Nonvolatile memory storage system
    51.
    发明授权

    公开(公告)号:US10229749B2

    公开(公告)日:2019-03-12

    申请号:US15475670

    申请日:2017-03-31

    摘要: A nonvolatile memory storage system includes a plurality of memory cells and a memory controller configured to transmit a read command to a nonvolatile memory device based on a plurality of read voltages. The nonvolatile memory device performs a first read operation on a first level among the N levels based on a first read voltage among the plurality of read voltages, counts the number of on-cells that respond to the first read voltage among the plurality of memory cells, and adjusts a level of a second read voltage to be used to perform a second read operation on the first level or a second level among the N levels among the plurality of read voltages according to a comparison result of the counted number of on-cells and the number of reference cells.

    Method of operating a memory system having an erase control unit
    56.
    发明授权
    Method of operating a memory system having an erase control unit 有权
    一种具有擦除控制单元的存储系统的操作方法

    公开(公告)号:US09437310B2

    公开(公告)日:2016-09-06

    申请号:US14827930

    申请日:2015-08-17

    摘要: A method of operating a memory system including a nonvolatile memory including a memory block, and a memory controller including an erase control unit, includes performing pre-reading a plurality of memory cells connected to a selected word line of the memory block, generating an off cell count based on the pre-reading result, by operation of the erase control unit, comparing the off cell count with a reference value to generate a comparison result, and changing an erase operation condition based on the comparison result, by operation of the nonvolatile memory, and erasing the memory block according to the changed erase operation condition.

    摘要翻译: 一种操作包括包括存储器块的非易失性存储器的存储器系统的方法和包括擦除控制单元的存储器控​​制器,包括执行预读取连接到所述存储器块的选定字线的多个存储器单元,产生关断 基于预读取结果的单元计数,通过擦除控制单元的操作,将关闭单元计数与参考值进行比较以产生比较结果,以及通过非易失性存储器的操作来改变基于比较结果的擦除操作条件 存储器,并根据改变的擦除操作条件擦除存储器块。

    METHODS OF OPERATING MEMORY SYSTEMS FOR SUB-BLOCK ERASE OPERATION
    57.
    发明申请
    METHODS OF OPERATING MEMORY SYSTEMS FOR SUB-BLOCK ERASE OPERATION 有权
    操作用于子块擦除操作的存储器系统的方法

    公开(公告)号:US20160210083A1

    公开(公告)日:2016-07-21

    申请号:US15001275

    申请日:2016-01-20

    IPC分类号: G06F3/06

    摘要: A method of operating a memory system including memory blocks, each including memory cells and divided into at least first and second sub-blocks. The method includes performing a program operation on memory cells connected to at least one word line of the first and second sub-blocks using a first program method of programming data having a first number of bits, performing an erase operation on the first sub-block, and detecting a state of distribution of threshold voltages of memory cells of the first and second sub-blocks, and determining whether a program operation is to be performed on memory cells connected to a second adjacent word line including at least one word line adjacent to the first sub-block, out of the memory cells of the second sub-block, by using a second program method of programming data having a second number of bits, based on the detecting.

    摘要翻译: 一种操作包括存储器块的存储器系统的方法,每个存储器块包括存储器单元并被分成至少第一和第二子块。 该方法包括使用编程具有第一位数的数据的第一编程方法对连接到第一和第二子块的至少一个字线的存储器单元执行编程操作,对第一子块执行擦除操作 并且检测第一和第二子块的存储器单元的阈值电压的分布状态,并且确定是否对连接到第二相邻字线的存储器单元执行编程操作,该第二相邻字线包括与...相邻的至少一个字线 基于检测,通过使用具有第二位数的数据的第二编程方法,在第二子块的存储单元之外的第一子块。

    SEMICONDUCTOR MEMORY SYSTEMS USING REGRESSION ANALYSIS AND READ METHODS THEREOF
    58.
    发明申请
    SEMICONDUCTOR MEMORY SYSTEMS USING REGRESSION ANALYSIS AND READ METHODS THEREOF 审中-公开
    使用回归分析的半导体存储器系统及其读取方法

    公开(公告)号:US20150332778A1

    公开(公告)日:2015-11-19

    申请号:US14811222

    申请日:2015-07-28

    IPC分类号: G11C16/26

    摘要: A memory system includes: a bit counter and a regression analyzer. The bit counter is configured to generate a plurality of count values based on data read from selected memory cells using a plurality of different read voltages, each of the plurality of count values being indicative of a number of memory cells of a memory device having threshold voltages between pairs of the plurality of different read voltages. The regression analyzer is configured to determine read voltage for the selected memory cells based on the plurality of count values using regression analysis.

    摘要翻译: 存储器系统包括:位计数器和回归分析器。 位计数器被配置为基于使用多个不同的读取电压从所选择的存储器单元读取的数据生成多个计数值,多个计数值中的每一个表示具有阈值电压的存储器件的存储单元的数量 在多个不同读取电压的对之间。 回归分析器被配置为使用回归分析来基于多个计数值来确定所选择的存储器单元的读取电压。

    Non-volatile random access memory device and data read method thereof
    60.
    发明授权
    Non-volatile random access memory device and data read method thereof 有权
    非易失性随机存取存储器件及其数据读取方法

    公开(公告)号:US09093145B2

    公开(公告)日:2015-07-28

    申请号:US14141609

    申请日:2013-12-27

    IPC分类号: G11C7/00 G11C13/00

    摘要: A nonvolatile random access memory device includes a plurality of memory cells configured to store data therein, a plurality of reference cells separate from the memory cells, the reference cells each configured to output a corresponding reference cell signal, and a read/write circuit. The read/write circuit is configured to generate from the reference cell signals a reference signal which is variable to have a plurality of different reference levels. The read/write circuit is further configured to identify, in response to the reference signal, a logic state among a first logic state and a second logic state for each of one or more selected memory cells, and to output read data corresponding to the identified logic state.

    摘要翻译: 非易失性随机存取存储器件包括多个存储器单元,其被配置为在其中存储数据,多个参考单元与存储器单元分离,每个参考单元被配置为输出相应的参考单元信号,以及读/写电路。 读/写电路被配置为从参考单元信号产生可变为具有多个不同参考电平的参考信号。 读/写电路还被配置为响应于参考信号识别一个或多个所选择的存储器单元中的每一个的第一逻辑状态和第二逻辑状态之间的逻辑状态,并且输出与所识别的对应的读取数据 逻辑状态。