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公开(公告)号:US09646960B2
公开(公告)日:2017-05-09
申请号:US15046200
申请日:2016-02-17
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sanghoon Baek , Jung-Ho Do , Taejoong Song , Giyoung Yang , Seungyoung Lee , Jinyoung Lim
IPC: H01L27/02 , H01L27/088 , H01L27/11 , H01L23/528 , H01L23/522
CPC classification number: H01L27/0207 , H01L23/5226 , H01L23/5283 , H01L27/088 , H01L27/092 , H01L27/1104
Abstract: A system-on-chip device may include a substrate with an active pattern, a gate electrode crossing the active pattern and extending in a first direction, and a first metal layer electrically connected to the active pattern and the gate electrode. The first metal layer may include a first metal line extending in the first direction and a second metal line spaced apart from the first metal line in the first direction to extend in a second direction crossing the first direction. The first and second metal lines may include first and second sidewalls parallel to the second direction, the first and second sidewalls may face each other, and the first sidewall may have a length that is two or three times a minimum line width.
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公开(公告)号:US09589955B2
公开(公告)日:2017-03-07
申请号:US14872774
申请日:2015-10-01
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sang-Hoon Baek , Sun-Young Park , Sang-Kyu Oh , Ha-Young Kim , Jung-Ho Do , Moo-Gyu Bae , Seung-Young Lee
IPC: H01L23/48 , H01L29/40 , H01L27/088 , H01L27/02 , H01L27/11
CPC classification number: H01L27/088 , H01L21/823431 , H01L21/823475 , H01L23/528 , H01L27/0207 , H01L27/0886 , H01L27/1104
Abstract: Systems on chips are provided. A system on chip (SoC) includes a first gate line, a second gate line and a third gate line extending in a first direction, a gate isolation region cutting the first gate line, the second gate line and the third gate line and extending in a second direction across the first direction, a first gate contact formed on the second gate line arranged between the first gate line and the third gate line, and electrically connecting the cut second gate line, a second gate contact formed on the first gate line, a third gate contact formed on the third gate line, a first metal line electrically connecting the second gate contact and the third gate contact, and a second metal line electrically connected to the first gate contact.
Abstract translation: 提供芯片系统。 片上系统(SoC)包括第一栅极线,第二栅极线和沿第一方向延伸的第三栅极线,栅极隔离区域切割第一栅极线,第二栅极线和第三栅极线并且在 在第一方向上的第二方向,形成在第二栅极线上的第一栅极接触,布置在第一栅极线和第三栅极线之间,并且电连接切割的第二栅极线,形成在第一栅极线上的第二栅极接触, 形成在第三栅极线上的第三栅极触点,电连接第二栅极触点和第三栅极触点的第一金属线以及电连接到第一栅极触点的第二金属线。
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公开(公告)号:US11626348B2
公开(公告)日:2023-04-11
申请号:US17075141
申请日:2020-10-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jung-Ho Do , Tae-Joong Song , Seung-Young Lee , Jong-Hoon Jung
IPC: H01L23/48 , H01L23/482 , H01L27/02 , H01L27/118 , H01L23/485 , H01L21/768 , G06F30/394 , G06F30/392
Abstract: An integrated circuit includes first and second active regions extending in a first direction, a first gate line extending in a second direction substantially perpendicular to the first direction and crossing the first and second active regions, and a first contact jumper including a first conductive pattern intersecting the first gate line above the first active region and a second conductive pattern extending in the second direction above the first gate line and connected to the first conductive pattern.
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24.
公开(公告)号:US20220149032A1
公开(公告)日:2022-05-12
申请号:US17584930
申请日:2022-01-26
Applicant: Samsung Electronics, Co., Ltd.
Inventor: Jung-Ho Do , Dal-Hee Lee , Jin-Young Lim , Tae-Joong Song , Jong-Hoon Jung
IPC: H01L27/02 , H01L27/118 , G11C5/06 , G06F30/00 , G11C8/16 , G11C11/412 , H01L21/768 , H01L27/088
Abstract: An integrated circuit may include a first active region and a second active region, and the first and second active regions may extend on a substrate in a first horizontal direction in parallel to each other and have different conductivity types from each other. A first gate line may extend in a second horizontal direction crossing the first horizontal direction, and may form a first transistor with the first active region. The first transistor may include a gate to which a first input signal is applied. The first gate line may include a first partial gate line that overlaps the first active region in a perpendicular direction and that has an end on a region between the first and second active regions.
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25.
公开(公告)号:US11063033B2
公开(公告)日:2021-07-13
申请号:US17010128
申请日:2020-09-02
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jung-Ho Do
IPC: H01L27/02 , H01L27/118 , G06F30/392 , G06F30/394
Abstract: Provided are integrated circuits including a plurality of standard cells aligned along a plurality of rows. The integrated circuit includes first standard cells aligned on the first row and including first conductive patterns to which a first supply voltage is applied in a conductive layer and second standard cells aligned on the second row which is adjacent to the first row in the conductive layer and including second conductive patterns to which the first supply voltage is applied in the conductive layer. A pitch between the first conductive patterns and the second conductive patterns may be less than a pitch provided by single-patterning.
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公开(公告)号:US20210143144A1
公开(公告)日:2021-05-13
申请号:US17154282
申请日:2021-01-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jung-Ho Do , Woojin Rim , Jisu Yu , Jonghoon Jung
IPC: H01L27/02 , H01L23/528 , G03F1/36 , H01L23/522 , H01L27/118 , H01L21/8238 , H01L23/485 , H01L27/092 , G06F30/398
Abstract: A semiconductor device includes a substrate having a plurality of active patterns. A plurality of gate electrodes intersects the plurality of active patterns. An active contact is electrically connected to the active patterns. A plurality of vias includes a first regular via and a first dummy via. A plurality of interconnection lines is disposed on the vias. The plurality of interconnection lines includes a first interconnection line disposed on both the first regular via and the first dummy via. The first interconnection line is electrically connected to the active contact through the first regular via. Each of the vias includes a via body portion and a via barrier portion covering a bottom surface and sidewalls of the via body portion. Each of the interconnection lines includes an interconnection line body portion and an interconnection line barrier portion covering a bottom surface and sidewalls of the interconnection line body portion.
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公开(公告)号:US20210013149A1
公开(公告)日:2021-01-14
申请号:US17037569
申请日:2020-09-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jae-Boong Lee , Jung-Ho Do , Tae-Joong Song , Seung-Young Lee , Jong-Hoon Jung , Ji-Su Yu
IPC: H01L23/528 , H01L27/02 , H01L23/522 , H01L21/8234 , H01L27/118 , G06F30/327 , G06F30/394
Abstract: An integrated circuit including: a power rail including first and second conductive lines spaced apart from each other in a vertical direction, wherein the first and second conductive lines extend in parallel to each other in a first horizontal direction, and are electrically connected to each other, to supply power to a first standard cell, wherein the first and second conductive lines are disposed at a boundary of the first standard cell; and a third conductive line between the first and second conductive lines and extending in a second horizontal direction orthogonal to the first horizontal direction, to transfer an input signal or an output signal of the first standard cell.
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公开(公告)号:US10726186B2
公开(公告)日:2020-07-28
申请号:US15585548
申请日:2017-05-03
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jin-Tae Kim , Jung-Ho Do , Tae-Joong Song , Doo-Hee Cho , Seung-Young Lee
IPC: G06F30/00 , G06F30/394 , G06F30/392
Abstract: A method of designing an integrated circuit includes receiving input data defining the integrated circuit, receiving information from a standard cell library including a plurality of standard cells, receiving information from a modified cell library including at least one modified cell having a same function as a corresponding standard cell among the plurality of standard cells and having a higher routability than the corresponding standard cell and generating output data by performing placement and routing in response to the input data, the information from the standard cell library and the information from the modified cell library.
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29.
公开(公告)号:US20190198491A1
公开(公告)日:2019-06-27
申请号:US16191720
申请日:2018-11-15
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jung-Ho Do , Dal-Hee Lee , Jin-Young Lim , Tae-Joong Song , Jong-Hoon Jung
IPC: H01L27/02 , H01L27/088 , H01L21/768 , G11C8/16 , G11C11/412
CPC classification number: H01L27/0207 , G11C8/16 , G11C11/412 , H01L21/76895 , H01L27/088
Abstract: An integrated circuit may include a first active region and a second active region, and the first and second active regions may extend on a substrate in a first horizontal direction in parallel to each other and have different conductivity types from each other. A first gate line may extend in a second horizontal direction crossing the first horizontal direction, and may form a first transistor with the first active region. The first transistor may include a gate to which a first input signal is applied. The first gate line may include a first partial gate line that overlaps the first active region in a perpendicular direction and that has an end on a region between the first and second active regions.
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公开(公告)号:US10332870B2
公开(公告)日:2019-06-25
申请号:US15870143
申请日:2018-01-12
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jung-Ho Do , Woojin Rim , Jisu Yu , Jonghoon Jung
IPC: H01L27/02 , H01L27/092 , H01L23/522 , G06F17/50 , G03F1/36 , H01L23/528 , H01L21/8238 , H01L23/485 , H01L27/118
Abstract: A semiconductor device includes a substrate having a plurality of active patterns. A plurality of gate electrodes intersects the plurality of active patterns. An active contact is electrically connected to the active patterns. A plurality of vias includes a first regular via and a first dummy via. A plurality of interconnection lines is disposed on the vias. The plurality of interconnection lines includes a first interconnection line disposed on both the first regular via and the first dummy via. The first interconnection line is electrically connected to the active contact through the first regular via. Each of the vias includes a via body portion and a via barrier portion covering a bottom surface and sidewalls of the via body portion. Each of the interconnection lines includes an interconnection line body portion and an interconnection line barrier portion covering a bottom surface and sidewalls of the interconnection line body portion.
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