NEURAL NETWORK ACCELERATOR WITH SYSTOLIC ARRAY STRUCTURE

    公开(公告)号:US20200175355A1

    公开(公告)日:2020-06-04

    申请号:US16677835

    申请日:2019-11-08

    Abstract: A neural network accelerator in which processing elements are configured in a systolic array structure includes a memory to store a plurality of feature data including first and second feature data and a plurality of kernel data including first and second kernel data, a first processing element to perform an operation based on the first feature data and the first kernel data and output the first feature data, a selection circuit to select one of the first feature data and the second feature data, based on a control signal, and output the selected feature data, a second processing element to perform an operation based on the selected feature data and one of the first and the second kernel data, and a controller to generate the control signal, based on a neural network characteristic associated with the plurality of feature data and kernel data.

    METHOD AND APPARATUS FOR INJECTING FAULT AND ANALYZING FAULT TOLERANCE
    24.
    发明申请
    METHOD AND APPARATUS FOR INJECTING FAULT AND ANALYZING FAULT TOLERANCE 审中-公开
    用于注入故障和分析故障容限的方法和装置

    公开(公告)号:US20160334467A1

    公开(公告)日:2016-11-17

    申请号:US15154829

    申请日:2016-05-13

    Abstract: Disclosed herein is a method and apparatus for injecting a fault and analyzing fault tolerance. The fault tolerance analysis apparatus extracts design information from a design. The fault tolerance analysis apparatus may inject a fault into a simulation of the design based on the extracted design information and parameters, and analyzes an influence of the fault on the simulation. Accordingly, in accordance with the fault tolerance analysis apparatus, fault tolerance for the fault injected into the simulation is analyzed, and the effect of the fault tolerance mechanism provided in the design is analyzed.

    Abstract translation: 这里公开了一种用于注入故障并分析容错的方法和装置。 容错分析设备从设计中提取设计信息。 容错分析装置可以根据提取的设计信息和参数将故障注入到设计的仿真中,并分析故障对仿真的影响。 因此,根据容错分析装置,分析了注入到模拟中的故障的容错性,分析了设计中提供的容错机理的影响。

    MEMORY INTERFACE DEVICE
    28.
    发明申请

    公开(公告)号:US20220301603A1

    公开(公告)日:2022-09-22

    申请号:US17565937

    申请日:2021-12-30

    Abstract: Provided is a memory interface device. A memory interface device, comprising: a DQS input buffer configured to receive input data strobe signals and output a first intermediate data strobe signal, the DQS input buffer providing a static offset; an offset control circuit configured to receive the first intermediate data strobe signal and output a second intermediate data strobe signal; and a duty adjustment buffer configured to receive the second intermediate data strobe signal and output a clean data strobe signal, wherein the offset control circuit provides a dynamic offset using the clean data strobe signal.

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