intermediate layer has been subjected to a process of heating to a temperature of equal to or grater than the glass transition temperature of the resin.
Abstract:
A radiation image detector comprising: a scintillator panel comprising a substrate having thereon a phosphor layer; a protective cover provided on a side of the substrate opposite the phosphor layer, wherein a radiation is incident on the side of the substrate opposite the phosphor layer; a light receiving element provided on a side of the scintillator panel opposite the protective cover, the light receiving element having a plurality of two-dimensionally arrayed light receiving pixels which photoelectrically convert light generated by the scintillator panel, wherein distance D satisfies: 0.2 mm≦D≦2.0 mm wherein D is a distance between following (i) and (ii): (i) a surface of the protective cover facing the scintillator panel; and (ii) a surface of the substrate on which the phosphor layer is provided.
Abstract translation:一种放射线图像检测器,包括:闪烁体面板,包括其上具有磷光体层的衬底; 设置在与所述荧光体层相对的所述基板的一侧的保护罩,其中,所述基板的与所述荧光体层相反的一侧入射; 光接收元件设置在与保护罩相对的闪烁器面板的一侧上,该光接收元件具有多个二维阵列的受光像素,其对由闪烁体面板产生的光进行光电转换,其中距离D满足:0.2mm < = D <= 2.0mm其中D是以下(i)和(ii)之间的距离:(i)面向闪烁体面板的保护盖的表面; 和(ii)设置有荧光体层的基板的表面。