Abstract:
According to various embodiments, an electronic device includes a housing configured to house a battery; a display configured to be disposed in the housing, to be exposed through a portion of the housing, and to be electrically connected to the battery; a motion detection sensor circuit configured to be disposed in the housing and to be electrically connected to the battery; a power management circuit configured to be disposed in the housing and to be electrically connected to the battery; and a processor configured to be functionally or electrically connected to the motion detection sensor circuit and the display and to be electrically connected to the power management circuit through a switch that is turned on when the processor is in a first mode and turned off when the processor is in a second mode, wherein, in the second mode, the motion detection sensor circuit detects a motion associated with the electronic device, and provides image data to the display in response to the detection of the motion. Other embodiments are also possible.
Abstract:
A display driver circuit includes a source driver configured to output display data to data lines, a controller configured to control the source driver, based on a synchronization signal, and a frequency adjusting circuit configured to extend a first time interval of the synchronization signal from a first length to a second length, such that time interval in which the display data is not output to the data lines is extended, when second image data are not received from an external device during a reference time interval after first image data are received from the external device, and shorten the first time interval, from the second length to a third length, when an instruction is received from the external device after the first time interval is extended to the second length.
Abstract:
A display driving system includes a display driver integrated circuit, and the display driver integrated circuit includes a brightness calculating circuit, an image complexity calculating circuit, a weight calculating circuit and a look up table. The brightness calculating circuit calculates brightness of image data and generates brightness data. The image complexity calculating circuit calculates image complexity and generates weight data, based on a pattern of the image data. The weight calculating circuit receives brightness data and a weight data to generate brightness correction data.
Abstract:
A maskless exposure method includes spatially modulating a light output from a light source into a pattern beam having a mask pattern, condensing the modulated pattern beam into a first group of spot beams having a first focal position on a Z-axis substantially perpendicular to an exposure surface of an object layer, and into a second group of spot beams having a second focal position different from the first focal position, and scanning the object layer with the first and second groups of spot beams. The object layer has a first height and a second height different from the first height.
Abstract:
Methods are provided for manufacturing semiconductor devices include forming a first fin protruding on a substrate and extending in a first direction; forming first and second sacrificial gate insulating layers on the first fin, the first and second sacrificial gate insulating layers intersecting the first fin and being spaced apart from each other; forming first and second sacrificial gate electrodes respectively on the first and second sacrificial gate insulating layers; forming a first insulating layer on the first and second sacrificial gate electrodes; removing a portion of the first insulating layer to expose the second sacrificial gate electrode; removing the exposed second sacrificial gate electrode using a first etching process to expose the second sacrificial gate insulating layer; removing the exposed second sacrificial gate insulating layer using a second etching process different from the first etching process to form a first trench which exposes the first fin; forming a first recess in the exposed first fin using a third etching process different from the second etching process; and filling the first recess with a first device isolation layer.
Abstract:
A fabricating method of a semiconductor device includes providing a substrate having a first region and a second region, forming a plurality of first gates in the first region of the substrate, such that the first gates are spaced apart from each other at a first pitch, forming a plurality of second gates in the second region of the substrate, such that the second gates are spaced apart from each other at a second pitch different from the first pitch, implanting an etch rate adjusting dopant into the second region to form implanted regions, while blocking the first region, forming a first trench by etching the first region between the plurality of first gates, and forming a second trench by etching the second region between the plurality of second gates.