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公开(公告)号：US09646949B2
公开(公告)日：2017-05-09
申请号：US14885931
申请日：2015-10-16
Applicant: SpectraSensors, Inc.
Inventor： Alfred Feitisch , Gabi Neubauer , Mathias Schrempel
CPC classification number: H01L24/83 , B23K20/023 , B23K20/24 , B23K2101/42 , H01L33/62 , H01L2224/73265 , H01L2224/83201 , H01L2224/8385 , H01L2924/12042 , H01S5/02212 , H01S5/02256 , H01S5/0226 , H01S5/02264 , H01S5/02476 , H01S5/0425
Abstract: A first contact surface of a semiconductor laser chip can be formed to a first target surface roughness and a second contact surface of a carrier mounting can be formed to a second target surface roughness. A first bond preparation layer comprising a first metal can optionally be applied to the formed first contact surface, and a second bond preparation layer comprising a second metal can optionally be applied to the formed second contact surface. The first contact surface can be contacted with the second contact surface, and a solderless securing process can secure the semiconductor laser chip to the carrier mounting. Related systems, methods, articles of manufacture, and the like are also described.
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公开(公告)号：US20170059474A1
公开(公告)日：2017-03-02
申请号：US14842642
申请日：2015-09-01
Applicant: SpectraSensors, Inc.
Inventor： Joshua Cohen , Nathan St. John , Alfred Feitisch
CPC classification number: G01N21/01 , G01J3/0286 , G01J3/42 , G01N21/27 , G01N2201/0231 , G01N2201/0636 , G02B7/008 , G02B7/028 , H01S3/0071 , H01S3/1317 , H01S5/0071 , H01S5/06804
Abstract: An optical head assembly for use in a spectrometer is provided that is configured to characterize one or more constituents within a sample gas. The assembly includes a thermoelectric cooler (TEC) having a cold side on one end and a hot side on an opposite end, a cold plate in thermal communication with the cold side of the TEC, a hot block in thermal communication with the hot side of the TEC, a light source in thermal communication with the cold plate such that a change in temperature of the TEC causes one or more properties of the light source (e.g., wavelength, etc.) to change, and an optical element in thermal communication with the cold plate positioned to collimate light emitted by the light source through the sample gas (such that properties of the optical element vary based on a change in temperature of the TEC).
Abstract translation: 提供了一种用于光谱仪的光学头组件，其被配置为表征样品气体中的一种或多种组分。 该组件包括热电冷却器（TEC），该热电冷却器（TEC）在一端具有冷侧，另一端具有热侧，与TEC的冷侧热连通的冷板，与热电连接的热块 TEC是与冷板热连通的光源，使得TEC的温度变化导致光源的一个或多个属性（例如波长等）改变，并且光学元件与 所述冷板定位成使由所述光源发射的光通过所述样品气体（使得所述光学元件的性质基于所述TEC的温度变化而变化）。
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公开(公告)号：US09518866B2
公开(公告)日：2016-12-13
申请号：US14466839
申请日：2014-08-22
Applicant: SpectraSensors, Inc.
Inventor： Alfred Feitisch , Xiang Liu , Chih-Husan Chang , Hsu-Hung Huang
CPC classification number: G01J3/0291 , G01J3/027 , G01J3/42
Abstract: At least one light source is configured to emit at least one beam into a sample volume of an absorbing medium. In addition, at least one detector is positioned to detect at least a portion of the beam emitted by the at least one light source. Further, at least one beam modification element is positioned between the at least one detector and the at least one light source to selectively change at least one of (i) a power intensity of, or (ii) a shape of the beam emitted by the at least one light source as detected by the at least one detector. A control circuit is coupled to the beam modification element. Related apparatus methods, articles of manufacture, systems, and the like are described.
Abstract translation: 至少一个光源被配置为将至少一个光束发射到吸收介质的样品体积中。 另外，至少一个检测器被定位成检测由至少一个光源发射的光束的至少一部分。 此外，至少一个光束修改元件位于所述至少一个检测器和所述至少一个光源之间，以选择性地改变以下中的至少一个：（i）由所述至少一个光源发射的光束的形状的功率强度或（ii） 由所述至少一个检测器检测的至少一个光源。 控制电路耦合到光束修改元件。 描述了相关的装置方法，制品，系统等。
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公开(公告)号：US20160327479A1
公开(公告)日：2016-11-10
申请号：US14703616
申请日：2015-05-04
Applicant: SpectraSensors, Inc.
Inventor： Alfred Feitisch , Peter Dorn , James Tedesco , Xiang Liu
CPC classification number: G01N21/39 , G01J3/0208 , G01N21/031 , G01N21/3504 , G01N2021/399 , G01N2201/0612 , G01N2201/0633
Abstract: A spectrometer includes a light source configured to emit a beam along a beam path through a sample volume comprising an analyte. Also included is at least one detector positioned to detect at least a portion of the beam emitted by the light source, and at least one reflector positioned along the beam path intermediate the light source and the at least one detector having a surface roughness greater than a predefined level such as 20 Å RMS.
Abstract translation: 光谱仪包括被配置为沿着光束路径发射通过包含分析物的样品体积的光束的光源。 还包括至少一个检测器，其被定位成检测由光源发射的光束的至少一部分，以及沿光束路径定位的至少一个反射器，其位于光源之间，并且至少一个检测器具有大于 预定义的水平，例如20？RMS。
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45.发明申请Target Analyte Detection and Quantification in Sample Gases With Complex Background Compositions 审中-公开具有复杂背景组成的样品气体中的目标分析物检测和定量公开(公告)号：US20160132617A1
公开(公告)日：2016-05-12
申请号：US14538699
申请日：2014-11-11
Applicant: SpectraSensors, Inc.
Inventor： Xiang Liu , Alfred Feitisch , Keith Benjamin Helbley , James Tedesco
IPC: G06F17/50 , G06F17/10 , G01N21/3504 , G01N21/65 , G01N21/39
CPC classification number: G06F17/5009 , G01J1/0433 , G01J3/0294 , G01J3/28 , G01J3/42 , G01J3/44 , G01N21/3504 , G01N21/39 , G01N21/65 , G01N2021/3545 , G01N2021/399 , G01N2201/0612 , G01N2201/129 , G06F17/10
Abstract: Background composition concentration data representative of an actual background composition of a sample gas can be used to model absorption spectroscopy measurement data obtained for a gas sample and to correct an analysis of the absorption spectroscopy data (e.g. for structural interference and collisional broadening) based on the modeling.
Abstract translation: 可以使用代表样品气体的实际背景组成的背景组合物浓度数据来模拟对于气体样品获得的吸收光谱测量数据，并且基于该样品气体的吸收光谱数据（例如，用于结构干扰和碰撞展宽）进行分析 造型。
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Patent Agency Ranking
公开(公告)号：US20160054178A1
公开(公告)日：2016-02-25
申请号：US14466839
申请日：2014-08-22
Applicant: SpectraSensors, Inc.
Inventor： Alfred Feitisch , Xiang Liu , Chih-Husan Chang , Hsu-Hung Huang
IPC: G01J3/02
CPC classification number: G01J3/0291 , G01J3/027 , G01J3/42
Abstract: At least one light source is configured to emit at least one beam into a sample volume of an absorbing medium. In addition, at least one detector is positioned to detect at least a portion of the beam emitted by the at least one light source. Further, at least one beam modification element is positioned between the at least one detector and the at least one light source to selectively change at least one of (i) a power intensity of, or (ii) a shape of the beam emitted by the at least one light source as detected by the at least one detector. A control circuit is coupled to the beam modification element. Related apparatus methods, articles of manufacture, systems, and the like are described.
Abstract translation: 至少一个光源被配置为将至少一个光束发射到吸收介质的样品体积中。 另外，至少一个检测器被定位成检测由至少一个光源发射的光束的至少一部分。 此外，至少一个光束修改元件位于所述至少一个检测器和所述至少一个光源之间，以选择性地改变以下中的至少一个：（i）由所述至少一个光源发射的光束的形状的功率强度或（ii） 由所述至少一个检测器检测的至少一个光源。 控制电路耦合到光束修改元件。 描述了相关的装置方法，制品，系统等。
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公开(公告)号：US20160028211A1
公开(公告)日：2016-01-28
申请号：US14873080
申请日：2015-10-01
Applicant: SpectraSensors, Inc.
Inventor： Alfred Feitisch , Gabi Neubauer , Mathias Schrempel
IPC: H01S5/022
CPC classification number: H01S5/02272 , H01L24/03 , H01L24/05 , H01L24/29 , H01L24/32 , H01L24/83 , H01L2224/0383 , H01L2224/04026 , H01L2224/05573 , H01L2224/05624 , H01L2224/05663 , H01L2224/05664 , H01L2224/05666 , H01L2224/05669 , H01L2224/0567 , H01L2224/0568 , H01L2224/05681 , H01L2224/05684 , H01L2224/05686 , H01L2224/29109 , H01L2224/29111 , H01L2224/29139 , H01L2224/29144 , H01L2224/32245 , H01L2224/83801 , H01L2924/12042 , H01L2924/15747 , H01S5/02212 , H01S5/0425 , H01L2924/04941 , H01L2924/01022 , H01L2924/053 , H01L2924/049 , H01L2924/00014 , H01L2924/01032 , H01L2924/01014 , H01L2924/014 , H01L2924/0105 , H01L2924/01029 , H01L2924/01082 , H01L2924/00
Abstract: A first contact surface of a semiconductor laser chip can be formed to a target surface roughness selected to have a maximum peak to valley height that is substantially smaller than a barrier layer thickness. A barrier layer that includes a non-metallic, electrically-conducting compound and that has the barrier layer thickness can be applied to the first contact surface, and the semiconductor laser chip can be soldered to a carrier mounting along the first contact surface using a solder composition by heating the soldering composition to less than a threshold temperature at which dissolution of the barrier layer into the soldering composition occurs. Related systems, methods, articles of manufacture, and the like are also described.
Abstract translation: 可以将半导体激光器芯片的第一接触表面形成为选择为具有基本上小于阻挡层厚度的最大峰谷高度的目标表面粗糙度。 包含非金属导电性化合物并且具有阻挡层厚度的阻挡层可以施加到第一接触表面，并且可以使用焊料将半导体激光器芯片焊接到沿着第一接触表面安装的载体上 通过将焊料组合物加热到低于阻挡层溶入焊料组合物的阈值温度的组合物。 还描述了相关系统，方法，制品等。
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48.发明申请公开(公告)号：US20160011047A1
公开(公告)日：2016-01-14
申请号：US14634364
申请日：2015-02-27
Applicant: Spectrasensors, Inc.
Inventor： Alfred Feitisch , Xiang Liu , Hsu-Hung Huang , Wenhai Ji , Richard L. Cline
CPC classification number: G01J3/0297 , G01J3/42 , G01N21/05 , G01N21/274 , G01N21/3504 , G01N21/39 , G01N2021/0314 , G01N2021/399 , G01N2201/1211 , G01N2201/1218 , G01N2201/127
Abstract: Validation verification data quantifying an intensity of light reaching a detector of a spectrometer from a light source of the spectrometer after the light passes through a validation gas across a known path length can be collected or received. The validation gas can include an amount of an analyte compound and an undisturbed background composition that is representative of a sample gas background composition of a sample gas to be analyzed using a spectrometer. The sample gas background composition can include one or more background components. The validation verification data can be compared with stored calibration data for the spectrometer to calculate a concentration adjustment factor, and sample measurement data collected with the spectrometer can be modified using this adjustment factor to compensate for collisional broadening of a spectral peak of the analyte compound by the background components. Related methods, articles of manufacture, systems, and the like are described.
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公开(公告)号：US09109951B2
公开(公告)日：2015-08-18
申请号：US14073711
申请日：2013-11-06
Applicant: SpectraSensors, Inc.
Inventor： Peter Scott , Alfred Feitisch , Peter Dorn , Adam S. Chaimowitz , Hsu-Hung Huang , Mathias Schrempel , Lutz Keller
CPC classification number: G01N21/031 , G01J3/42 , G01J2003/423 , G01N21/01 , G01N21/0303 , G01N21/05 , G01N21/27 , G01N2021/0307 , G01N2201/06113
Abstract: A sample cell can be designed to minimize excess gas volume. Described features can be advantageous in reducing an amount of gas required to flow through the sample cell during spectroscopic measurements, and in reducing a time (e.g. a total volume of gas) required to flush the cell between sampling events. In some examples, contours of the inners surfaces of the sample cell that contact the contained gas can be shaped, dimensioned, etc. such that a maximum clearance distance is provided between the inner surfaces at one or more locations. Systems, methods, and articles, etc. are described.
Abstract translation: 可以设计样品池以最小化过量气体体积。 所描述的特征可以有利于在光谱测量期间减少流过样品池所需的气体量，并且减少在取样事件之间冲洗电池所需的时间（例如总体积的气体）。 在一些示例中，接触所容纳的气体的样品池的内部表面的轮廓可以成形，定尺寸等，使得在一个或多个位置处的内表面之间提供最大间隙距离。 描述系统，方法和物品等。
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公开(公告)号：US20150124257A1
公开(公告)日：2015-05-07
申请号：US14073711
申请日：2013-11-06
Applicant: SpectraSensors, Inc.
Inventor： Peter Scott , Alfred Feitisch , Peter Dorn , Adam S. Chaimowitz , Hsu-Hung Huang , Mathias Schrempel , Lutz Keller
CPC classification number: G01N21/031 , G01J3/42 , G01J2003/423 , G01N21/01 , G01N21/0303 , G01N21/05 , G01N21/27 , G01N2021/0307 , G01N2201/06113
Abstract: A sample cell can be designed to minimize excess gas volume. Described features can be advantageous in reducing an amount of gas required to flow through the sample cell during spectroscopic measurements, and in reducing a time (e.g. a total volume of gas) required to flush the cell between sampling events. In some examples, contours of the inners surfaces of the sample cell that contact the contained gas can be shaped, dimensioned, etc. such that a maximum clearance distance is provided between the inner surfaces at one or more locations. Systems, methods, and articles, etc. are described.
Abstract translation: 可以设计样品池以最小化过量气体体积。 所描述的特征可以有利于在光谱测量期间减少流过样品池所需的气体量，并且减少在取样事件之间冲洗电池所需的时间（例如总体积的气体）。 在一些示例中，接触所容纳的气体的样品池的内部表面的轮廓可以成形，定尺寸等，使得在一个或多个位置处的内表面之间提供最大间隙距离。 描述系统，方法和物品等。
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