PREDICTION APPARATUS AND METHOD FOR OPTICAL SOURCE

    公开(公告)号:US20240319612A1

    公开(公告)日:2024-09-26

    申请号:US18576277

    申请日:2022-06-06

    申请人: Cymer, LLC

    IPC分类号: G03F7/00 G03F7/20

    摘要: A prediction apparatus is in communication with an optical source configured to produce a pulsed light beam for use by a photolithography exposure apparatus. The prediction apparatus includes: a photolithography module in communication with the photolithography exposure apparatus and configured to receive an identifier, the received identifier lacking data relating to an actual firing pattern defining properties of the pulsed light beam; and an optical source module in communication with the optical source, the optical source module configured to provide a forecast firing pattern to the optical source. The forecast firing pattern is associated with and determined from the received identifier, and forecasts one or more properties of the actual firing pattern.

    GAS CONTROL APPARATUS FOR GAS DISCHARGE STAGE

    公开(公告)号:US20240291226A1

    公开(公告)日:2024-08-29

    申请号:US18571826

    申请日:2022-06-02

    申请人: Cymer, LLC

    摘要: A gas control apparatus includes a control system in communication with a gas discharge chamber. The control system includes a performance monitoring module configured to, during standard mode of operation of the gas discharge chamber and in between performance of gas recovery schemes on the gas discharge chamber that use a gas recovery setting: compare one or more performance parameters of the gas discharge chamber to respective thresholds; determine whether the gas recovery setting needs to be adjusted based on the comparison; and adjust the value for the gas recovery setting based on the determination. The control system includes a gas recovery module configured to perform the gas recovery scheme, the gas recovery module being configured to access the most recently adjusted value for the gas recovery setting from the performance monitoring module when performing the current gas recovery scheme.

    Burst statistics data aggregation filter

    公开(公告)号:US12007696B2

    公开(公告)日:2024-06-11

    申请号:US17779290

    申请日:2020-11-18

    申请人: Cymer, LLC

    IPC分类号: G03F7/20 G03F7/00 H01S3/13

    摘要: A system includes a laser source configured to generate one or more bursts of laser pulses and a data collection and analysis system. The data collection and analysis system is configured to receive, from the laser source, data associated with the one or more bursts of laser pulses and determine, based on the received data, that the one or more bursts of laser pulses are for external use. The data collection and analysis system is further configured to determine, based on the received data, whether the one or more bursts of laser pulses are for an on-wafer operation or are for a calibration operation.

    Gas monitoring system
    6.
    发明授权

    公开(公告)号:US11988966B2

    公开(公告)日:2024-05-21

    申请号:US15734359

    申请日:2019-05-16

    申请人: Cymer, LLC

    摘要: A system includes an optical source configured to emit a pulsed light beam, the optical source comprising one or more chambers, each of the one or more chambers configured to hold a gaseous gain medium, the gaseous gain medium being associated with an assumed gas life; at least one detection module configured to: receive and analyze data related to the pulsed light beam, and produce a beam quality metric based on the data related to the pulsed light beam; and a monitoring module configured to: analyze the beam quality metric, determine a health status of the gaseous gain medium based on the analysis of the beam quality metric, and produce a status signal based on the determined health status, the status signal indicating whether to extend use of the gaseous gain medium beyond the assumed gas life or to end use of the gaseous gain medium.

    METHOD OF COMPENSATING WAVELENGTH ERROR INDUCED BY REPETITION RATE DEVIATION

    公开(公告)号:US20240036475A1

    公开(公告)日:2024-02-01

    申请号:US18481524

    申请日:2023-10-05

    申请人: Cymer, LLC

    IPC分类号: G03F7/00 H01S3/08 H01S3/10

    摘要: A radiation system for controlling pulses of radiation comprising an optical element configured to interact with the pulses of radiation to control a characteristic of the pulses of radiation, an actuator configured to actuate the optical element according to a control signal received from a controller, the control signal at least partially depending on a reference pulse repetition rate of the radiation system and, a processor configured to receive pulse information from the controller and use the pulse information to determine an adjustment to the control signal. The radiation system may be used to improve an accuracy of a lithographic apparatus operating in a multi-focal imaging mode.

    Determination of measurement error in an etalon

    公开(公告)号:US11860036B2

    公开(公告)日:2024-01-02

    申请号:US17928384

    申请日:2021-05-25

    申请人: Cymer, LLC

    摘要: Information relating to an etalon is accessed, the etalon being associated with a calibration parameter having a pre-set default value, the etalon being configured to produce an interference pattern including a plurality of fringes from a received light beam, and the information relating to the etalon including first spatial information related to a first fringe of the plurality of fringes and second spatial information related to a second fringe of the plurality of fringes. A first wavelength value of the received light beam is determined based on the spatial information related to the first fringe and an initial value of the calibration parameter. A second wavelength value of the received light beam is determined based on the spatial information related to the second fringe and the initial value of the calibration parameter. The first wavelength value and the second wavelength value are compared to determine a measurement error value.