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    Assembly suitable for identifying a code sequence of a biomolecule in a gel embodiment
    81.
    发明授权
    Assembly suitable for identifying a code sequence of a biomolecule in a gel embodiment 失效
    适合于在凝胶实施例中识别生物分子的代码序列的装配

    公开(公告)号：US5609744A

    公开(公告)日：1997-03-11

    申请号：US405481

    申请日：1995-03-16

    Applicant: Frederic Zenharusern ,  Hemantha K. Wickramasinghe

    Inventor： Frederic Zenharusern ,  Hemantha K. Wickramasinghe

    IPC: G01N27/447 ,  G01Q60/18 ,  B01D61/42 ,  C12M3/00

    CPC classification number: G01Q60/22 ,  B82Y20/00 ,  B82Y35/00 ,  Y10S977/853

    Abstract: An assembly suitable for identifying a code sequence of at least a portion of a biomolecule in a gel embodiment. The assembly comprises first means for migrating and separating a portion of a biomolecule in a gel; second means comprising a near-field probe for generating a super-resolution chemical analysis of a portion of a biomolecule; and, third means for correlating the super-resolution chemical analysis of the portion of the biomolecule with a broad spectral content of a referent biomolecule, for generating a code sequencing of the portion of the biomolecule.

    Abstract translation: 一种适于识别凝胶实施方案中生物分子的至少一部分的编码序列的组合体。 组件包括用于迁移和分离凝胶中生物分子的一部分的第一装置; 第二装置包括用于产生生物分子的一部分的超分辨率化学分析的近场探针; 以及用于将生物分子部分的超分辨率化学分析与参照生物分子的宽光谱含量相关联的第三装置，用于产生该部分生物分子的编码测序。

    Method and apparatus for performing near-field optical microscopy
    83.
    发明授权
    Method and apparatus for performing near-field optical microscopy 失效
    用于进行近场光学显微镜的方法和装置

    公开(公告)号：US5479024A

    公开(公告)日：1995-12-26

    申请号：US288260

    申请日：1994-08-11

    Applicant: Paul E. Hillner ,  Manfred Radmacher ,  Paul K. Hansma

    Inventor： Paul E. Hillner ,  Manfred Radmacher ,  Paul K. Hansma

    IPC: G01Q60/18 ,  G01N21/64 ,  G02B21/00

    CPC classification number: G01Q60/22 ,  B82Y20/00 ,  B82Y35/00 ,  Y10S977/862

    Abstract: A near-field optical microscope and method of microscopy in which a probe including a flexible cantilever having a sharp tip is positioned in proximity to a sample. In one embodiment, a region of the sample is irradiated with light, and one or more portions of this region are caused to fluoresce. A quenching element is provided at the tip of the probe to quench the fluorescence of these portions within the region. The amount of quenching is determined while the sample is scanned to produce a high resolution image of the irradiated region of the sample. In another embodiment, the fluorescence imparted to one or more portions of the irradiated region is enhanced by the interaction of an optically active element disposed at the tip portion of the cantilever probe which provides for sharper images with greater signal-to-noise ratios. The near-field optical microscopes according to the present invention can also be used to measure the reflection/transmission or absorption characteristics from a sample region within a distance of one wavelength of light away from the sample surface. The microscopes also include means for producing a relative scanning motion between the sample and the probe such as by raster scanner or circular scanning, for example.

    Abstract translation: 近场光学显微镜和显微镜方法，其中包括具有尖锐尖端的柔性悬臂的探针位于样品附近。 在一个实施例中，用光照射样品的区域，并使该区域的一个或多个部分发荧光。 在探针的尖端处提供淬火元件以淬灭该区域内的这些部分的荧光。 在扫描样品以产生样品的照射区域的高分辨率图像时确定淬灭量。 在另一个实施方案中，通过设置在悬臂探针的尖端部分处的光学活性元件的相互作用，赋予被照射区域的一个或多个部分的荧光增强，其提供更清晰的图像和更大的信噪比。 根据本发明的近场光学显微镜还可以用于从远离样品表面的一个波长的光的距离内的样品区域测量反射/透射或吸收特性。 显微镜还包括用于例如通过光栅扫描仪或圆形扫描在样品和探针之间产生相对扫描运动的装置。

    Optically guided macroscopic-scan-range/nanometer resolution probing system
    84.
    发明授权
    Optically guided macroscopic-scan-range/nanometer resolution probing system 失效
    光学宏观扫描范围/纳米分辨率探测系统

    公开(公告)号：US5426302A

    公开(公告)日：1995-06-20

    申请号：US54457

    申请日：1993-04-28

    Applicant: Herschel Marchman ,  Grover C. Wetsel

    Inventor： Herschel Marchman ,  Grover C. Wetsel

    IPC: G01Q20/02 ,  G01Q60/10 ,  G01Q60/18 ,  H01J37/00

    CPC classification number: G01Q60/22 ,  B82Y20/00 ,  B82Y35/00 ,  Y10S977/868

    Abstract: A large-nanostructure probe with optically guided macroscopic scanning is disclosed for high-resolution imaging and characterization of nanostructures. The invention contemplates the use of a course positioning system, which comprises one or more quadratic index fiber optic lenses in conjunction with an optical microscope. A magnifying probe is placed in close proximity to a sample under inspection. The fiber optic lenses of the coarse positioning system are used to noninvasively carry the image of a sample-to-probe junction to the optical microscope. The optical microscope further magnifies the image, allowing for precise positioning of the probe tip to within 1 .mu.m of a desired feature on the sample surface. For ease of viewing, the magnified image from the microscope may be displayed on a monitor using a charge coupled device ("CCD") camera, if so desired. Also disclosed is a long-range probing system wherein the probe tip may be one of a variety of measurement or probing apparatus. For example, a particularly effective configuration of the long-range probing system is one in which the optical viewing system of the present invention serves as part of a coarse approach system for a scanning tunneling microscope probe.

    Abstract translation: 公开了具有光学引导的宏观扫描的大型纳米结构探针用于纳米结构的高分辨率成像和表征。 本发明考虑了使用课程定位系统，其包括与光学显微镜结合的一个或多个二次折射率光纤透镜。 放大探头放置在靠近被检样品的位置。 粗定位系统的光纤透镜用于将样品与探针结的图像无侵入地携带到光学显微镜。 光学显微镜进一步放大图像，允许将探针尖端精确定位在样品表面上所需特征的1微米以内。 为了便于观看，如果需要，来自显微镜的放大图像可以使用电荷耦合器件（“CCD”）相机显示在监视器上。 还公开了一种远程探测系统，其中探针尖端可以是各种测量或探测装置之一。 例如，长距离探测系统的特别有效的构造是其中本发明的光学观察系统用作扫描隧道显微镜探针的粗略方法系统的一部分。

    Method for controlling movement of neutral atom and apparatus for carrying out the same
    85.
    发明授权
    Method for controlling movement of neutral atom and apparatus for carrying out the same 失效
    用于控制中性原子的运动的方法及其执行装置

    公开(公告)号：US5337324A

    公开(公告)日：1994-08-09

    申请号：US22519

    申请日：1993-02-25

    Applicant: Motoichi Ohtsu ,  Hirokazu Hori

    Inventor： Motoichi Ohtsu ,  Hirokazu Hori

    IPC: B01J19/12 ,  G01Q60/18 ,  G02B21/32 ,  G21K1/00 ,  H01L21/20 ,  H01S3/00 ,  H05H3/04 ,  H01S3/13

    CPC classification number: H05H3/04 ,  Y10S372/701

    Abstract: In order to control the movement of a single neutral atom or a small number of neutral atoms to trap the neutral atom or atoms at a distal end of an optical fiber probe, a laser light having a frequency which is slightly lower than a resonance frequency of the atom is made incident upon a proximal end of the optical fiber probe, and an evanescent light is generated from a sharpened distal end of the optical fiber probe whose tip is sharpened such that its radius of curvature is smaller than one wavelength of the laser light. The distal end of the optical fiber probe is brought close to the neutral atom or atoms to trap the neutral atom or atoms within an existing volume of the evanescent light. When the light frequency is changed to a value slightly higher than the resonance frequency of the atom, the trapped neutral atom or atoms are pushed out of the existing volume of the evanescent light. The crystal growth can be performed with a single atom level.

    Abstract translation: 为了控制单个中性原子或少量中性原子的移动以将中性原子或原子捕获在光纤探针的远端，具有稍低于共振频率的频率的激光 原子入射到光纤探针的近端，并且从尖端尖锐的光纤探针的尖锐的远端产生ev逝的光，使得其曲率半径小于激光的一个波长 。 光纤探头的远端靠近中性原子或原子，以将中性原子或原子捕获在消逝光的现有体积内。 当光频率变为略高于原子的共振频率的值时，被俘获的中性原子或原子被推出现在的瞬逝光的体积。 晶体生长可以用单个原子水平进行。

    System and method for a non-tapping mode scattering-type scanning near-field optical microscopy
    86.
    发明授权
    System and method for a non-tapping mode scattering-type scanning near-field optical microscopy 有权

    公开(公告)号：US12000861B2

    公开(公告)日：2024-06-04

    申请号：US17887890

    申请日：2022-08-15

    Applicant: Lehigh University

    Inventor： Haomin Wang ,  Xiaoji Xu

    IPC: G01Q60/06 ,  G01Q60/18 ,  G01Q60/22

    CPC classification number: G01Q60/06 ,  G01Q60/22 ,  G01Q60/18

    Abstract: Systems, apparatuses, and methods for realizing a peak-force scattering scanning near-field optical microscopy (PF-SNOM). Conventional scattering-type microscopy (s-SNOM) techniques uses tapping mode operation and lock-in detections that do not provide direct tomographic information with explicit tip-sample distance. Using a peak force scattering-type scanning near-field optical microscopy with a combination of peak force tapping mode and time-gated light detection, PF-SNOM enables direct sectioning of vertical near-field signals from a sample surface for both three-dimensional near-field imaging and spectroscopic analysis. PF-SNOM also delivers a spatial resolution of 5 nm and can simultaneously measure mechanical and electrical properties together with optical near-field signals.

    Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy
    87.
    发明授权
    Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy 有权

    公开(公告)号：US10082523B2

    公开(公告)日：2018-09-25

    申请号：US15693204

    申请日：2017-08-31

    Applicant: Anasys Instruments

    Inventor： Honghua Yang ,  Kevin Kjoller ,  Sam Berweger ,  Craig Prater

    IPC: G01Q60/18 ,  G01N21/47 ,  G01N21/35

    CPC classification number: G01Q60/18 ,  G01N21/35 ,  G01N21/39 ,  G01N21/47 ,  G01N21/4738 ,  G01N2201/0612 ,  G01N2201/10 ,  G01Q30/02 ,  G01Q60/22

    Abstract: This invention involves measurement of optical properties of materials with sub-micron spatial resolution through infrared scattering scanning near field optical microscopy (s-SNOM). Specifically, the current invention provides substantial improvements over the prior art by achieving high signal to noise, high measurement speed and high accuracy of optical amplitude and phase. Additionally, it some embodiments, it eliminates the need for an in situ reference to calculate wavelength dependent spectra of optical phase, or absorption spectra. These goals are achieved via improved asymmetric interferometry where the near-field scattered light is interfered with a reference beam in an interferometer. The invention achieves dramatic improvements in background rejection by arranging a reference beam that is much more intense than the background scattered radiation. Combined with frequency selective demodulation techniques, the near-field scattered light can be efficiently and accurately discriminated from background scattered light. These goals are achieved via a range of improvements including a large dynamic range detector, careful control of relative beam intensities, and high bandwidth demodulation techniques. In other embodiments, phase and amplitude stability are improved with a novel s-SNOM configuration. In other embodiments an absorption spectrum may be obtained directly by comparing properties from a known and unknown region of a sample as a function of illumination center wavelength.

    METHOD AND APARATUS FOR INFRARED SCANNING NEAR-FIELD OPTICAL MICROSCOPY BASED ON PHOTOTHERMAL EFFECT
    88.
    发明申请
    METHOD AND APARATUS FOR INFRARED SCANNING NEAR-FIELD OPTICAL MICROSCOPY BASED ON PHOTOTHERMAL EFFECT 审中-公开

    公开(公告)号：US20180259553A1

    公开(公告)日：2018-09-13

    申请号：US15917210

    申请日：2018-03-09

    Applicant: Anasys Instruments Corp.

    Inventor： Honghua Yang ,  Craig Prater

    IPC: G01Q60/18 ,  G01N21/39 ,  G01N21/65

    Abstract: Systems and methods may be provided for measuring an infrared absorption of a sub micrometer region of a sample. An Infrared light source may illuminate a sample in a region that is interacting with the tip of a Scanning Probe Microscope (SPM), stimulating the sample in a way that produces measurable optical properties related to Infrared absorption of the sample region. A probe light source is directed at the region of the sample and SPM tip, and probe light emanating from the tip and sample region is collected. The collected light may be used to derive infrared absorption spectrum information of the sample region, possibly on a sub-micron scale.

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