Charge pump system with low ripple output voltage

    公开(公告)号:US12218585B2

    公开(公告)日:2025-02-04

    申请号:US18230450

    申请日:2023-08-04

    Abstract: A system includes a charge pump system having a plurality of enable signal input terminals and an output terminal, the charge pump system configured to provide an output voltage at the output terminal; and a detection circuit connected to the enable terminals and the output terminal of the charge pump system, the detection circuit configured to compare the charge pump system output voltage to a plurality of predefined input detection voltage levels, and to selectively output a plurality of enable signals to the charge pump system enable signal input terminals in response to the comparison.

    LOW-DROPOUT (LDO) REGULATOR WITH A FEEDBACK CIRCUIT

    公开(公告)号:US20240036597A1

    公开(公告)日:2024-02-01

    申请号:US17877115

    申请日:2022-07-29

    CPC classification number: G05F1/575 G05F1/565

    Abstract: A voltage regulator circuit is provided. The voltage regulator circuit includes a voltage regulator configured to provide an output voltage at an output terminal. A plurality of macros are connectable at a plurality of connection nodes of a connector connected to the output terminal of the voltage regulator. A feedback circuit having a plurality of feedback loops is connectable to the plurality of connection nodes. The feedback loop of the plurality of feedback loops, when connected to a connection node of the plurality of connection nodes, is configured to provide an instantaneous voltage of the connection node as a feedback to the voltage regulator. The voltage regulator is configured, in response to the instantaneous voltage, regulate the output voltage to maintain the instantaneous voltage of the connection node approximately equal to a reference voltage.

    CHARGE PUMP SYSTEM WITH LOW RIPPLE OUTPUT VOLTAGE

    公开(公告)号:US20230396161A1

    公开(公告)日:2023-12-07

    申请号:US18230450

    申请日:2023-08-04

    CPC classification number: H02M3/07 G11C13/0038 G11C5/145

    Abstract: A system includes a charge pump system having a plurality of enable signal input terminals and an output terminal, the charge pump system configured to provide an output voltage at the output terminal; and a detection circuit connected to the enable terminals and the output terminal of the charge pump system, the detection circuit configured to compare the charge pump system output voltage to a plurality of predefined input detection voltage levels, and to selectively output a plurality of enable signals to the charge pump system enable signal input terminals in response to the comparison.

    Memory cell array circuit and method of forming the same

    公开(公告)号:US11735263B2

    公开(公告)日:2023-08-22

    申请号:US17871144

    申请日:2022-07-22

    Abstract: A method of operating a memory circuit includes generating a first voltage by a first amplifier circuit of a first driver circuit coupled to a first column of memory cells, and generating a first current in response to the first voltage. The first current includes a first set of leakage currents and a first write current. The method further includes generating, by a tracking circuit, a second set of leakage currents configured to track the first set of leakage currents of the first column of memory cells, and mirroring the first current in a first path with a second current in a second path by a first current mirror. The second current includes the second set of leakage currents and a second write current. The first write current corresponds to the second write current. The first set of leakage currents corresponds to the second set of leakage currents.

    Semicoductor device and operation method thereof

    公开(公告)号:US11609815B1

    公开(公告)日:2023-03-21

    申请号:US17461532

    申请日:2021-08-30

    Abstract: A semiconductor device includes a memory circuit, an error correction code circuit, a register circuit and a write circuit. The memory circuit is configured to output, in response to at least one address signal, first data associated with at least one memory cell in the memory circuit. The error correction code circuit is configured to convert the first data to second data and configured to generate error information when the first data is not identical to the second data. The register circuit is configured to output, based on the error information, reset information corresponding to the at least one address signal. The write circuit is configured to reset the at least one memory cell according to the reset information. A method is also disclosed herein.

    Low-dropout (LDO) regulator with a feedback circuit

    公开(公告)号:US11442482B2

    公开(公告)日:2022-09-13

    申请号:US17010064

    申请日:2020-09-02

    Abstract: A voltage regulator circuit is provided. The voltage regulator circuit includes a voltage regulator configured to provide an output voltage at an output terminal. A plurality of macros are connectable at a plurality of connection nodes of a connector connected to the output terminal of the voltage regulator. A feedback circuit having a plurality of feedback loops is connectable to the plurality of connection nodes. The feedback loop of the plurality of feedback loops, when connected to a connection node of the plurality of connection nodes, is configured to provide an instantaneous voltage of the connection node as a feedback to the voltage regulator. The voltage regulator is configured, in response to the instantaneous voltage, regulate the output voltage to maintain the instantaneous voltage of the connection node approximately equal to a reference voltage.

    Memory device current limiter
    50.
    发明授权

    公开(公告)号:US11437099B2

    公开(公告)日:2022-09-06

    申请号:US17240534

    申请日:2021-04-26

    Abstract: A memory device includes a memory array including a plurality of memory cells arranged in rows and columns. A closed loop bias generator is configured to output a column select signal to the memory array. A current limiter receives an output of the closed loop bias generator. The current limiter is coupled to a plurality of the columns of the memory array.

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