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公开(公告)号:US20130316517A1
公开(公告)日:2013-11-28
申请号:US13953443
申请日:2013-07-29
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor: Yoshimaro FUJII , Fumitsugu FUKUYO , Kenshi FUKUMITSU , Naoki UCHIYAMA
IPC: H01L21/78
CPC classification number: H01L21/78 , B23K26/0057 , B23K26/0622 , B23K26/40 , B23K26/53 , B23K2103/50 , B23K2203/50 , B28D5/00 , B28D5/0011 , H01L21/268 , H01L21/304 , H01L21/30604 , H01L21/6836 , H01L21/76894 , H01L23/544 , H01L23/562 , H01L2221/68327 , H01L2221/68336 , H01L2223/5446 , H01L2924/00 , H01L2924/0002
Abstract: A substrate dividing method which can thin and divide a substrate while preventing chipping and cracking from occurring. This substrate dividing method comprises the steps of irradiating a semiconductor substrate 1 having a front face 3 formed with functional devices 19 with laser light while positioning a light-converging point within the substrate, so as to form a modified region including a molten processed region due to multiphoton absorption within the semiconductor substrate 1, and causing the modified region including the molten processed region to form a starting point region for cutting; and grinding a rear face 21 of the semiconductor substrate 1 after the step of forming the starting point region for cutting such that the semiconductor substrate 1 attains a predetermined thickness.
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公开(公告)号:US20240051067A1
公开(公告)日:2024-02-15
申请号:US18266842
申请日:2021-12-20
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor: Yo SUGIMOTO , Takeshi SAKAMOTO , Takafumi OGIWARA , Naoki UCHIYAMA , Takashi KURITA , Ryo YOSHIMURA
IPC: B23K26/351 , B23K26/064 , B23K26/04
CPC classification number: B23K26/351 , B23K26/064 , B23K26/048
Abstract: A laser processing method includes: a first step of preparing a wafer including a plurality of functional elements disposed to be adjacent to each other via a street; and a second step of, after the first step, irradiating the street with laser light based on information regarding the street such that a surface layer of the street is removed in a first region of the street and the surface layer remains in a second region of the street. The information regarding the street includes information indicating that, when a modified region is formed in the wafer along a line passing through the street, a fracture extending from the modified region does not reach the street along the line in the first region, and reaches the street along the line in the second region.
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公开(公告)号:US20210210387A1
公开(公告)日:2021-07-08
申请号:US17202807
申请日:2021-03-16
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor: Yoshimaro FUJII , Fumitsugu FUKUYO , Kenshi FUKUMITSU , Naoki UCHIYAMA
IPC: H01L21/78 , H01L21/768 , B23K26/53 , B28D5/00 , B23K26/0622 , B23K26/40 , H01L21/304 , H01L23/00 , H01L21/268 , H01L21/683 , H01L23/544 , H01L21/306
Abstract: A substrate dividing method which can thin and divide a substrate while preventing chipping and cracking from occurring. This substrate dividing method comprises the steps of irradiating a semiconductor substrate 1 having a front face 3 formed with functional devices 19 with laser light while positioning a light-converging point within the substrate, so as to form a modified region including a molten processed region due to multiphoton absorption within the semiconductor substrate 1, and causing the modified region including the molten processed region to form a starting point region for cutting; and grinding a rear face 21 of the semiconductor substrate 1 after the step of forming the starting point region for cutting such that the semiconductor substrate 1 attains a predetermined thickness.
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公开(公告)号:US20200180075A1
公开(公告)日:2020-06-11
申请号:US16614882
申请日:2018-05-17
Applicant: Kyoritsu Chemical & Co., Ltd. , HAMAMATSU PHOTONICS K.K.
Inventor: Mikiharu KUCHIKI , Hidefumi KINDA , Daisuke KURITA , Takeshi SAKAMOTO , Takafumi OGIWARA , Yuta KONDOH , Naoki UCHIYAMA
Abstract: A object cutting method includes a first step of attaching an expandable sheet to a front surface or a back surface of a object, a second step of irradiating the object with a laser light along a line to cut to form a modified region, and expanding the expandable sheet to divide at least a part of the object into a plurality of chips and to form a gap that exists between the chips and extends to a side surface crossing the front surface and the back surface of the object, a third step of, after the second step, filling the gap with a resin from an outer edge portion including the side surface of the object, a fourth step of, after the third step, curing and shrinking the resin, and a fifth step of, after the fourth step, taking out the chips from the expandable sheet.
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公开(公告)号:US20160343618A1
公开(公告)日:2016-11-24
申请号:US15226417
申请日:2016-08-02
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor: Yoshimaro FUJII , Fumitsugu FUKUYO , Kenshi FUKUMITSU , Naoki UCHIYAMA
IPC: H01L21/78 , H01L21/683 , H01L23/00 , H01L21/306 , H01L21/268 , H01L21/304
CPC classification number: H01L21/78 , B23K26/0057 , B23K26/0622 , B23K26/40 , B23K26/53 , B23K2103/50 , B23K2203/50 , B28D5/00 , B28D5/0011 , H01L21/268 , H01L21/304 , H01L21/30604 , H01L21/6836 , H01L21/76894 , H01L23/544 , H01L23/562 , H01L2221/68327 , H01L2221/68336 , H01L2223/5446 , H01L2924/00 , H01L2924/0002
Abstract: A substrate dividing method which can thin and divide a substrate while preventing chipping and cracking from occurring. This substrate dividing method comprises the steps of irradiating a semiconductor substrate 1 having a front face 3 formed with functional devices 19 with laser light while positioning a light-converging point within the substrate, so as to form a modified region including a molten processed region due to multiphoton absorption within the semiconductor substrate 1, and causing the modified region including the molten processed region to form a starting point region for cutting; and grinding a rear face 21 of the semiconductor substrate 1 after the step of forming the starting point region for cutting such that the semiconductor substrate 1 attains a predetermined thickness.
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公开(公告)号:US20240033859A1
公开(公告)日:2024-02-01
申请号:US18268383
申请日:2021-12-20
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor: Yo SUGIMOTO , Takeshi SAKAMOTO , Takafumi OGIWARA , Naoki UCHIYAMA , Takashi KURITA , Ryo YOSHIMURA
Abstract: A laser processing method includes a first step of preparing a wafer including a plurality of functional elements disposed to be adjacent to each other via a street, a second step of, after the first step, forming a modified region in the wafer along a line passing through the street, and a third step of, after the second step, irradiating the street with laser light such that a surface layer of the street is removed, and a fracture extending from the modified region reaches a bottom surface of a recess formed by removing the surface layer, along the line.
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公开(公告)号:US20210057222A1
公开(公告)日:2021-02-25
申请号:US16633808
申请日:2018-07-13
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor: Takeshi SAKAMOTO , Ryuji SUGIURA , Yuta KONDOH , Naoki UCHIYAMA
IPC: H01L21/268 , H01L21/683 , H01L25/065
Abstract: A laminated element manufacturing method includes a first forming step of forming a first modified region along a line to cut by irradiating a semiconductor substrate of a first wafer with a laser light along the line to cut, a first grinding step of grinding the semiconductor substrate of the first wafer, a bonding step of bonding a circuit layer of a second wafer to the semiconductor substrate of the first wafer, a second forming step of forming a second modified region along the line to cut by irradiating a semiconductor substrate of the second wafer with a laser light along the line to cut, and a second grinding step of grinding the semiconductor substrate of the second wafer.
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公开(公告)号:US20180350682A1
公开(公告)日:2018-12-06
申请号:US16050640
申请日:2018-07-31
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor: Yoshimaro FUJII , Fumitsugu FUKUYO , Kenshi FUKUMITSU , Naoki UCHIYAMA
IPC: H01L21/78 , H01L21/768 , B23K26/0622 , H01L23/00 , H01L23/544 , B23K26/40 , B23K26/53
CPC classification number: H01L21/78 , B23K26/0057 , B23K26/0622 , B23K26/40 , B23K26/53 , B23K2103/50 , B23K2203/50 , B28D5/00 , B28D5/0011 , H01L21/268 , H01L21/304 , H01L21/30604 , H01L21/6836 , H01L21/76894 , H01L23/544 , H01L23/562 , H01L2221/68327 , H01L2221/68336 , H01L2223/5446 , H01L2924/00 , H01L2924/0002
Abstract: A substrate dividing method which can thin and divide a substrate while preventing chipping and cracking from occurring. This substrate dividing method comprises the steps of irradiating a semiconductor substrate 1 having a front face 3 formed with functional devices 19 with laser light while positioning a light-converging point within the substrate, so as to form a modified region including a molten processed region due to multiphoton absorption within the semiconductor substrate 1, and causing the modified region including the molten processed region to form a starting point region for cutting; and grinding a rear face 21 of the semiconductor substrate 1 after the step of forming the starting point region for cutting such that the semiconductor substrate 1 attains a predetermined thickness.
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公开(公告)号:US20180068897A1
公开(公告)日:2018-03-08
申请号:US15808211
申请日:2017-11-09
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor: Fumitsugu FUKUYO , Kenshi FUKUMITSU , Naoki UCHIYAMA , Toshimitsu WAKUDA
IPC: H01L21/78 , C03C23/00 , B23K20/233 , B23K26/066 , B23K26/364 , C03B33/023 , C03B33/08 , B23K20/02 , B23K20/16 , B28D5/00 , C03B33/10 , B23K26/40 , B23K26/16 , B23K26/08 , B23K26/073 , B23K26/046 , B23K26/03 , B23K26/00 , B23K20/26 , B23K26/0622 , B23K103/00 , B23K101/40 , G02F1/1368 , H01L21/683
Abstract: A laser beam machining method and a laser beam machining device capable of cutting a work without producing a fusing and a cracking out of a predetermined cutting line on the surface of the work, wherein at pulse laser beam is radiated on the predetermined cut line on the surface of the work under the conditions causing a multiple photon absorption and with a condensed point aligned to the inside of the work, and a modified area is formed inside the work along the predetermined determined cut line by moving the condensed point along the predetermined cut line, whereby the work can be cut with a rather small force by cracking the work along the predetermined cut line starting from the modified area and, because the pulse laser beam radiated is not almost absorbed onto the surface of the work, the surface is not fused even if the modified area is formed.
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公开(公告)号:US20160343674A1
公开(公告)日:2016-11-24
申请号:US15226662
申请日:2016-08-02
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor: Yoshimaro FUJII , Fumitsugu FUKUYO , Kenshi FUKUMITSU , Naoki UCHIYAMA
IPC: H01L23/00 , H01L21/683 , H01L21/268 , H01L21/304 , H01L21/78 , H01L23/544
CPC classification number: H01L21/78 , B23K26/0057 , B23K26/0622 , B23K26/40 , B23K26/53 , B23K2103/50 , B23K2203/50 , B28D5/00 , B28D5/0011 , H01L21/268 , H01L21/304 , H01L21/30604 , H01L21/6836 , H01L21/76894 , H01L23/544 , H01L23/562 , H01L2221/68327 , H01L2221/68336 , H01L2223/5446 , H01L2924/00 , H01L2924/0002
Abstract: A substrate dividing method which can thin and divide a substrate while preventing chipping, and cracking from occurring. This substrate dividing method comprises the steps of irradiating a semiconductor substrate 1 having a front face 3 formed with functional devices 19 with laser light while positioning a light-converging point within the substrate, so as to form a modified region including a molten processed region due to multiphoton absorption within the semiconductor substrate 1, and causing the modified region including the molten processed region to form a starting point region for cutting; and grinding a rear face 21 of the semiconductor substrate 1 after the step of forming the starting point region for cutting such that the semiconductor substrate 1 attains a predetermined thickness.
Abstract translation: 一种衬底分割方法,其可以在防止碎裂的同时对衬底进行薄层化和分裂,并发生裂纹。 该基板分割方法包括以下步骤:将具有形成有功能元件19的正面3的半导体基板1照射在基板内,同时将聚光点定位在基板内,从而形成包含熔融处理区域的改质区域 在半导体衬底1内进行多光子吸收,并且使包含熔融处理区域的改性区域形成切割起点区域; 在形成用于切割的起点区域的步骤之后,研磨半导体衬底1的后表面21,使得半导体衬底1达到预定厚度。
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