Abstract:
Provided are methods of fabricating semiconductor chips, semiconductor chips formed by the methods, and chip-stack packages having the semiconductor chips. One embodiment specifies a method that includes patterning a scribe line region of a semiconductor substrate to form a semiconductor strut spaced apart from edges of a chip region of the semiconductor substrate.
Abstract:
A biochip can include a substrate having surface features of protrusions or recesses and probes coupled to each of the surface features. A biochip can include a substrate having recess regions and probes coupled to each of the recess regions, wherein a surface of each of the recess regions has convexes and concaves. A biochip can include a substrate having recess regions, immobilization layers conformally formed in the recess regions, and probes coupled onto each of the immobilization layers. The biochip can be divided into probe cell regions to which the probes are coupled, wherein the recess regions are formed in the probe cell regions, and non-probe cell regions, wherein a surface of each of the non-probe cell regions can include an exposed surface of the substrate.
Abstract:
A stacked package includes a printed circuit board (PCB), a plurality of semiconductor chips, plugs and a controller. The semiconductor chips are sequentially stacked on the PCB. The plugs electrically connect each of the semiconductor chips to the PCB. The controller is disposed in any one of the semiconductor chips. The controller is electrically coupled to the plugs. Thus, the controller may be built in the semiconductor chip by a separate process so that a mechanical impact generated in a process for bonding the controller is not applied to the semiconductor chips. Further, a mechanical impact applied to the controller, which is generated in a process for forming a protection member, may be reduced.
Abstract:
A semiconductor package structure and a method of fabricating the same are disclosed. A method of fabricating the semiconductor package structure can be characterized as including forming semiconductor chips on a semiconductor substrate. Each of the semiconductor chips includes chip pads. Through-vias are formed through the semiconductor chips. Redistribution structures and a chip selection interconnection layer are formed on the semiconductor chips, which connect the through-vias with the chip pads. The chip selection interconnection layers are patterned to form chip selection interconnection lines having different structures on at least one of the semiconductor chips. The semiconductor chips are stacked and electrically connected using the through-vias.
Abstract:
A condensing type hot water boiler comprises: a firebox casing that formulates a firebox in which fuel is combusted; a burner that ignites fuel furnished in the upper part of said firebox casing; a ventilator that supplies air to said firebox; a heat exchange casing, wherein heat is exchanged between hot water and the flame and combustion gas flowing in from said firebox, located at the lower part of said firebox casing; and a hot water coil formed to cover the inner wall of said firebox casing and in which hot water is received in the interior from said heat exchange casing for heat exchange with flame and combustion gas of the interior of said firebox.
Abstract:
Wafer level packages and methods of fabricating the same are provided. In one embodiment, one of the methods comprises forming semiconductor chips having a connection pad on a wafer, patterning a bottom surface of the wafer to form a trench under the connection pad, patterning a bottom surface of the trench to form a via hole exposing the bottom surface of the connection pad, and forming a connecting device connected to the connection pad through the via hole. The invention provides a wafer level package having reduced thickness, lower fabrication costs, and increased reliability compared to conventional packages.
Abstract:
A stack package of the present invention is made by stacking at least two area array type chip scale packages. Each chip scale package of an adjacent pair of chip scale packages is attached to the other in a manner that the ball land pads of the upper stacked chip scale package face in the opposite direction to those of the lower stacked chip scale package, and the circuit patterns of the upper stacked chip scale package are electrically connected to the those of the lower stacked chip scale package by, for example, connecting boards. Therefore, it is possible to stack not only fan-out type chip scale packages, but to also efficiently stack ordinary area array type chip scale packages.
Abstract:
Provided are a wafer level chip scale package in which a redistribution process is applied at a wafer level, a manufacturing method thereof, and a semiconductor chip module including the wafer level chip scale package. The wafer level chip scale package includes a semiconductor chip having a bonding pad, a first insulating layer disposed on the semiconductor chip so as to expose the bonding pad, a redistribution line disposed on the exposed bonding pad and the first insulating layer, a sacrificial layer disposed below a redistribution pad of the redistribution line, a second insulating layer disposed on the redistribution line so as to expose the redistribution pad and including a crack inducement hole disposed beside the sacrificial layer, and an external connection terminal attached to the redistribution pad.
Abstract:
Provided are a camera module and a method of fabricating the same. The method includes preparing a lens structure including upper connection portions. Lower connection portions are formed in a predetermined region of a substrate. The lower connection portions define a chip region and fit in the upper connection portions, respectively. An image sensor chip is located on the bottom surface of the chip region. The lens structure is adhered to the substrate using the upper and lower connection portions.
Abstract:
Provided is a semiconductor device having a cooling path on its bottom surface. The stack-type semiconductor device having a cooling path comprises a stack-type semiconductor chip comprising a first semiconductor chip and a second semiconductor chip. The first semiconductor chip comprises a first surface in which a circuit unit is formed and a second surface in which a first cooling path is formed, and the second semiconductor chip comprises a first surface in which a circuit unit is formed and a second surface in which a second cooling path is formed. The second surface of the first semiconductor chip and the second surface of the second semiconductor chip are bonded to each other, and a third cooling path is formed in the middle of the stack-type semiconductor chip using the first and second cooling paths. Warpage of the stack-type semiconductor device is suppressed and heat is easily dissipated.