Spectrometer with wide-scan tunable diode laser

    公开(公告)号:US11079324B2

    公开(公告)日:2021-08-03

    申请号:US16511429

    申请日:2019-07-15

    Abstract: A method for implementation by a laser spectrometer is provided. The method includes first scanning, by a control unit using a first set of laser spectrometer operating parameters, a first wavelength range by adjusting a wavelength of light of a beam emitted by a laser light source and passing through a sample gas. The first wavelength range encompasses a first spectral feature corresponding to a first constituent. The method also includes at least one second scanning, by the control unit using a second set of laser spectrometer operating parameters, a second wavelength range by adjusting the wavelength of light emitted from the laser light source and passing through the sample gas. The second wavelength range has a second spectral feature corresponding to at least one second constituent. The control unit also determines a first concentration of the first constituent and a second concentration of the at least one second constituent.

    SPECTROMETER WITH ACTIVE BEAM STEERING
    2.
    发明申请

    公开(公告)号:US20190277691A1

    公开(公告)日:2019-09-12

    申请号:US16415171

    申请日:2019-05-17

    Abstract: A spectrometer includes a light source that emits a beam into a sample volume comprising an absorbing medium. Thereafter, at least one detector detects at least a portion of the beam emitted by the light source. It is later determined, based on the detected at least a portion of the beam and by a controller, that a position and/or an angle of the beam should be changed. The beam emitted by the light source is then actively steered by an actuation element under control of the controller. In addition, a concentration of the absorbing media can be quantified or otherwise calculated (using the controller or optionally a different processor that can be local or remote). The actuation element(s) can be coupled to one or more of the light source, a detector or detectors, and a reflector or reflectors intermediate the light source and the detector(s).

    Determination and Correction of Frequency Registration Deviations for Quantitative Spectroscopy
    5.
    发明申请
    Determination and Correction of Frequency Registration Deviations for Quantitative Spectroscopy 有权
    定量光谱频率注册偏差的确定与校正

    公开(公告)号:US20170038257A1

    公开(公告)日:2017-02-09

    申请号:US14817119

    申请日:2015-08-03

    Abstract: A frequency registration deviation is quantified for a field spectrum collected during analysis by a spectroscopic analysis system of a sample fluid when the spectroscopic analysis system has deviated from a standard calibration state. The field spectrum is corrected based on the frequency registration deviation using at least one spectral shift technique, and a concentration is calculated for at least one analyte represented by the field spectrum using the corrected field spectrum. Related systems, methods, and articles are described.

    Abstract translation: 当光谱分析系统偏离标准校准状态时,通过样品流体的光谱分析系统在分析期间收集的场光谱量化频率对准偏差。 使用至少一个光谱偏移技术,基于频率配准偏差校正场频谱,并且使用校正的场频谱计算由场频谱表示的至少一个分析物的浓度。 描述相关系统,方法和文章。

    Solderless Mounting for Semiconductor Lasers
    9.
    发明申请
    Solderless Mounting for Semiconductor Lasers 有权
    半导体激光器的无焊接安装

    公开(公告)号:US20160111393A1

    公开(公告)日:2016-04-21

    申请号:US14885931

    申请日:2015-10-16

    Abstract: A first contact surface of a semiconductor laser chip can be formed to a first target surface roughness and a second contact surface of a carrier mounting can be formed to a second target surface roughness. A first bond preparation layer comprising a first metal can optionally be applied to the formed first contact surface, and a second bond preparation layer comprising a second metal can optionally be applied to the formed second contact surface. The first contact surface can be contacted with the second contact surface, and a solderless securing process can secure the semiconductor laser chip to the carrier mounting. Related systems, methods, articles of manufacture, and the like are also described.

    Abstract translation: 可以将半导体激光器芯片的第一接触表面形成为第一目标表面粗糙度,并且可以将载体安装的第二接触表面形成为第二目标表面粗糙度。 包含第一金属的第一粘合制备层可以任选地施加到所形成的第一接触表面,并且包括第二金属的第二接合制备层可任选地施加到形成的第二接触表面。 第一接触表面可以与第二接触表面接触,并且无焊接固定工艺可以将半导体激光器芯片固定到载体安装。 还描述了相关系统,方法,制品等。

    Spectrometer With Active Beam Steering
    10.
    发明申请
    Spectrometer With Active Beam Steering 有权
    光束仪主动光束转向

    公开(公告)号:US20160054177A1

    公开(公告)日:2016-02-25

    申请号:US14466819

    申请日:2014-08-22

    Abstract: A spectrometer includes a light source that emits a beam into a sample volume comprising an absorbing medium. Thereafter, at least one detector detects at least a portion of the beam emitted by the light source. It is later determined, based on the detected at least a portion of the beam and by a controller, that a position and/or an angle of the beam should be changed. The beam emitted by the light source is then actively steered by an actuation element under control of the controller. In addition, a concentration of the absorbing media can be quantified or otherwise calculated (using the controller or optionally a different processor that can be local or remote). The actuation element(s) can be coupled to one or more of the light source, a detector or detectors, and a reflector or reflectors intermediate the light source and the detector(s).

    Abstract translation: 光谱仪包括将光束发射到包括吸收介质的样品体积中的光源。 此后,至少一个检测器检测由光源发射的光束的至少一部分。 随后基于检测到的梁的至少一部分和由控制器确定梁的位置和/或角度应被改变。 然后在控制器的控制下由光源发射的光束被致动元件主动地导向。 此外,可以量化或以其他方式计算吸收介质的浓度(使用控制器或可选择地可以是本地或远程的不同处理器)。 致动元件可以耦合到光源,检测器或检测器中的一个或多个,以及在光源和检测器之间的反射器或反射器。

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