INTERROGATION OF ACOUSTIC WAVE SENSORS

    公开(公告)号:US20220170799A1

    公开(公告)日:2022-06-02

    申请号:US17441109

    申请日:2020-03-19

    Applicant: FREC'N'SYS

    Abstract: An interrogation device for interrogating an acoustic wave sensor device comprises a transmission antenna; a reception antenna; and a processor configured for determining in-phase components I and quadrature components Q of a response signal received from the sensor in N consecutive frames of the response signal; determining moduli |Y| of the in-phase components I and quadrature components Q; determining a first norm M based on the moduli |Y|; determining a first weighting function W based on the first norm M and the moduli |Y|; determining in-phase components I and quadrature components Q of an N+1th frame of the response signal; determining moduli |Y| of in-phase components I and quadrature components Q of the N+1th frame; and applying the first weighting function W to the determined moduli |Y| of the response signal in the N+1th frame to obtain weighted moduli |Y|w of the response signal for the N+1th frame.

    DIFFERENTIAL ACCOUSTIC WAVE SENSORS

    公开(公告)号:US20220341881A1

    公开(公告)日:2022-10-27

    申请号:US17753508

    申请日:2020-09-04

    Applicant: FREC'N'SYS

    Abstract: An acoustic wave sensor device, comprising an interdigitated transducer; a first reflection structure arranged on one side of the interdigitated transducer, and a second reflection structure arranged on another side of the interdigitated transducer; a first resonance cavity comprising a first upper surface and formed between the interdigitated transducer and the first reflection structure; a second resonance cavity comprising a second upper surface and formed between the interdigitated transducer and the second reflection structure; and wherein the second upper surface comprises a physical and/or chemical modification as compared to the first upper surface.

    SURFACE ACOUSTIC WAVE SENSOR DEVICE FORMED ON A QUARTZ SUBSTRATE

    公开(公告)号:US20230361751A1

    公开(公告)日:2023-11-09

    申请号:US18042948

    申请日:2021-03-03

    Applicant: FREC'N'SYS

    CPC classification number: H03H9/02551 H03H9/25 H03H9/02574

    Abstract: An acoustic wave sensor device comprises a quartz material layer comprising a planar surface, a first interdigitated transducer formed over the planar surface of the quartz material layer, a first reflection structure formed over the planar surface of the quartz material layer, a second reflection structure formed over the planar surface of the quartz material layer, a first resonance cavity formed between the first interdigitated transducer and the first reflection structure and a second resonance cavity formed between the first interdigitated transducer and the second reflection structure. The planar surface of the quartz material layer is defined by a crystal cut of a quartz material of the quartz material layer with angles φ in the range of −14° to −24°, θ in the range of −25° to −45° and ψ in the range of +8° to +28°.

    DIFFERENTIAL ACOUSTIC WAVE PRESSURE SENSORS

    公开(公告)号:US20220326102A1

    公开(公告)日:2022-10-13

    申请号:US17753510

    申请日:2020-09-04

    Applicant: FREC'N'SYS

    Abstract: An acoustic wave pressure sensor device configured to measure a pressure, comprising a substrate configured to bend when pressure is applied to the substrate such that an area of a first kind of strain and an area of a second kind of strain are formed in the substrate; an interdigitated transducer formed over the substrate; a first Bragg mirror formed over the substrate and arranged on one side of the interdigitated transducer; a second Bragg mirror formed over the substrate and arranged on another side of the interdigitated transducer; a first resonance cavity formed between the interdigitated transducer and the first Bragg mirror; a second resonance cavity formed between the interdigitated transducer and the second Bragg mirror; and wherein the first resonance cavity is formed over the area of the first kind of strain and the second resonance cavity is formed over the area of the second kind of strain.

    Differential acoustic wave pressure sensor with improved signal-to-noise ratio

    公开(公告)号:US11828668B2

    公开(公告)日:2023-11-28

    申请号:US17753510

    申请日:2020-09-04

    Applicant: FREC'N'SYS

    CPC classification number: G01L9/0025 G01L1/165 G01L9/008

    Abstract: An acoustic wave pressure sensor device configured to measure a pressure, comprising a substrate configured to bend when pressure is applied to the substrate such that an area of a first kind of strain and an area of a second kind of strain are formed in the substrate; an interdigitated transducer formed over the substrate; a first Bragg mirror formed over the substrate and arranged on one side of the interdigitated transducer; a second Bragg mirror formed over the substrate and arranged on another side of the interdigitated transducer; a first resonance cavity formed between the interdigitated transducer and the first Bragg mirror; a second resonance cavity formed between the interdigitated transducer and the second Bragg mirror; and wherein the first resonance cavity is formed over the area of the first kind of strain and the second resonance cavity is formed over the area of the second kind of strain.

    ACOUSTIC WAVE SENSOR AND INTERROGATION OF THE SAME

    公开(公告)号:US20220173721A1

    公开(公告)日:2022-06-02

    申请号:US17599149

    申请日:2020-03-19

    Applicant: FREC'N'SYS

    Abstract: A method of interrogating an acoustic wave sensor comprises transmitting, by an interrogator, an interrogation radiofrequency signal to the acoustic wave sensor by way of a transmission antenna, receiving, by the interrogator, a response radiofrequency signal from the acoustic wave sensor by way of a reception antenna, and processing by a processing means of the interrogator the received response radiofrequency signal to obtain in-phase and quadrature components both in the time domain and the frequency domain, determining by the processing means perturbations of the obtained in-phase and quadrature components both in the time domain and the frequency domain and determining by the processing means a value of a measurand based on the detected perturbations.

Patent Agency Ranking