SOLID-STATE IMAGING ELEMENT
    11.
    发明公开

    公开(公告)号:US20240237373A1

    公开(公告)日:2024-07-11

    申请号:US18289172

    申请日:2022-04-27

    IPC分类号: H10K39/32

    CPC分类号: H10K39/32

    摘要: A solid-state imaging element according to an embodiment of the present disclosure includes: a photoelectric conversion layer including first semiconductor nanoparticles; and a buffer layer including second semiconductor nanoparticles. A p-n junction surface is formed at an interface between the photoelectric conversion layer and the buffer layer. A product of a carrier concentration and a film thickness of the buffer layer is larger than a product of a carrier concentration of the photoelectric conversion layer and a diffusion length of a minority carrier, and a thickness of a depletion region formed in the photoelectric conversion layer is maximized.

    Image sensors and electronic devices

    公开(公告)号:US12035548B2

    公开(公告)日:2024-07-09

    申请号:US17232658

    申请日:2021-04-16

    摘要: An image sensor may include a photodiode within a semiconductor substrate and configured to sense light in an infrared wavelength spectrum of light, a photoelectric conversion device on the semiconductor substrate and configured to sense light in a visible wavelength spectrum of light, and a filtering element configured to selectively transmit at least a portion of the infrared wavelength spectrum of light and the visible wavelength spectrum of light. The filtering element may include a plurality of color filters on the photoelectric conversion device. The photoelectric conversion device may include a pair of electrodes facing each other and a photoelectric conversion layer between the pair of electrodes and configured to selectively absorb light in a visible wavelength spectrum of light. The filtering element may be between the semiconductor substrate and the photoelectric conversion device and may selectively absorb the infrared light and selectively transmit the visible light.

    DETECTION DEVICE
    15.
    发明公开
    DETECTION DEVICE 审中-公开

    公开(公告)号:US20240206201A1

    公开(公告)日:2024-06-20

    申请号:US18544861

    申请日:2023-12-19

    发明人: Keiichi SAITO

    摘要: According to an aspect, a detection device includes: a plurality of organic photodiodes arranged in a detection area; a plurality of capacitive elements each coupled in parallel to a corresponding organic photodiode of the organic photodiodes; an analog front-end (AFE) circuit configured to read an electric charge amount stored in each of the capacitive elements to acquire a detection value of each of the organic photodiodes; a power supply circuit configured to supply a power supply potential to collectively apply a reverse bias to the organic photodiodes; and a control circuit configured to control the power supply potential. The organic photodiodes each includes: an active layer; an upper electrode provided with an upper buffer layer interposed between the upper electrode and the active layer; and a lower electrode provided with a lower buffer layer interposed between the lower electrode and the active layer.

    Imaging device, stacked imaging device, and solid-state imaging apparatus

    公开(公告)号:US11985838B2

    公开(公告)日:2024-05-14

    申请号:US17964108

    申请日:2022-10-12

    摘要: An imaging device includes: a first electrode; a charge storage electrode disposed at a distance from the first electrode; a photoelectric conversion layer in contact with the first electrode and above the charge storage electrode, with an insulating layer between the charge storage electrode and the photoelectric conversion layer; and a second electrode on the photoelectric conversion layer. The portion of the insulating layer between the charge storage electrode and the photoelectric conversion layer includes a first region and a second region, the first region is formed with a first insulating layer, the second region is formed with a second insulating layer, and the absolute value of the fixed charge of the material forming the second insulating layer is smaller than the absolute value of the fixed charge of the material forming the first insulating layer.