INTERROGATION OF ACOUSTIC WAVE SENSORS

    公开(公告)号:US20220170799A1

    公开(公告)日:2022-06-02

    申请号:US17441109

    申请日:2020-03-19

    Applicant: FREC'N'SYS

    Abstract: An interrogation device for interrogating an acoustic wave sensor device comprises a transmission antenna; a reception antenna; and a processor configured for determining in-phase components I and quadrature components Q of a response signal received from the sensor in N consecutive frames of the response signal; determining moduli |Y| of the in-phase components I and quadrature components Q; determining a first norm M based on the moduli |Y|; determining a first weighting function W based on the first norm M and the moduli |Y|; determining in-phase components I and quadrature components Q of an N+1th frame of the response signal; determining moduli |Y| of in-phase components I and quadrature components Q of the N+1th frame; and applying the first weighting function W to the determined moduli |Y| of the response signal in the N+1th frame to obtain weighted moduli |Y|w of the response signal for the N+1th frame.

    COMPOSITE SUBSTRATES FOR SAW TAGS OR RFID AND SENSORS APPLICATIONS

    公开(公告)号:US20210034935A1

    公开(公告)日:2021-02-04

    申请号:US16980324

    申请日:2019-03-14

    Applicant: FREC'N'SYS

    Abstract: A surface acoustic wave tag device is disclosed, comprising: an acoustic wave propagating substrate, at least one transducer structure comprising inter-digitated comb electrodes, and at least one reflecting means, the reflecting means comprising at least one reflector, wherein the acoustic wave propagation substrate is a composite substrate comprising a base substrate and a piezoelectric layer, wherein the crystallographic orientation of the piezoelectric layer with respect to the base substrate is such that the propagation of a shear wave inside the piezoelectric layer and in the direction of propagation corresponding to the acoustic wave is enabled. A physical quantity determining device and a fabrication method of such surface acoustic wave tag device are also disclosed.

    Resonant cavity surface acoustic wave (SAW) filters

    公开(公告)号:US11848663B2

    公开(公告)日:2023-12-19

    申请号:US17263880

    申请日:2019-07-25

    Applicant: FREC'N'SYS

    Abstract: A coupled cavity filter structure that uses a surface acoustic wave, in particular, a guided surface acoustic wave, comprises an acoustic wave propagating substrate, at least one input transducer structure and one output transducer structure, provided over the substrate, each comprising inter-digitated comb electrodes, at least one reflecting structure comprising at least one or more metallic strips positioned at a distance and in between the input and output transducer structures, in the direction of propagation of an acoustic wave. The acoustic wave propagating substrate is a composite substrate comprising a base substrate and a piezoelectric layer. In additional embodiments, a coupled cavity filter structure comprises a groove. In additional embodiments, a SAW ladder filter device comprises at least two coupled cavity filter structures as described herein, wherein the at least two coupled cavity filter structures are positioned on a single line.

    SURFACE ACOUSTIC WAVE SENSOR DEVICE FORMED ON A QUARTZ SUBSTRATE

    公开(公告)号:US20230361751A1

    公开(公告)日:2023-11-09

    申请号:US18042948

    申请日:2021-03-03

    Applicant: FREC'N'SYS

    CPC classification number: H03H9/02551 H03H9/25 H03H9/02574

    Abstract: An acoustic wave sensor device comprises a quartz material layer comprising a planar surface, a first interdigitated transducer formed over the planar surface of the quartz material layer, a first reflection structure formed over the planar surface of the quartz material layer, a second reflection structure formed over the planar surface of the quartz material layer, a first resonance cavity formed between the first interdigitated transducer and the first reflection structure and a second resonance cavity formed between the first interdigitated transducer and the second reflection structure. The planar surface of the quartz material layer is defined by a crystal cut of a quartz material of the quartz material layer with angles φ in the range of −14° to −24°, θ in the range of −25° to −45° and ψ in the range of +8° to +28°.

    SURFACE ACOUSTIC WAVE DEVICE ON COMPOSITE SUBSTRATE

    公开(公告)号:US20210028760A1

    公开(公告)日:2021-01-28

    申请号:US17042768

    申请日:2019-03-20

    Applicant: FREC'N'SYS

    Abstract: A surface acoustic wave device using a longitudinally polarized guided wave comprises a composite substrate comprising a piezoelectric layer formed over a base substrate, wherein the crystalline orientation of the piezoelectric layer with respect to the base substrate is such that, the phase velocity of the longitudinally polarized wave is below the critical phase velocity of the base substrate at which wave guiding within the piezoelectric layer vanishes. A method of fabrication of such surface acoustic wave device is also disclosed.

    SURFACE ACOUSTIC WAVE SENSOR DEVICE
    7.
    发明公开

    公开(公告)号:US20240159710A1

    公开(公告)日:2024-05-16

    申请号:US18548847

    申请日:2022-03-03

    Applicant: FREC'N'SYS

    CPC classification number: G01N29/022 H03H9/14502 H03H9/25 G01N2291/0422

    Abstract: An acoustic wave sensor device comprises a first interdigitated transducer, a first reflection structure, a second reflection structure, a first resonance cavity comprising a first upper surface and formed between the first interdigitated transducer and the first reflection structure, and a second resonance cavity comprising a second upper surface and formed between the first interdigitated transducer and the second reflection structure. At least one of the first and second upper surfaces is covered at least partly by a metalization layer or a passivation layer. The present invention relates also to an acoustic wave sensor assembly.

    DIFFERENTIAL ACOUSTIC WAVE PRESSURE SENSORS

    公开(公告)号:US20220326102A1

    公开(公告)日:2022-10-13

    申请号:US17753510

    申请日:2020-09-04

    Applicant: FREC'N'SYS

    Abstract: An acoustic wave pressure sensor device configured to measure a pressure, comprising a substrate configured to bend when pressure is applied to the substrate such that an area of a first kind of strain and an area of a second kind of strain are formed in the substrate; an interdigitated transducer formed over the substrate; a first Bragg mirror formed over the substrate and arranged on one side of the interdigitated transducer; a second Bragg mirror formed over the substrate and arranged on another side of the interdigitated transducer; a first resonance cavity formed between the interdigitated transducer and the first Bragg mirror; a second resonance cavity formed between the interdigitated transducer and the second Bragg mirror; and wherein the first resonance cavity is formed over the area of the first kind of strain and the second resonance cavity is formed over the area of the second kind of strain.

    RESONANT CAVITY SURFACE ACOUSTIC WAVE (SAW) FILTERS

    公开(公告)号:US20210265980A1

    公开(公告)日:2021-08-26

    申请号:US17263880

    申请日:2019-07-25

    Applicant: FREC'N'SYS

    Abstract: A coupled cavity filter structure that uses a surface acoustic wave, in particular, a guided surface acoustic wave, comprises an acoustic wave propagating substrate, at least one input transducer structure and one output transducer structure, provided over the substrate, each comprising inter-digitated comb electrodes, at least one reflecting structure comprising at least one or more metallic strips, positioned at a distance and in between the input and output transducer structures, in the direction of propagation of an acoustic wave. The acoustic wave propagating substrate is a composite substrate comprising a base substrate and a piezoelectric layer. In additional embodiments, a coupled cavity filter structure comprises a groove. In additional embodiments, a SAW ladder filter device comprises at least two coupled cavity filter structures as described herein, wherein the at least two coupled cavity filter structures are positioned on a single line.

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