Apparatus and method to reduce lock time via frequency band calibration

    公开(公告)号:US10812089B2

    公开(公告)日:2020-10-20

    申请号:US16357169

    申请日:2019-03-18

    Applicant: Xilinx, Inc.

    Abstract: Apparatus and associated methods relating to reducing lock time include pre-calibrating and storing phase-locked loop (PLL) and/or injection-locked oscillator (ILO) adaptation values during startup and loading the pre-calibrated values during rate change. In an illustrative example, an integrated circuit may include a controllable frequency circuit operable at frequencies within each of a plurality of frequency bands. A data store may store operational settings associated with each frequency of the plurality of frequency bands. A state machine may be coupled to the controllable frequency circuit and the data store configured to select a predetermined frequency band in response to a command signal, retrieve, from the data store, operational settings associated with the predetermined frequency band, and, apply the retrieved operational settings to the controllable frequency circuit. With the pre-calibration, PLL and/or ILO lock times during rate change in a multi-rate serializer/deserializer (SERDES) link may be advantageously reduced.

    Digital-to-analog converter (DAC)-based driver for optical modulators

    公开(公告)号:US10598852B1

    公开(公告)日:2020-03-24

    申请号:US16425009

    申请日:2019-05-29

    Applicant: Xilinx, Inc.

    Abstract: A data driver includes pre-driver circuitry coupled to a digital-to-analog converter (DAC) via a plurality of bit lines. The pre-driver circuitry is configured to receive a plurality of first voltages corresponding to respective bits of a digital codeword. Each of the first voltages may have one of a first voltage value or a ground potential based on a value of the corresponding bit. The pre-driver circuitry is further configured to drive a plurality of second voltages onto the plurality of bit lines, respectively, by switchably coupling each of the bit lines to ground or a voltage rail based at least in part on the voltage values of the plurality of first voltages. The voltage rail provides a second voltage value that is greater than the first voltage value. The DAC converts the plurality of second voltages to an electrical signal which is an analog representation of the digital codeword.

    Systems and methods for clock and data recovery

    公开(公告)号:US10256968B1

    公开(公告)日:2019-04-09

    申请号:US15660141

    申请日:2017-07-26

    Applicant: Xilinx, Inc.

    Abstract: A clock and data recovery (CDR) circuit includes a phase detector, a digital loop filter, and a lock detector. The phase detector generates a phase detect result signal in response to phase detection of a plurality of samples. The plurality of samples are generated by sampling a received signal based on a sampling clock a sampling clock provided by a phase interpolator. The digital loop filter includes a phase path and a frequency path for providing a phase path correction signal and a frequency path correction signal based on the phase detect result signal respectively. A phase interpolator code generator generates a phase interpolator code for controlling the phase interpolator based on the phase path correction signal and frequency path correction signal. The lock detector generates a lock condition signal based on the frequency path correction signal, the lock condition signal indicating a lock condition of the CDR circuit.

    Electrically testing an optical receiver

    公开(公告)号:US09960844B1

    公开(公告)日:2018-05-01

    申请号:US15474588

    申请日:2017-03-30

    Applicant: Xilinx, Inc.

    CPC classification number: H04B10/0775 G01R31/2635 H03K17/78 H04B10/60

    Abstract: An example photodiode emulator circuit includes: a first current source circuit; first and second transistors having sources coupled together and coupled to an output of the first current source circuit, a drain of the second transistor coupled to a first node; a third transistor coupled between a drain of the first transistor and a replica load circuit; a second current source circuit coupled to the first node; a capacitor coupled between the first node and electrical ground; and a fourth transistor having a source coupled to the first node and a drain that supplies an output current.

    Offset insensitive quadrature clock error correction and duty cycle calibration for high-speed clocking

    公开(公告)号:US09602082B2

    公开(公告)日:2017-03-21

    申请号:US14814401

    申请日:2015-07-30

    Applicant: Xilinx, Inc.

    CPC classification number: H03K3/017 G06F1/04 H03K5/1565

    Abstract: Techniques for correcting clock distortion. The techniques include use of circuitry for detecting and correcting duty cycle distortion and quadrature clock phase distortion. For phase detection, detection circuitry is made simpler and more accurate through the use of a sampling operation in which device mismatch within detection circuitry is accounted for by sampling charge associated with an ideal clock signal across sampling capacitors. When phase detection is performed with the detection circuitry, the stored charge compensates for the device mismatch, improving the accuracy of the detection circuit. The sampling operation is used for duty cycle distortion detection as well. Specifically, a common mode voltage is applied to sampling capacitors, which effectively zeroes the voltage differential between the sampling capacitors, compensating for offset that might exist due to operation of other components of the detection circuit. A digital value is used by a feedback algorithm to correct the clock distortion.

    Clock data recovery (CDR) phase walk scheme in a phase-interpolater-based transceiver system
    26.
    发明授权
    Clock data recovery (CDR) phase walk scheme in a phase-interpolater-based transceiver system 有权
    在基于相位插值器的收发机系统中的时钟数据恢复(CDR)相位行进方案

    公开(公告)号:US09356775B1

    公开(公告)日:2016-05-31

    申请号:US14795169

    申请日:2015-07-09

    Applicant: Xilinx, Inc.

    CPC classification number: H04L7/041 H04L7/0025 H04L7/0087 H04L7/033 H04L7/0337

    Abstract: Methods and apparatus are described for synchronously stepping at least one of a data phase interpolator (PI) code or a crossing PI code in a clock and data recovery (CDR) circuit until one or more preset criteria are satisfied. One example method generally includes determining that a condition has been met; based on the determination, stepping, in a CDR circuit, at least one of a data PI code or a crossing PI code for each cycle of a clock; stopping the stepping based on one or more criteria to generate a predetermined state of the data PI code and the crossing PI code, wherein the predetermined state comprises an offset between the data PI code and the crossing PI code; receiving a data stream; and performing clock and data recovery on the data stream based on the offset between the data PI code and the crossing PI code.

    Abstract translation: 描述了用于在时钟和数据恢复(CDR)电路中同步地步进数据相位内插器(PI)代码或交叉PI代码中的至少一个的方法和装置,直到满足一个或多个预设标准。 一个示例性方法通常包括确定已经满足条件; 基于所述确定,在CDR电路中步进每个时钟周期的数据PI代码或交叉PI代码中的至少一个; 基于一个或多个标准停止步进以产生数据PI代码和交叉PI代码的预定状态,其中预定状态包括数据PI代码和交叉PI代码之间的偏移量; 接收数据流; 并且基于数据PI代码和交叉PI代码之间的偏移在数据流上执行时钟和数据恢复。

    Inductor design in active 3D stacking technology

    公开(公告)号:US11043470B2

    公开(公告)日:2021-06-22

    申请号:US16694476

    申请日:2019-11-25

    Applicant: XILINX, INC.

    Abstract: Examples described herein provide for an isolation design for an inductor of a stacked integrated circuit device. An example is a multi-chip device comprising a chip stack comprising: a plurality of chips, neighboring pairs of the plurality of chips being bonded together, each chip comprising a semiconductor substrate, and a front side dielectric layer on a front side of the semiconductor substrate; an inductor disposed in a backside dielectric layer of a first chip of the plurality of chips, the backside dielectric layer being on a backside of the semiconductor substrate of the first chip opposite from the front side of the semiconductor substrate of the first chip; and an isolation wall extending from the backside dielectric layer of the first chip to the front side dielectric layer, the isolation wall comprising a through substrate via of the first chip, the isolation wall being disposed around the inductor.

    APPARATUS AND METHOD TO REDUCE LOCK TIME VIA FREQUENCY BAND CALIBRATION

    公开(公告)号:US20200304130A1

    公开(公告)日:2020-09-24

    申请号:US16357169

    申请日:2019-03-18

    Applicant: Xilinx, Inc.

    Abstract: Apparatus and associated methods relating to reducing lock time include pre-calibrating and storing phase-locked loop (PLL) and/or injection-locked oscillator (ILO) adaptation values during startup and loading the pre-calibrated values during rate change. In an illustrative example, an integrated circuit may include a controllable frequency circuit operable at frequencies within each of a plurality of frequency bands. A data store may store operational settings associated with each frequency of the plurality of frequency bands. A state machine may be coupled to the controllable frequency circuit and the data store configured to select a predetermined frequency band in response to a command signal, retrieve, from the data store, operational settings associated with the predetermined frequency band, and, apply the retrieved operational settings to the controllable frequency circuit. With the pre-calibration, PLL and/or ILO lock times during rate change in a multi-rate serializer/deserializer (SERDES) link may be advantageously reduced.

    High speed frequency divider
    30.
    发明授权

    公开(公告)号:US10530375B1

    公开(公告)日:2020-01-07

    申请号:US16122761

    申请日:2018-09-05

    Applicant: Xilinx, Inc.

    Abstract: A frequency divider circuit (200) includes a frequency sub-divider (201) to provide a frequency divided clock, a delay circuit (250) configured to delay the frequency divided clock by N+0.5 cycles of the input clock to generate a delayed clock, and an output circuit (202) configured to generate an output clock based on the frequency divided clock and the delayed clock, where the output clock has a frequency that is equal to 1/(N+0.5) times a frequency of the input clock, and N is an integer greater than one.

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