公开(公告)号：US20160047787A1

公开(公告)日：2016-02-18

申请号：US14875709

申请日：2015-10-06

Applicant: OMNI MEDSCI, INC.

Inventor： Mohammed N. Islam

IPC: G01N33/15 ,  G01N33/49 ,  G01N21/359

CPC classification number: A61B5/0088 ,  A61B5/0013 ,  A61B5/0022 ,  A61B5/0075 ,  A61B5/0086 ,  A61B5/14532 ,  A61B5/14546 ,  A61B5/1455 ,  A61B5/4547 ,  A61B5/6801 ,  A61B5/7257 ,  A61B5/7405 ,  A61B5/742 ,  A61B2562/0233 ,  A61B2562/0238 ,  A61B2562/146 ,  A61B2576/02 ,  G01J3/0218 ,  G01J3/108 ,  G01J3/14 ,  G01J3/1838 ,  G01J3/28 ,  G01J3/2823 ,  G01J3/42 ,  G01J3/453 ,  G01J2003/104 ,  G01J2003/1208 ,  G01J2003/2826 ,  G01M3/38 ,  G01N21/35 ,  G01N21/3563 ,  G01N21/359 ,  G01N21/39 ,  G01N21/85 ,  G01N21/88 ,  G01N21/9508 ,  G01N33/02 ,  G01N33/025 ,  G01N33/15 ,  G01N33/442 ,  G01N33/49 ,  G01N2021/3595 ,  G01N2021/399 ,  G01N2201/061 ,  G01N2201/06113 ,  G01N2201/062 ,  G01N2201/08 ,  G01N2201/12 ,  G01N2201/129 ,  G06F19/00 ,  G16H40/67 ,  H01S3/0092 ,  H01S3/06758 ,  H01S3/302

Abstract: A measurement system includes a light source generating an output optical beam using semiconductor sources generating an input beam, optical amplifiers outputting an intermediate beam, and optical fibers receiving the intermediate beam and forming a first optical beam. A nonlinear element broadens the output beam spectrum to at least 10 nm, the spectrum comprising a near-infrared wavelength of 700-2500 nm. A measurement apparatus receives the output optical beam and delivers to a sample an analysis output beam. A receiver receives and processes the analysis output beam reflected or transmitted from the sample.

Abstract translation: 测量系统包括使用产生输入光束的半导体源产生输出光束的光源，输出中间光束的光放大器和接收中间光束并形成第一光束的光纤。 非线性元件将输出光束光谱拓宽至至少10nm，该光谱包括700-2500nm的近红外波长。 测量装置接收输出光束并向样品传送分析输出光束。 接收器接收并处理从样本反射或发射的分析输出光束。

公开(公告)号：US20160025567A1

公开(公告)日：2016-01-28

申请号：US14792343

申请日：2015-07-06

Applicant: JDSU Deutschland GmbH

Inventor： Eberhard LOECKLIN

IPC: G01J3/18 ,  G01J3/14

CPC classification number: G01J3/1804 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/021 ,  G01J3/14 ,  G01J2003/1208

Abstract: The invention relates to angle-limiting optical reflectors and optical dispersive devices such as optical spectrum analyzers using the same. The reflector has two reflective surfaces arranged in a two-dimensional corner reflector configuration for reflecting incident light back with a shift, and includes two prisms having a gap therebetween that is tilted to reflect unwanted light and transmit wanted light. A two-pass optical spectrum analyzer utilizes the reflector to block unwanted multi-pass modes that may otherwise exist and degrade the wavelength selectivity of the device.

Abstract translation: 本发明涉及角度限制光学反射器和光学色散装置，例如使用其的光谱分析仪。 反射器具有以二维角反射器构造布置的两个反射表面，用于以偏移方式反射入射光，并且包括两个在其间具有间隙的棱镜，其倾斜以反射不需要的光并传输所需的光。 双通道光谱分析仪利用反射器来阻止可能存在的不期望的多通道模式并降低器件的波长选择性。

公开(公告)号：US20120242988A1

公开(公告)日：2012-09-27

申请号：US13428247

申请日：2012-03-23

Applicant: Christopher Saxer ,  Robert H. Hart ,  Eric L. Buckland ,  Pete Huening ,  Bradley A. Bower

Inventor： Christopher Saxer ,  Robert H. Hart ,  Eric L. Buckland ,  Pete Huening ,  Bradley A. Bower

IPC: G01J3/45 ,  G01J3/28

CPC classification number: G01J3/0208 ,  A61B3/1005 ,  A61B5/0066 ,  G01J3/14 ,  G01J3/1804 ,  G01J3/28 ,  G01J2003/1208

Abstract: Wavenumber linear spectrometers are provided including an input configured to receive electromagnetic radiation from an external source; collimating optics configured to collimate the received electromagnetic radiation; a dispersive assembly including first and second diffractive gratings, wherein the first diffraction grating is configured in a first dispersive stage to receive the collimated electromagnetic radiation and wherein the dispersive assembly includes at least two dispersive stages configured to disperse the collimated input; and an imaging lens assembly configured to image the electromagnetic radiation dispersed by the at least two dispersive stages onto a linear detection array such that the variation in frequency spacing along the linear detection array is no greater than about 10%.

Abstract translation: 提供波数线性光谱仪，其包括被配置为从外部源接收电磁辐射的输入; 准直光学器件，被配置成准直所接收的电磁辐射; 包括第一和第二衍射光栅的分散组件，其中所述第一衍射光栅被配置在第一色散级中以接收所述准直电磁辐射，并且其中所述色散组件包括被配置为分散所述准直输入的至少两个色散级; 以及成像透镜组件，被配置为将由至少两个色散级分散的电磁辐射成像到线性检测阵列上，使得沿着线性检测阵列的频率间隔的变化不大于约10％。

公开(公告)号：US20120212738A1

公开(公告)日：2012-08-23

申请号：US13364226

申请日：2012-02-01

Applicant: Dar Bahatt ,  Chirag Patel ,  Roy H. Tan ,  Derek Prothro

Inventor： Dar Bahatt ,  Chirag Patel ,  Roy H. Tan ,  Derek Prothro

IPC: G01J3/28

CPC classification number: G01N21/31 ,  G01J3/10 ,  G01J3/12 ,  G01J3/18 ,  G01J3/189 ,  G01J3/2803 ,  G01J3/2823 ,  G01J3/4406 ,  G01J2003/1204 ,  G01J2003/1208 ,  G01J2003/1213 ,  G01J2003/1226 ,  G01N21/0332 ,  G01N21/253 ,  G01N21/6428 ,  G01N21/6452 ,  G01N21/6456 ,  G01N21/76 ,  G01N2021/6421 ,  G01N2021/6432 ,  G01N2201/06113 ,  G01N2201/0621 ,  G01N2201/0697

Abstract: Systems, including methods, apparatus, and algorithms, for spectrally imaging a two-dimensional array of samples.

Abstract translation: 用于对二维样本阵列进行光谱成像的系统，包括方法，装置和算法。

公开(公告)号：US20100014082A1

公开(公告)日：2010-01-21

申请号：US12505387

申请日：2009-07-17

Applicant: Eberhard Loecklin

Inventor： Eberhard Loecklin

IPC: G01J3/28

CPC classification number: G01J3/1804 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/021 ,  G01J3/14 ,  G01J2003/1208

Abstract: The invention relates to angle-limiting optical reflectors and optical dispersive devices such as optical spectrum analyzers using the same. The reflector has two reflective surfaces arranged in a two-dimensional corner reflector configuration for reflecting incident light back with a shift, and includes two prisms having a gap therebetween that is tilted to reflect unwanted light and transmit wanted light. A two-pass optical spectrum analyzer utilizes the reflector to block unwanted multi-pass modes that may otherwise exist and degrade the wavelength selectivity of the device.

Abstract translation: 本发明涉及角度限制光学反射器和光学色散装置，例如使用其的光谱分析仪。 反射器具有以二维角反射器构造布置的两个反射表面，用于以偏移方式反射入射光，并且包括两个在其间具有间隙的棱镜，其倾斜以反射不需要的光并传输所需的光。 双通道光谱分析仪利用反射器来阻止可能存在的不期望的多通道模式并降低器件的波长选择性。

公开(公告)号：US07215422B2

公开(公告)日：2007-05-08

申请号：US10503636

申请日：2003-01-28

Applicant: Stefan Florek ,  Helmut Becker-Ross ,  Uwe Heitmann

Inventor： Stefan Florek ,  Helmut Becker-Ross ,  Uwe Heitmann

IPC: G01J3/28

CPC classification number: G01J3/04 ,  G01J3/02 ,  G01J3/0229 ,  G01J3/08 ,  G01J3/14 ,  G01J3/1809 ,  G01J3/28 ,  G01J2003/1208 ,  G01J2003/2866

Abstract: A spectrometer assembly (10) is disclosed. The assembly includes a light source (11) with a continuous spectrum. A pre-monochromator (2) generates a spectrum with a relatively small linear dispersion from which a spectral portion is selectable, the spectral bandwidth of the spectral portion being smaller than or equal to the bandwidth of the free spectral range of the order in the echelle spectrum. The centre wavelength of the selected spectral interval is measurable with maximum blaze efficiency. The assembly also includes an echelle spectrometer (4) with means for wavelength calibration, an entrance slit (21) at the pre-monochromator (2), an intermediate slit assembly (50) with an intermediate slit (3) and a spatially resolving light detector (5) in the exit plane of the spectrometer for the detection of wavelength spectra.

Abstract translation: 公开了一种光谱仪组件（10）。 组件包括具有连续光谱的光源（11）。 预单色仪（2）产生具有相对小的线性色散的光谱，光谱部分可以从该色散部分被选择，光谱部分的光谱带宽小于或等于在该片段中的顺序的自由光谱范围的带宽 光谱。 所选光谱间隔的中心波长可以用最大的火焰效率进行测量。 组件还包括具有用于波长校准的装置的梯形光谱仪（4），在预分光器（2）处的入口狭缝（21），具有中间狭缝（3）和空间分辨光的中间狭缝组件（50） 检测器（5）在光谱仪的出射平面，用于检测波长光谱。

公开(公告)号：US5448351A

公开(公告)日：1995-09-05

申请号：US157034

申请日：1994-05-16

Applicant: Stefan Florek ,  Helmut Becker-Ross

Inventor： Stefan Florek ,  Helmut Becker-Ross

IPC: G01J3/12 ,  G01J3/14 ,  G01J3/18 ,  G01J3/22 ,  G01J3/28 ,  G02B5/06

CPC classification number: G01J3/14 ,  G01J3/1809 ,  G01J2003/1208 ,  G01J2003/1286 ,  G01J2003/1828 ,  G01J3/22 ,  G01J3/2803

Abstract: An Echelle polychromator 50 has disposed upstream thereof a pre-monochromator 14 comprising a prism 20. The linear dispersion of the pre-monochromator 14 is variable by varying the angular dispersion of the prism 20. A particular spectral position and the close vicinity thereof are analyzed by an Echelle grating 54 with high resolution. Care must be taken that, on the one hand, the detector array 66 of the Echelle polychromator 50 is fully exploited in response to the central wavelength respectively observed and that, on the other hand, interfering orders are kept away from the Echelle polychromator 50. The linear dispersion of the pre-monochromator is variable for this purpose.

Abstract translation: PCT No.PCT / EP92 / 01270 Sec。 371日期1994年5月16日 102（e）日期1994年5月16日PCT提交1992年6月5日PCT公布。 WO92 / 21948 PCT公开 日期为1992年12月10日。一个梯形多色分光器50已经在其上方设置了包括棱镜20的预单色器14.预单色仪14的线性色散可通过改变棱镜20的角度色散而变化。特定光谱位置 并通过具有高分辨率的Echelle光栅54分析其附近。 必须注意的是，一方面，响应于分别观察到的中心波长，Echelle多色分光器50的检测器阵列66被充分利用，另一方面，干涉顺序被保留离开Echelle多色
调变换器50。 为了此目的，预单色仪的线性色散是可变的。

公开(公告)号：US4856898A

公开(公告)日：1989-08-15

申请号：US166870

申请日：1988-03-11

Applicant: Helmut Becker-Ross ,  Stefan Florek ,  Felix Kerstan ,  Guenther Moebius ,  Horst Sanders

Inventor： Helmut Becker-Ross ,  Stefan Florek ,  Felix Kerstan ,  Guenther Moebius ,  Horst Sanders

IPC: G01J3/04 ,  G01J3/12 ,  G01J3/18

CPC classification number: G01J3/04 ,  G01J3/1809 ,  G01J2003/1208

Abstract: An adjustable Echelle spectrometer arrangement which can be used in single- and multi-element analysis by the emission or absorption of optical radiation. To compensate all the manufacturing and setup errors, the only arrangements present are those to change the height of the entry slit arrangement above the base plate and to rotate the dispersion prism about a first axis, approximately parallel to its roof edge, and about a second axis, that is vertical thereto. This compensates for the effect of errors associated with component and setup parameters which results from greater tolerances, without impairing mechanical and thermal stability and imaging quality.

Abstract translation: 可调节的Echelle光谱仪布置，可用于通过发射或吸收光学辐射的单元素和多元素分析。 为了补偿所有的制造和设置误差，存在的仅仅是在基板上方改变进入狭缝布置的高度并使分散棱镜围绕大致平行于其屋顶边缘的第一轴线旋转的大约第二 轴，与其垂直。 这补偿了由较大公差引起的与部件和设置参数相关的误差的影响，而不损害机械和热稳定性和成像质量。

公开(公告)号：US12085445B2

公开(公告)日：2024-09-10

申请号：US17603487

申请日：2020-04-03

Applicant: University of Rochester

Inventor： Changsik Yoon ,  Jannick P. Rolland-Thompson ,  Aaron Bauer

IPC: G01J3/18 ,  G01B9/02091 ,  G01J3/02 ,  G01J3/12

CPC classification number: G01J3/18 ,  G01B9/02091 ,  G01J3/0208 ,  G01J2003/1208

Abstract: A detector system for Fourier spectroscopy such as a spectral domain optical coherence tomography instrument includes a diffractive optic for diffracting the interfering light into angularly dispersed wavenumbers, a prism for reduces a nonlinear angular dispersion among the wavenumbers, and a focusing optic for converting the angularly dispersed wavenumbers from the prism into spatially distributed wavenumbers along a detector having an array of pixels. A field lens between the focusing optic and the detector has a freeform surface for more evenly distributing the wavenumbers along the array of pixels.

公开(公告)号：US20230314795A1

公开(公告)日：2023-10-05

申请号：US17760583

申请日：2020-12-19

Applicant: SOOCHOW UNIVERSITY

Inventor： Jian BAO ,  Qiuyang SHEN ,  Xinhua CHEN ,  Weimin SHEN

IPC: G02B27/00 ,  G01J3/14 ,  G01J3/18 ,  G01J3/28

CPC classification number: G02B27/0012 ,  G01J3/14 ,  G01J3/18 ,  G01J3/2823 ,  G01J2003/1208

Abstract: The invention discloses a design method of a wavenumber linearity dispersion optical system and an imaging spectrometer, including: building an optical system including a grating, a prism and an objective lens that are sequentially arranged, the grating adjoins the prism; defining a linearity evaluation coefficient RMS; assigning a minimum value to the linearity evaluation coefficient RMS through adjustment to the vertex angle of the prism, when the linearity evaluation coefficient RMS is at minimum, the vertex angle of the prism being α1; acquiring compensations for distortion and longitudinal chromatic aberration of the objective lens based on the interval between equal-difference wavenumbers on the image plane when the vertex angle of the prism is α1; and optimizing the objective lens based on the compensations for distortion and longitudinal chromatic aberration of the objective lens to obtain an optimized optical system. Higher wavenumber linearity can be achieved through objective-lens-aberration compensated wavenumber linearity.